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RESEARCH PRODUCT

The methodology for active testing of electronic devices under the radiations

A G Elio TomarchioCristiano CalligaroAldo ParlatoCalogero Pace

subject

business.industryComputer scienceSettore ING-IND/20 - Misure E Strumentazione NucleariTesting methodologies Electronic Devices Total Ionizing Dose Single Event Effects Gamma rays.Electrical engineeringelectronic devicetotal ionizing dosesingle event effectNuclear Energy and Engineeringtesting methodologygamma raylcsh:QC770-798lcsh:Nuclear and particle physics. Atomic energy. RadioactivityElectronicsSafety Risk Reliability and Qualitybusiness

description

The methodology, developed for active testing of electronic devices under the radiations, is presented. The test set-up includes a gamma-ray facility, the hardware board/fixtures and the software tools purposely designed and realized. The methodology is so wide-ranging to allow us the verification of different classes of electronic devices, even if only application examples for static random access memory modules are reported.

10.2298/ntrp1801053phttp://www.doiserbia.nb.rs/img/doi/1451-3994/2018/1451-39941801053P.pdf