6533b86ffe1ef96bd12cd2a0

RESEARCH PRODUCT

Analytical RF Pulse Heating Analysis for High Gradient Accelerating Structures

D. Gonzalez-iglesiasP. Martin-lunaJ. FusterP. Martinez-reviriegoC. BlanchD. EsperanteM. BoronatN. Fuster-martínezBenito Gimeno

subject

Electromagnetic fieldNuclear and High Energy PhysicsWork (thermodynamics)Materials scienceElectromagneticsanálisis térmico010308 nuclear & particles physicsJoule effectestructuras aceleradoras de RFMechanics01 natural sciencesFinite element methodPulse (physics)RF pulse heatingNuclear Energy and Engineering:FÍSICA::Nucleónica::Aceleradores de partículas [UNESCO]0103 physical sciencesHeat transferUNESCO::FÍSICA::Nucleónica::Aceleradores de partículasRadio frequencyElectrical and Electronic Engineering

description

The main aim of this work is to present a simple method, based on analytical expressions, for obtaining the temperature increase due to the Joule effect inside the metallic walls of an RF accelerating component. This technique relies on solving the 1-D heat-transfer equation for a thick wall, considering that the heat sources inside the wall are the ohmic losses produced by the RF electromagnetic fields penetrating the metal with finite electrical conductivity. Furthermore, it is discussed how the theoretical expressions of this method can be applied to obtain an approximation to the temperature increase in realistic 3-D RF accelerating structures, taking as an example the cavity of an RF electron photoinjector and a traveling wave linac cavity. These theoretical results have been benchmarked with numerical simulations carried out with commercial finite-element method (FEM) software, finding good agreement among them. Besides, the advantage of the analytical method with respect to the numerical simulations is evidenced. In particular, the model could be very useful during the design and optimization phase of RF accelerating structures, where many different combinations of parameters must be analyzed in order to obtain the proper working point of the device, allowing to save time and speed up the process. However, it must be mentioned that the method described in this article is intended to provide a quick approximation to the temperature increase in the device, which of course is not as accurate as the proper 3-D numerical simulations of the component. European Union’s Horizon 2020 Research and Innovation Programme under Grant 777431 (XLS CompactLight) Valencian Regional Government VALi+D Postdoctoral under Grant APOSTD/2019/155 The main aim of this work is to present a simple method, based on analytical expressions, for obtaining the temperature increase due to the Joule effect inside the metallic walls of an RF accelerating component. This technique relies on solving the 1-D heat-transfer equation for a thick wall, considering that the heat sources inside the wall are the ohmic losses produced by the RF electromagnetic fields penetrating the metal with finite electrical conductivity. Furthermore, it is discussed how the theoretical expressions of this method can be applied to obtain an approximation to the temperature increase in realistic 3-D RF accelerating structures, taking as an example the cavity of an RF electron photoinjector and a traveling wave linac cavity. These theoretical results have been benchmarked with numerical simulations carried out with commercial finite-element method (FEM) software, finding good agreement among them. Besides, the advantage of the analytical method with respect to the numerical simulations is evidenced. In particular, the model could be very useful during the design and optimization phase of RF accelerating structures, where many different combinations of parameters must be analyzed in order to obtain the proper working point of the device, allowing to save time and speed up the process. However, it must be mentioned that the method described in this article is intended to provide a quick approximation to the temperature increase in the device, which of course is not as accurate as the proper 3-D numerical simulations of the component.

10.1109/tns.2021.3049319https://doi.org/10.1109/TNS.2021.3049319