6533b86efe1ef96bd12cbf1b

RESEARCH PRODUCT

XPS and SIMS study of aluminium native oxide modifications induced by Q-switched Nd:YAG laser treatment

Roland OltraD.e. RobertsSophie CostilOlivier HeintzVincent Barnier

subject

Materials science[ SPI.MAT ] Engineering Sciences [physics]/MaterialsAnalytical chemistryOxidechemistry.chemical_element02 engineering and technology01 natural scienceslaw.invention[SPI.MAT]Engineering Sciences [physics]/Materialschemistry.chemical_compoundX-ray photoelectron spectroscopyAluminiumlaw0103 physical sciencesMaterials ChemistryXPSlaser cleaning010302 applied physicsAluminium oxidesThermal oxidationSurfaces and InterfacesGeneral Chemistry[CHIM.MATE]Chemical Sciences/Material chemistry021001 nanoscience & nanotechnologyCondensed Matter PhysicsLaserSurfaces Coatings and FilmschemistryNd:YAG laser[ CHIM.MATE ] Chemical Sciences/Material chemistryAluminium oxideMRI model0210 nano-technologysurface modificationSIMS

description

Publié suite au congrès ECASIA: 11th European Conference on Applications of Surface and Interface Analysis, 25-30 September 2005, Vienna, Austria; International audience; During laser cleaning of aluminium in ambient atmosphere, modifications of the metal surface can be induced by transient thermal effects. This work aims to characterize the modification of the aluminium oxide layer on pure aluminium for a wide range of power per area using a Q-switched Nd :YAG (1064 nm) laser with two pulse durations, 10 and 180 ns. Experiments were carried out with single laser shots in ambient air at fluences (e.g. energy per area) below the ablation regime. For 10-ns pulses with fluences between 0.7 and 1.7 J/cm2, X-ray photoelectron spectroscopy (XPS) and secondary ion mass spectroscopy (SIMS) revealed thermal oxidation with an increase of the oxide-layer thickness for 0.7–1.3 J/cm2. Above a threshold at about 1.3 J/cm2 the oxide thickness decreased. The Mixing Roughness Model was used for the SIMS depth profile. For 180-ns pulses with fluences between 2.1 and 4.3 J/cm2, and therefore much lower power per area than with the 10 ns pulses, XPS showed a variation of surface composition with a different behaviour for 2.1–2.9 J/cm2 compared to 3.1–4.3 J/cm2. However, no significant changes of the average thickness of the oxide layer were found.

10.1002/sia.2181https://hal.archives-ouvertes.fr/hal-00076593