6533b872fe1ef96bd12d41eb
RESEARCH PRODUCT
Multipole WIEN-filter for a high-resolution X-PEEM
V GerheimG.k.l MarxGerd Schönhensesubject
RadiationWien filterField (physics)business.industryChemistryResolution (electron density)RadiationCondensed Matter PhysicsAtomic and Molecular Physics and OpticsElectronic Optical and Magnetic MaterialsDipoleOpticsFilter (video)QuadrupolePhysical and Theoretical ChemistryAtomic physicsbusinessMultipole expansionSpectroscopydescription
Abstract The development and construction of an X-PEEM with integral multipole WIEN-filter for spectromicroscopy with high lateral resolution is presented. All relevant electron-optical properties of the filter have been examined by field and trajectory calculations. Electric and magnetic multipole components (dipole, quadrupole and hexapole) can be chosen independently from each other, thus allowing electron-optical corrections. Theoretical values for the lateral resolution are in the range of 10 nm, experimental values of ≤25 nm have been achieved using the column without filter. The instrument is designed in particular for the use of Sychrotron radiation as well as new, high-brilliance laboratory X-ray sources.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 1997-03-01 | Journal of Electron Spectroscopy and Related Phenomena |