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RESEARCH PRODUCT
Nano-imaging of single cells using STIM
Chan Yee GekBay Boon HuatJ.a. Van KanLim DainaAndrew A. BettiolRen MinqinHarry J. WhitlowThomas OsipowiczFrank Wattsubject
Nuclear and High Energy PhysicsMaterials scienceIon beambusiness.industryDetectorPIN diodeAnalytical chemistryAlpha particleProton beam writingParticle detectorlaw.inventionIonchemistry.chemical_compoundSilicon nitridechemistrylawOptoelectronicsbusinessInstrumentationdescription
Scanning transmission ion microscopy (STIM) is a technique which utilizes the energy loss of high energy (MeV) ions passing through a sample to provide structural images. In this paper, we have successfully demonstrated STIM imaging of single cells at the nano-level using the high resolution capability of the proton beam writing facility at the Centre for Ion Beam Applications, National University of Singapore. MCF-7 breast cancer cells (American Type Culture Collection [ATCC]) were seeded on to silicon nitride windows, backed by a Hamamatsu pin diode acting as a particle detector. A reasonable contrast was obtained using 1 MeV protons and excellent contrast obtained using 1 MeV alpha particles. In a further experiment, nano-STIM was also demonstrated using cells seeded on to the pin diode directly, and high quality nano-STIM images showing the nucleus and multiple nucleoli were extracted before the detector was significantly damaged.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2007-07-01 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms |