6533b86dfe1ef96bd12ca188
RESEARCH PRODUCT
Angular spreading measurements using MeV ion microscopes
Minqin RenFrank WattThomas OsipowiczXiao ChenHarry J. WhitlowHarry J. WhitlowJeroen A. Van Kansubject
Point spread functionNuclear and High Energy PhysicsMicroscopeIon beamta114Physics::Instrumentation and DetectorsChemistryScatteringbusiness.industryIonlaw.inventionOpticslawPhysics::Accelerator PhysicsbusinessInstrumentationBeam (structure)FOIL methodField ion microscopedescription
Abstract The sharpness of MeV ion microscope images is governed by small-angle scattering and associated lateral spreading of the ion beam in the sample. We have investigated measurement of the half-angle of the angular spreading distribution by characterising the image blurring in direct-Scanning Transmission Ion Microscopy (direct-STIM). In these tests Mylar™ foils of 0.5–6 μm were used to induce angular spreading. Images were taken of an electron microscope grid using 2 MeV protons with, and without, the foils in the beam path. The blurring was measured by fitting the width of a circular Gaussian point spread function to the images with and without the foil in position. The results show the half-angle width of the spreading has a square root dependence on foil thickness that lies intermediate between SRIM predictions and the theoretical estimates (Bird and Williams fits to the Sigmund and Winterbon data and Amsel et al.).
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2013-07-01 | Nuclear instruments and methods in physics research section b: beam interactions with materials and atoms |