Search results for " Atomic Force Microscopy"

showing 10 items of 56 documents

Tuning molecular self-assembly on bulk insulator surfaces by anchoring of the organic building blocks.

2013

Molecular self-assembly constitutes a versatile strategy for creating functional structures on surfaces. Tuning the subtle balance between intermolecular and molecule-surface interactions allows structure formation to be tailored at the single-molecule level. While metal surfaces usually exhibit interaction strengths in an energy range that favors molecular self-assembly, dielectric surfaces having low surface energies often lack sufficient interactions with adsorbed molecules. As a consequence, application-relevant, bulk insulating materials pose significant challenges when considering them as supporting substrates for molecular self-assembly. Here, the current status of molecular self-ass…

Models MolecularMaterials scienceAnchoringNanotechnologyInsulator (electricity)Dielectricmolecular adsorption530Molecular self-assemblyMoleculeGeneral Materials ScienceComputer Simulationnon-contact atomic forceOrganic Chemicalsinsulating surfacesMechanical EngineeringIntermolecular forceElectric Conductivityself-assemblymolecule-surface interactionsModels ChemicalMechanics of MaterialsMetalsmicroscopySelf-assemblyNon-contact atomic force microscopyAdvanced materials (Deerfield Beach, Fla.)
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Lateral force microscopy of multiwalled carbon nanotubes

2009

Carbon nanotubes are usually imaged with the atomic force microscope (AFM) in non-contact mode. However, in many applications, such as mechanical manipulation or elasticity measurements, contact mode is used. The forces affecting the nanotube are then considerable and not fully understood. In this work lateral forces were measured during contact mode imaging with an AFM across a carbon nanotube. We found that, qualitatively, both magnitude and sign of the lateral forces to the AFM tip were independent of scan direction and can be concluded to arise from the tip slipping on the round edges of the nanotube. The dependence on the normal force applied to the tip and on the ratio between nanotub…

NanotubeMaterials scienceElectrostatic force microscopeAnalytical chemistryAtomic force acoustic microscopyMechanical properties of carbon nanotubesConductive atomic force microscopyAtomic and Molecular Physics and OpticsElectronic Optical and Magnetic MaterialsChemical force microscopyMagnetic force microscopeComposite materialInstrumentationNon-contact atomic force microscopyUltramicroscopy
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Smooth crack-free targets for nuclear applications produced by molecular plating

2013

The production process of smooth and crack-free targets by means of constant current electrolysis in organic media, commonly known as molecular plating, was optimized. Using a Nd salt, i.e., [Nd(NO3)(3)center dot 6H(2)O], as model electrolyte several constant current density electrolysis experiments were carried out to investigate the effects of different parameters, namely the plating solvent (isopropanol and isobutanol mixed together, pyridine, and N,N-dimethylformamide), the electrolyte concentration (0.11, 0.22, 0.44 mM), the applied current density (0.17, 0.3, 0.7, and 1.3 mA/cm(2)), and the surface roughness of the deposition substrates (12 and 24 nm). Different environments (air and …

Nuclear and High Energy PhysicsspectroscopyScanning electron microscopeX-ray photoelectronAnalytical chemistrychemistry.chemical_elementElectrolytegamma-ray spectroscopy; Atomic force microscopy (AFM); Molecular plating; Neodymium; Smooth crack-free targets; X-ray photoelectron spectroscopy (XPS)Neodymium530law.inventionSmooth crack-free targetsNuclear magnetic resonanceX-ray photoelectron spectroscopylawSurface roughnessgamma-raySpectroscopyInstrumentationPhysicsNeodymiumElectrolysisspectroscopy (XPS)X-ray photoelectron spectroscopy (XPS)Molecular platingchemistrygamma-ray spectroscopyAtomic force microscopy (AFM)Current density
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Mechanical and electroconductive properties of spatially distributed double stranded DNA arrays on Au (111)

2008

Abstract Conductive AFM was used to investigate electroconductivity through 10 nm long double stranded DNA molecules in mixed monolayers of thioalkylated-DNA and mercaptohexanol (MCH) on Au (111) surface. The distribution of DNA molecules on the surface was analyzed by tapping mode AFM. Measurements performed in lift mode confirmed that the DNA molecules protrude from the surface rather than lie horizontally adsorbed on the interface. The optimal conductivity measurement time, which is shorter than the mechanical relaxation time of oligonucleotide duplexes, was determined. It was concluded that oligonucleotide duplexes have a resistance of the order of ~ 2 Ω ⁎ m at 1 V.

OligonucleotideMetals and AlloysAnalytical chemistrySelf-assembled monolayerSurfaces and InterfacesConductive atomic force microscopyConductivitySurfaces Coatings and FilmsElectronic Optical and Magnetic MaterialsCrystallographychemistry.chemical_compoundAdsorptionchemistryMonolayerMaterials ChemistryMoleculeDNAThin Solid Films
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Formation and evolution of self-organized Au nanorings on indium-tin-oxide surface

2011

This work reports on the formation of Au nanoclusters and on their evolution in nanoring structures on indium-tin-oxide surface by sputtering deposition and annealing processes. The quantification of the characteristics of the nanorings (surface density, depth, height, and width) is performed by atomic force microscopy. The possibility to control these characteristics by tuning annealing temperature and time is demonstrated establishing relations which allow to set the process parameters to obtain nanostructures of desired morphological properties for various technological applications. © 2011 American Institute of Physics.

PLASMON RESONANCEMaterials scienceNanostructureNanoringPhysics and Astronomy (miscellaneous)Annealing (metallurgy)NanotechnologySputter depositionAu; Nanoring; Atomic force microscopySettore ING-INF/01 - ElettronicaIndium tin oxideNanoclustersAtomic force microscopyNanolithographyITO THIN-FILMSSputteringGOLD NANOPARTICLESAuNanoring
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Electronic and mechanical characterization of self-assembled alkanethiol monolayers by scanning tunneling microscopy combined with interaction-force-…

1993

We have used scanning tunneling microscopy to study self-assembled monolayers of mercaptohexadecanol in ultrigh vacuum. In addition to tunneling, the interaction force gradient acting between tip and sample was measured. Analysis of the force-gradient data shows that the tip is in mechanical contact with the surface of the monolayer which, in turn, is elastically compressed. The lateral dimensions of the mechanical contact are substantially (approximately five times) larger than the width of the tunneling-current filament. The results suggest that the compression of the monolayer constitutes an integral part of tunneling through the molecules

Protein filamentMaterials sciencelawMonolayerMoleculeNanotechnologyConductive atomic force microscopyScanning tunneling microscopeMolecular physicsQuantum tunnellingElectrochemical scanning tunneling microscopelaw.inventionCharacterization (materials science)Physical review. B, Condensed matter
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<title>Scanning probe microscopy of nanocrystalline iridium oxide thin films</title>

2003

Structural investigations of nanocrystalline iridium oxide thin films, prepared by dc magnetron sputtering technique were performed by scanning probe microscopy (SPM). SPM studies, using both atomic force microscopy (AFM) and scanning tunnelling microscopy (STM), indicate that the thin films are composed of grains with a size of about 20-50 nm. Fine crystallinity and small RMS microroughness of the films, being well below 2 nm, make iridium oxide thin films promising candidates for nanolithographic applications. The possibility to perform nanolithograhpic processes at a scale of less than 150 nm was successfully examined in AFM and STM modes.© (2003) COPYRIGHT SPIE--The International Societ…

Scanning probe microscopyMaterials scienceScanning confocal electron microscopyScanning ion-conductance microscopyNanotechnologyConductive atomic force microscopyScanning capacitance microscopyPhotoconductive atomic force microscopyVibrational analysis with scanning probe microscopyNanocrystalline materialSPIE Proceedings
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Thickness measurement of soft thin films on periodically patterned magnetic substrates by phase difference magnetic force microscopy

2013

The need for accurate measurement of the thickness of soft thin films is continuously encouraging the development of techniques suitable for this purpose. We propose a method through which the thickness of the film is deduced from the quantitative measurement of the contrast in the phase images of the sample surface acquired by magnetic force microscopy, provided that the film is deposited on a periodically patterned magnetic substrate. The technique is demonstrated by means of magnetic substrates obtained from standard floppy disks. Colonies of Staphylococcus aureus adherent to such substrates were used to obtain soft layers with limited lateral (a levy microns) and vertical (hundreds of n…

Staphylococcus aureusCantileverMaterials scienceThickness measurementMagnetic domainSurface PropertiesMicroscopy Atomic ForceAtomic force microscopyOpticsPeriodic magnetic domainsHomogeneity (physics)Thin filmInstrumentationDetection limitPhase differenceBacteriabusiness.industryMagnetic PhenomenaThickness measurement Magnetic force microscopy Atomic force microscopy Periodic magnetic domains BacteriaAtomic and Molecular Physics and OpticsElectronic Optical and Magnetic MaterialsMagnetic force microscopyatomic force microscopy; bacteria; magnetic force microscopy; periodic magnetic domains; thickness measurementNanometreMagnetic force microscopebusiness
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Study of the dynamics of biomolecules by high speed atomic force microscopy and surface enhanced Raman spectroscopy

2015

This thesis focuses on the coupling of High–Speed Atomic Force Microscopy (HS-AFM) and Surface Enhanced Raman Spectroscopy (SERS) for biomolecule analysis. We have designed a fabrication protocol to manufacture “SERS-active” substrates. The efficacy of gold, silver and gold-silver bimetallic crystalline nanoparticle substrates were evaluated. We have investigated the impact of optical and morphological features of the substrates on Raman signal intensity by analyzing well-known samples such as bipyridine ethylene and methylene blue molecules. We took an interest in three distinct biological problematics with HS-AFM and SERS analyses. First, we have detected the chemical signature of cytochr…

Tip–Enhanced Raman Spectroscopy (TERS)Surface Enhanced Raman Spectroscopy (SERS)CellsProteinsDetergent resistant membrane domains (DRMs)ProtéinesSpectroscopie Raman exaltée de surface (SERS)Nanoparticle substratesNoroviruses (NoVs)Substrats de nanoparticulesHigh–Speed Atomic Force Microscopy (HS-AFM)Microscopie à force atomique haute-vitesse (HS-AFM)Diffusion Raman exaltée par effet de pointe (TERS)Détergent résistant membrane domaines (DRMs)Plasmons de Surface Localisé (LSP)Cellules[PHYS.PHYS] Physics [physics]/Physics [physics]Localized Surface Plasmons (LSP)
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Applications and development of acoustic and microwave atomic force microscopy for high resolution tomography analysis

2016

The atomic force microscope (AFM) is a powerful tool for the characterization of organic and inorganic materials of interest in physics, biology and metallurgy. However, conventional scanning probe microscopy techniques are limited to the probing surface properties, while the subsurface analysis remains difficult beyond nanoindentation methods. Thus, the present thesis is focused on two novel complementary scanning probe techniques for high-resolution volumetric investigation that were develop to tackle this persisting challenge in nanometrology.The first technique considered, called Mode Synthesizing Atomic Force Microscopy (MSAFM), has been exploited in collaboration with Dr. Laurene Teta…

Tomographie et reconstruction 3DMicroscopie à force atomique acoustique (MSAFM)Atomic force microscopy (AFM)[SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsMode Synthesizing atomic force microscopy (MSAFM)Tomography anTomographie et reconstruction 3Dd 3D reconstruction[PHYS.PHYS] Physics [physics]/Physics [physics]Microscopie à force atomique micro-onde (SMM)Scanning microwave microscopy (SMM)Microscopie à force atomique (AFM)
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