6533b85efe1ef96bd12c0935

RESEARCH PRODUCT

Measurement of drift mobilities in amorphous organic films using the Time of Flight method

P. CusumanoClaudio CaliSalvatore Gambino

subject

Electron mobilityAnalytical chemistrychemistry.chemical_elementElectronLaserTime of Flight (TOF) charge carrier mobility organic molecular semiconductorsSettore ING-INF/01 - ElettronicaAmorphous solidlaw.inventionTime of flightchemistryAluminiumlawIrradiationPulse intensity

description

We apply the Time of Flight (TOF) technique to study carrier mobility in N, N’-diphenyl-N,N’-bis(3-methylphenyl) -1,1-biphenyl-4,4’-diamine (TPD) and tris(8-hydroxyquinolato) aluminium (Alq 3 ). These materials are two examples of, respectively, hole and electron transporting molecular materials. Measurements are performed in free air or under vacuum varying the experimental parameters such as laser pulse intensity and single shot irradiation. We observe a transition from dispersive to non dispersive transport changing the experimental conditions.

yearjournalcountryeditionlanguage
2004-09-08
10.1117/12.544866http://hdl.handle.net/10447/8421