6533b860fe1ef96bd12c2e48
RESEARCH PRODUCT
Scanning microscopy with spatial sampling of the detector plane
Colin J. R. SheppardGenaro Saavedra TortosaManuel Martínez-corralEmilio Sánchez-ortigaAna Doblassubject
MicroscopeMaterials sciencebusiness.industryMechanical EngineeringConfocalDetectorComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISIONScanning confocal electron microscopySignalAtomic and Molecular Physics and OpticsElectronic Optical and Magnetic Materialslaw.inventionOpticsSampling (signal processing)Multifocal plane microscopylawDetection theorybusinessEngineering (miscellaneous)description
We present the implementation of a confocal scanning microscope in which the signal detection is performed through a matrix sensor, specifically, a CCD camera. This kind of detection has several advantages over the conventional detection in confocal microscopes. One of those advantages is the possibility to recover information of the sample that vanishes when the confocal image is directly acquired by the integration of light into a signal. We demonstrate the applicability of the system which allows implementing super-resolution techniques in a very easy manner.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2013-06-06 | Optica Pura y Aplicada |