6533b870fe1ef96bd12cef9d
RESEARCH PRODUCT
Experimental investigation of electron impact onSi2−
Richard D. ThomasG. F. CollinsMathias HambergWolf D. GeppertVitali ZhaunerchykPontus AnderssonD. J. PeggChristoph DiehlDag HanstorpAnton LindahlN. D. GibsonMathias DanielssonAnders Källbergsubject
PhysicsPhysics::Atomic and Molecular ClustersIonic bondingStrongly correlated materialElectronPhysics::Chemical PhysicsAtomic physicsKinetic energyElectron scatteringAtomic and Molecular Physics and OpticsElectron ionizationDissociation (chemistry)Iondescription
A merged beams technique has been used to investigate collisions between electrons and $\text{Si}_{2}{}^{\ensuremath{-}}$ ions over a relative kinetic energy range of 0--210 eV. Absolute cross sections for pure electron detachment, detachment plus dissociation, and dissociation involving atomic and ionic products were measured. The dominant process over the energy range studied is pure electron detachment. A search for a resonance associated with a ${\text{Si}}_{2}$ dianion was made but none was observed.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2008-02-25 | Physical Review A |