6533b85dfe1ef96bd12bdd62
RESEARCH PRODUCT
Raman spectroscopy study of β-irradiated silica glass
Simonpietro AgnelloGuillaume PetiteBruno BoizotBruno ReynardRoberto Boscainosubject
Silica glassAnalytical chemistry02 engineering and technologyRing (chemistry)01 natural scienceslaw.invention[SPI.MAT]Engineering Sciences [physics]/Materialssymbols.namesake[SPI]Engineering Sciences [physics]Opticslaw0103 physical sciencesMaterials ChemistryVan de Graaff generatorIrradiation010306 general physicsChemistrybusiness.industry021001 nanoscience & nanotechnologyCondensed Matter PhysicsAngular dispersionElectronic Optical and Magnetic MaterialsCeramics and Compositessymbols0210 nano-technologybusinessDispersion (chemistry)Raman spectroscopyExcitationdescription
International audience; Natural and synthetic silica glass samples with different OH content have been submitted to β-irradiation at different doses from 106 to 5 × 109 Gy in a Van de Graaff accelerator. Structural changes under irradiation have been analyzed by Raman spectroscopy. The main findings are: (i) a decrease of the Si–O–Si angular dispersion and the average Si–O–Si angle as a function of dose and (ii) an increase of number of three-membered SiO4 ring concentration during irradiation. These results show therefore that purely electronic excitation from β-irradiation induces in a-SiO2 small but significant structural changes of the SiO4 membered ring statistics (size and dispersion), consistent with a slight densification.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2003-09-01 |