0000000000267894

AUTHOR

Thomas Osipowicz

showing 7 related works from this author

Objective improvement of the visual quality of ion microscope images

2013

The need to operate with low ion beam fluences implies the images obtained using ion microscope (IM) are often grainy and have poor visual quality compared to what can be obtained using e.g. confocal microscopy. This results from the Poissonian distribution of counts in pixels. Here we report work on some different approaches for objectively improving the visual quality of IM images. In this work we present (i) dramatic improvement in the visual image quality of off-axis and direct-scanning transmission ion microscopy (STIM) images by suppression of zero-pixels; (ii) denoising of PIXE images using wavelet filtering and (iii) use of the feature preserving characteristics of wavelet filtering…

PixelIon beamta114Image qualityChemistrybusiness.industryNoise reductionCondensed Matter PhysicsThresholdingAtomic and Molecular Physics and OpticsSurfaces Coatings and FilmsElectronic Optical and Magnetic MaterialsWaveletOpticsFeature (computer vision)Computer visionArtificial intelligenceElectrical and Electronic EngineeringbusinessField ion microscopeMicroelectronic Engineering
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WITHDRAWN: Measurement of beam focus quality in biomedical nuclear microscopy.

2009

This article has been withdrawn at the request of the author(s) and/or editor. The Publisher apologizes for any inconvenience this may cause. The full Elsevier Policy on Article Withdrawal can be found at http://www.elsevier.com/locate/withdrawalpolicy.

Focus (computing)RadiationOpticsOperations researchbusiness.industryComputer sciencemedia_common.quotation_subjectQuality (business)businessBeam (structure)Nuclear microscopymedia_commonApplied radiation and isotopes : including data, instrumentation and methods for use in agriculture, industry and medicine
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Measurements of the stopping forces for heavy ions in Ge, Ag and Au using novel ‘polka-dot’ detectors

2006

Measurements of the stopping forces for C-14, N-14 and O-16 ions in Ge and Au, for N-14 and F-19 ions in Ag, as well as for F-19 ions in Au have been made, respectively. A novel technique, reported recently, using PIN diodes coated directly with the stopping medium in a polka dot pattern was used. This provided a set of precise, self-consistent measurements on the same stopping medium. Results show small but significant deviations from SRIM stopping predictions and are also compared to a recently-developed empirical stopping force predictor.

Novel techniquePhysicsNuclear and High Energy PhysicsEnergy lossDetectorPIN diodeNova (laser)Ionlaw.inventionlawStopping power (particle radiation)Polka dotAtomic physicsInstrumentationNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
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Nano-imaging of single cells using STIM

2007

Scanning transmission ion microscopy (STIM) is a technique which utilizes the energy loss of high energy (MeV) ions passing through a sample to provide structural images. In this paper, we have successfully demonstrated STIM imaging of single cells at the nano-level using the high resolution capability of the proton beam writing facility at the Centre for Ion Beam Applications, National University of Singapore. MCF-7 breast cancer cells (American Type Culture Collection [ATCC]) were seeded on to silicon nitride windows, backed by a Hamamatsu pin diode acting as a particle detector. A reasonable contrast was obtained using 1 MeV protons and excellent contrast obtained using 1 MeV alpha parti…

Nuclear and High Energy PhysicsMaterials scienceIon beambusiness.industryDetectorPIN diodeAnalytical chemistryAlpha particleProton beam writingParticle detectorlaw.inventionIonchemistry.chemical_compoundSilicon nitridechemistrylawOptoelectronicsbusinessInstrumentationNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
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Characterisation of beam focus quality in biomedical nuclear microscopy: A Fourier optics approach

2009

Abstract The central peak widths of the 2D-autocorrelation function have been investigated as a Figure of Merit (FoM) of focus quality in nuclear microscopy using a quadrupole triplet lens system. The beam focus could be reliably characterised for direct scanning transmission ion microscopy (direct-STIM) images obtained with fluences as small as 5.8 × 10 9 ions cm - 2 which colocalisation tests showed did not introduce significant beam-induced changes in the cells.

Nuclear and High Energy PhysicsChemistrybusiness.industryFourier opticsScanning confocal electron microscopyTriplet lensIonOpticsQuadrupoleFigure of meritFocus (optics)businessInstrumentationBeam (structure)Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
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Angular spreading measurements using MeV ion microscopes

2013

Abstract The sharpness of MeV ion microscope images is governed by small-angle scattering and associated lateral spreading of the ion beam in the sample. We have investigated measurement of the half-angle of the angular spreading distribution by characterising the image blurring in direct-Scanning Transmission Ion Microscopy (direct-STIM). In these tests Mylar™ foils of 0.5–6 μm were used to induce angular spreading. Images were taken of an electron microscope grid using 2 MeV protons with, and without, the foils in the beam path. The blurring was measured by fitting the width of a circular Gaussian point spread function to the images with and without the foil in position. The results show …

Point spread functionNuclear and High Energy PhysicsMicroscopeIon beamta114Physics::Instrumentation and DetectorsChemistryScatteringbusiness.industryIonlaw.inventionOpticslawPhysics::Accelerator PhysicsbusinessInstrumentationBeam (structure)FOIL methodField ion microscopeNuclear instruments and methods in physics research section b: beam interactions with materials and atoms
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Angular and lateral spreading of ion beams in biomedical nuclear microscopy

2009

Abstract Nuclear scattering from target atoms gives rise to a spatial broadening of energetic ion beams penetrating matter. The spatial broadening of the ion beam presents an ultimate limit to the resolving power that can be achieved in nuclear microscopy methods. The pressing of the attainable resolution limit in biomedical nuclear microscopy to dimensions approaching 10 nm, or so, implies the fundamental limitation from ion-target scattering will become increasingly significant. This effect has been investigated by a combined analytical and numerical computational approach to determine the extent and how single and multiple scattering processes limit the resolution for analysis with 2 MeV…

Nuclear and High Energy PhysicsIon beamScatteringChemistryResolution (electron density)ParticleIrradiationAtomic physicsIon microscopyInstrumentationNuclear microscopyIonNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
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