Search results for " Atomic Force Microscopy"

showing 10 items of 56 documents

Current injection from metal to MoS2 probed at nanoscale by conductive atomic force microscopy

2016

Contacts with MoS2 are currently the object of many investigations, since current injection through metal/MoS2 interfaces represents one of the limiting factors to the performance of MoS2 thin film transistors. In this paper, we employed conductive atomic force microscopy (CAFM) to investigate the current injection mechanisms from a nanometric contact (a Pt coated tip) to the surface of MoS2 thin films exfoliated on SiO2. The analysis of local current-voltage (I-V) characteristics on a large array of tip positions provided high spatial resolution information on the lateral homogeneity of the tip/MoS2 Schottky barrier Phi(B) and of the ideality factor n. From the histograms of the measured P…

Ideality factorMaterials scienceConductive atomic force microscopySchottky barrierAnalytical chemistryCondensed Matter Physic02 engineering and technology01 natural sciencesStandard deviation0103 physical sciencesHomogeneity (physics)General Materials ScienceThin filmSchottky barrierNanoscopic scaleDiode010302 applied physicsbusiness.industryMechanical EngineeringSettore FIS/01 - Fisica SperimentaleConductive atomic force microscopy021001 nanoscience & nanotechnologyCondensed Matter PhysicsMechanics of MaterialsThin-film transistorOptoelectronicsMaterials Science (all)0210 nano-technologybusinessMoS2
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Force interactions and adhesion of gold contacts using a combined atomic force microscope and transmission electron microscope

2002

Force interactions and adhesion of gold contacts using a combined atomic force microscope and transmission electron microscope

Kelvin probe force microscopeChemistryAtomic force microscopyGeneral Physics and AstronomyNanotechnologySurfaces and InterfacesGeneral ChemistryAdhesionConductive atomic force microscopyCondensed Matter PhysicsQuantitative Biology::Cell BehaviorSurfaces Coatings and Filmssymbols.namesakeTransmission electron microscopysymbolsMagnetic force microscopevan der Waals forceApplied Surface Science
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Correlative atomic force and confocal fluorescence microscopy: single molecule imaging and force induced spectral shifts (Conference Presentation)

2016

A grand challenge in nanoscience is to correlate structure or morphology of individual nano-sized objects with their photo-physical properties. An early example have been measurements of the emission spectra and polarization of single semiconductor quantum dots as well as their crystallographic structure by a combination of confocal fluorescence microscopy and transmission electron microscopy.[1] Recently, the simultaneous use of confocal fluorescence and atomic force microscopy (AFM) has allowed for correlating the morphology/conformation of individual nanoparticle oligomers or molecules with their photo-physics.[2, 3] In particular, we have employed the tip of an AFM cantilever to apply c…

Kelvin probe force microscopeFluorescence-lifetime imaging microscopyMaterials sciencetechnology industry and agricultureNanotechnologySingle Molecule ImagingMolecular physicsFluorescence spectroscopylaw.inventionQuantum dotConfocal microscopylawMicroscopyPhotoconductive atomic force microscopyNanoimaging and Nanospectroscopy IV
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Micro-Raman characterization of graphene grown on SiC(000-1)

2014

Graphene (Gr) was grown on the C face of 4H-SiC under optimized conditions (high annealing temperatures ranging from 1850 to 1950°C in Ar ambient at 900 mbar) in order to achieve few layers of Gr coverage. Several microscopy techniques, including optical microscopy (OM), ?Raman spectroscopy, atomic force microscopy (AFM) and atomic resolution scanning transmission electron microscopy (STEM) have been used to extensively characterize the lateral uniformity of the as-grown layers at different temperatures. ?Raman analysis provided information on the variation of the number of layers, of the stacking-type, doping and strain.

Kelvin probe force microscopeMaterials science4H-SiCGrapheneSettore FIS/01 - Fisica SperimentaleAnalytical chemistryConductive atomic force microscopySTEMlaw.inventionAtomic layer depositionOptical microscopelawMicroscopyScanning transmission electron microscopyμRamanMechanics of MaterialMaterials Science (all)AFMGraphene?RamanInstrumentationPhotoconductive atomic force microscopy
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Single-molecule switching with non-contact atomic force microscopy

2011

We report upon controlled switching of a single 3,4,9,10-perylene tetracarboxylic diimide derivative molecule on a rutile TiO(2)(110) surface using a non-contact atomic force microscope at room temperature. After submonolayer deposition, the molecules adsorb tilted on the bridging oxygen row. Individual molecules can be manipulated by the atomic force microscope tip in a well-controlled manner. The molecules are switched from one side of the row to the other using a simple approach, taking benefit of the sample tilt and the topography of the titania substrate. From density functional theory investigations we obtain the adsorption energies of different positions of the molecule. These adsorp…

Kelvin probe force microscopeMaterials scienceMechanical EngineeringElectrostatic force microscopeBioengineeringGeneral ChemistryConductive atomic force microscopyLocal oxidation nanolithography530Molecular physicsCrystallographyMechanics of MaterialsMoleculeGeneral Materials ScienceElectrical and Electronic EngineeringMagnetic force microscopeNon-contact atomic force microscopyPhotoconductive atomic force microscopyNanotechnology
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Three-dimensional atomic force microscopy mapping at the solid-liquid interface with fast and flexible data acquisition

2016

We present the implementation of a three-dimensional mapping routine for probing solid-liquid interfaces using frequency modulation atomic force microscopy. Our implementation enables fast and flexible data acquisition of up to 20 channels simultaneously. The acquired data can be directly synchronized with commercial atomic force microscope controllers, making our routine easily extendable for related techniques that require additional data channels, e.g., Kelvin probe force microscopy. Moreover, the closest approach of the tip to the sample is limited by a user-defined threshold, providing the possibility to prevent potential damage to the tip. The performance of our setup is demonstrated …

Kelvin probe force microscopeMaterials sciencebusiness.industryInterface (computing)Nanotechnology02 engineering and technologyConductive atomic force microscopy010402 general chemistry021001 nanoscience & nanotechnology53001 natural sciencesSample (graphics)0104 chemical sciencesOpticsData acquisitionChemical force microscopyMicroscopy0210 nano-technologybusinessInstrumentationFrequency modulationReview of Scientific Instruments
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Assessment of Polarity in GaN Self-Assembled Nanowires by Electrical Force Microscopy

2015

In this work, we demonstrate the capabilities of atomic force microscopies (AFMs) for the nondestructive determination of the polarity of GaN nanowires (NWs). Three complementary AFMs are analyzed here: Kelvin probe force microscopy (KPFM), light-assisted KPFM, and piezo-force microscopy (PFM). These techniques allow us to assess the polarity of individual NWs over an area of tens of μm(2) and provide statistics on the polarity of the ensemble with an accuracy hardly reachable by other methods. The precise quantitative analysis of the tip-sample interaction by multidimensional spectroscopic measurements, combined with advanced data analysis, has allowed the separate characterization of elec…

Kelvin probe force microscopePolarity (physics)ChemistryMechanical EngineeringSurface photovoltageNanowireBioengineeringNanotechnologyGeneral ChemistryCondensed Matter Physics[PHYS.COND.CM-MS] Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci]Characterization (materials science)Condensed Matter::Materials Sciencesymbols.namesakeMicroscopysymbols[PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci]General Materials Sciencevan der Waals forcePhotoconductive atomic force microscopyComputingMilieux_MISCELLANEOUS
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Nano-Oxides produced by ns laser ablation in liquids

2014

Laser ablation in liquids was successfully applied to produce nanosized oxides from Si, Ti and Zn targets. The obtained colloidal solutions of nanoparticles were investigated by complementary techniques: AFM, IR and Raman spectroscopies; optical absorption and time resolved photoluminescence. The results demonstrate the production of SiO2, TiO2 and ZnO. The absorption and emission properties of these material have been also investigated and appear to be promising for optical applications.

Lases ablation nanosized oxides IR spectroscopy Atomic Force Microscopy time-resolved luminescence
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Different electrophysiological actions of 24- and 72-hour aggregated amyloid-beta oligomers on hippocampal field population spike in both anesthetize…

2010

Diffusible oligomeric assemblies of the amyloid beta-protein (Abeta) could be the primary factor in the pathogenic pathway leading to Alzheimer's disease (AD). Converging lines of evidence support the notion that AD begins with subtle alterations in synaptic efficacy, prior to the occurrence of extensive neuronal degeneration. Recently, however, a shared or overlapping pathogenesis for AD and epileptic seizures occurred as aberrant neuronal hyperexcitability, as well as nonconvulsive seizure activity were found in several different APP transgenic mouse lines. This generated a renewed attention to the well-known comorbidity of AD and epilepsy and interest in how Abeta oligomers influence neu…

MaleAmyloidAmyloid betaHippocampusHippocampal formationMicroscopy Atomic ForceSettore BIO/09 - FisiologiaHippocampusRats Sprague-DawleyAtomic force microscopyAlzheimer's disease; Amyloid; Excitability; Oligomer; Atomic force microscopymental disordersAnimalsMolecular BiologyNeuronsAnalysis of VarianceExcitabilityAmyloid beta-PeptidesbiologyPerforant PathwayChemistryGeneral NeuroscienceDentate gyrusLong-term potentiationPopulation spikeAlzheimer's diseaseElectric StimulationPeptide FragmentsRatsElectrophysiologyElectrophysiologyOligomerbiology.proteinNeurology (clinical)NeuroscienceDevelopmental BiologyBrain research
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Sintering process of amorphous SiO2 nanoparticles investigated by AFM, IR and Raman techniques

2011

We report an experimental investigation on the effects of thermal treatments at different temperatures (room-1270 K) and for different duration (0-75 h) on amorphous silica nanoparticles (fumed silica) in powder tablet form. Three types of fumed silica are considered, comprising nearly spherical particles of 40 nm, 14 nm and 7 nm mean diameter. The experimental techniques used here are Raman and infrared absorption (IR) spectroscopy together with atomic force microscopy (AFM). Raman and IR spectra indicate that the structure of nanometer silica particles is significantly different with respect to that of a bulk silica glass. In particular, the main differences regard the positions of the IR…

Materials Chemistry2506 Metals and AlloysInfrared absorptionMaterials scienceAbsorption spectroscopyAFM-IRAnalytical chemistryNanoparticleSinteringInfrared spectroscopyCeramics and CompositeCondensed Matter Physicsymbols.namesakeAtomic force microscopySinteringFumed silica; Sintering; Atomic force microscopy; Raman; Infrared absorptionMaterials ChemistryFumed silicaRamanFumed silicaElectronic Optical and Magnetic MaterialCondensed Matter PhysicsElectronic Optical and Magnetic MaterialsAmorphous solidCeramics and CompositessymbolsRaman spectroscopy
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