Search results for " Semiconductor"

showing 10 items of 332 documents

Tin-related double acceptors in gallium selenide single crystals

1998

Gallium selenide single crystals doped with different amounts of tin are studied through resistivity and Hall effect measurements in the temperature range from 30 to 700 K. At low doping concentration tin is shown to behave as a double acceptor impurity in gallium selenide with ionization energies of 155 and 310 meV. At higher doping concentration tin also introduces deep donor levels, but the material remains p-type in the whole studied range of tin doping concentrations. The deep character of donors in gallium selenide is discussed by comparison of its conduction band structure to that of indium selenide under pressure. The double acceptor center is proposed to be a tin atom in interlayer…

Electron mobilityHole MobilityAnalytical chemistryGeneral Physics and Astronomychemistry.chemical_elementMineralogyDeep LevelsCondensed Matter::Materials Sciencechemistry.chemical_compound:FÍSICA [UNESCO]Condensed Matter::SuperconductivitySelenideNuclear ExperimentConduction BandsGallium Compounds ; III-VI Semiconductors ; Tin ; Impurity States ; Deep Levels ; Electrical Resistivity ; Hall Effect ; Hole Mobility ; Conduction BandsImpurity StatesElectrical ResistivityHall EffectIII-VI SemiconductorsPhonon scatteringCarrier scatteringDopingUNESCO::FÍSICAAcceptorchemistryTinGallium CompoundsTinIndiumJournal of Applied Physics
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Above-bandgap ordinary optical properties of GaSe single crystal

2009

We report above-bandgap ordinary optical properties of ε-phase GaSe single crystal. Reference-quality pseudodielectric function 〈ε(E)〉 = 〈ε1(E)〉+i〈ε2(E)〉 and pseudorefractive index 〈N(E)〉 = 〈n(E)〉+i〈k(E)〉 spectra were measured by spectroscopic ellipsometry from 0.73 to 6.45 eV at room temperature for the light polarization perpendicular to the optic axis (math⊥math). The 〈ε〉 spectrum exhibited several interband-transition critical-point structures. Analysis of second-energy derivatives calculated numerically from the measured data yielded the critical-point energy values. Carmen.Martinez-Tomas@uv.es

EllipsometryCondensed matter physicsChemistryBand gapUNESCO::FÍSICAGallium compoundsRefractive indexCritical points ; Dielectric function ; Ellipsometry ; Energy gap ; Gallium compounds ; III-VI semiconductors ; Refractive indexIII-VI semiconductorsPhysics::OpticsGeneral Physics and AstronomyCritical pointsDielectric functionPolarization (waves)Spectral lineEnergy gapOptical axis:FÍSICA [UNESCO]EllipsometryPerpendicularRefractive indexSingle crystalJournal of Applied Physics
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Neutron irradiation defects in gallium sulfide: Optical absorption measurements

1997

Gallium sulfide single crystals have been irradiated with different thermal neutron doses. Defects introduced by neutron irradiation turn out to be optically active, giving rise to absorption bands with energies ranging from 1.2 to 3.2 eV. Bands lying in the band-gap exhibit Gaussian shape. Their energies and widths are independent of the irradiation dose, but their intensities are proportional to it. Thermal annealing is completed in two stages, ending at around 500 and 720 K, respectively. Centers responsible for the absorption bands are proposed to be gallium-vacancy-galliuminterstitial complexes in which the distance between the vacancy (acceptor) and the interstitial (donor) determines…

Energy GapInterstitialsMaterials scienceIII-VI SemiconductorsAnnealing (metallurgy)Band gapVacancies (Crystal)Neutron EffectsUNESCO::FÍSICAGeneral Physics and AstronomyGallium Compounds ; III-VI Semiconductors ; Neutron Effects ; Defect Absorption Spectra ; Energy Gap ; Vacancies (Crystal) ; Interstitials ; Annealing ; Visible SpectraMolecular physicsAcceptorNeutron temperatureAnnealingCrystallographyCondensed Matter::Materials ScienceAbsorption bandVisible Spectra:FÍSICA [UNESCO]Vacancy defectGallium CompoundsIrradiationDefect Absorption SpectraNeutron irradiation
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Electric conduction in solids: a pedagogical approach supported by laboratory measurements and computer modelling environments

2008

In this paper we present a pedagogic approach aimed at modeling electric conduction in semiconductors, built by using NetLogo, a programmable modeling environment for building and exploring multi‐agent systems. ‘Virtual experiments’ are implemented to confront predictions of different microscopic models with real measurements of electric properties of matter, such as resistivity. The relations between these electric properties and other physical variables, like temperature, are, then, analyzed.

EngineeringNetLogoElectrical resistivity and conductivitybusiness.industryMechanical engineeringElectric propertiesComputer modellingComputer aided instructionbusinessThermal conductioncomputerComputer modeling Semiconductor device modeling Electrical properties Electrical resistivity Semiconductorscomputer.programming_language
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The "Livio Scarsi" X-Ray Facility at University of Palermo for Device Testing

2015

In this work, we report on the characteristics of the Livio Scarsi X-ray facility at University of Palermo. The facility is able to produce low energy X rays, within the energy range of 0.1-60 keV, with fluence rates ranging from 105-108 photons/mm2 s. The laboratory is equipped with an innovative digital detection system, based on semiconductor detectors (Si and CdTe detectors), able to provide accurate and precise estimation of the fluence rate, the energy and the exposure of X rays, even at high counting rate conditions. Instrumentation for electrical characterization (DC-AC) of semiconductor devices, for both off-line and on-line (i.e. during the irradiation) measurements, is also avail…

EngineeringPhotonbusiness.industrySettore FIS/01 - Fisica SperimentaleX-rayGamma raySemiconductor deviceFluenceSettore FIS/07 - Fisica Applicata(Beni Culturali Ambientali Biol.e Medicin)Semiconductor detectorX-ray facility semiconductor detectors digital pulse processing rad-hard MOSFETs total ionizing testsOpticsAbsorbed doseIrradiationbusinessTelecommunications2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
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Digital techniques for high-rate high-resolution radiation measurements

2014

Digital pulse processing (DPP) techniques are increasingly used in the development of modern spectroscopic systems. DPP systems, based on direct digitizing and processing of detector signals (preamplifier output signals), ensure higher flexibility, stability, lower dead time, higher throughput and better energy resolution than traditional pulse processing systems. In this work, we present our progress in the development of DPP systems for high-rate high-resolution radiation measurements. An innovative digital system, able to perform multi-parameter analysis (input counting rate, pulse height, pulse shape, event arrival time, etc.) even at high photon counting rates is presented. Experimenta…

EngineeringPixelPulse (signal processing)business.industryPreamplifierDetectorSettore FIS/01 - Fisica SperimentaleDead timePhoton countingDigital Pulse processing High photon counting rate semiconductor detectorsSettore FIS/07 - Fisica Applicata(Beni Culturali Ambientali Biol.e Medicin)OpticsElectronic engineeringbusinessThroughput (business)Energy (signal processing)
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A comparison of two innovative customer power devices for Smart Micro-Grids

2015

The paper presents a comparison of two prototypes of innovative Customer Power Devices designed for applications in Smart Micro-Grids. The devices are both equipped with Energy Storage Systems, consisting in Lithium batteries and have been assembled, independently, by the DIAEE of the University of Rome 'La Sapienza' and the DEIM of the University of Palermo in collaboration with the Italian National Agency for New Technologies, Energy and Sustainable Economic Development (ENEA). In the paper, the characteristics and the operating modes of the devices are examined and some consideration on their application in Low Voltage Smart Micro-Grids are provided. © 2015 IEEE.

Engineeringbusiness.industryEmerging technologiesElectrical engineeringEnergy Engineering and Power TechnologyDistributed GenerationEnergy StorageSmart GridsEnergy storageSettore ING-IND/33 - Sistemi Elettrici Per L'EnergiaSmart griddistributed generation; energy storage; LI-ION batteries; smart grids; electrical and electronic engineering; energy engineering and power technologyDistributed generationAgency (sociology)Li-Ion BatterieLi-Ion BatteriesPower semiconductor deviceElectrical and Electronic EngineeringSmart GridSmart Grids;Li-Ion Batteries;Energy Storage;Distributed GenerationbusinessLow voltage2015 IEEE 15th International Conference on Environment and Electrical Engineering (EEEIC)
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UPS fuel cell based: An innovative back-up system

2007

The aim of the paper is to evaluate the technical feasibility and aspects related to the use, in an Uninterruptible Power Supply (UPS), of fuel cells instead of traditional electrochemical batteries. The proposed system, named UPS-FCB (Fuel Cell Based) presents a modular and versatile system configuration; particularly it is possible to integrate it with traditional UPS. Moreover the system features can be modified in terms of power, reliability, back-up time, etc., by changing the power devices. A detailed experimental analysis has been carried out on a passive stand-by UPS integrated with a FCB; experimental results can be easily extended to the other possible system architectures. © 2007…

Engineeringbusiness.industryFuel cellModular designUPSEnergy storageAutomotive engineeringPower (physics)Back-upSettore ING-IND/33 - Sistemi Elettrici Per L'EnergiaTechnical feasibilityReliability (semiconductor)Electronic engineeringPower semiconductor deviceFuel Cell UPS hydrogen back-upbusinessPower-system protectionUninterruptible power supplyHydrogen
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Electrical characterization of deoxyribonucleic acid hybridization in metal-oxide-semiconductor-like structures

2012

In this work, metal-oxide-semiconductor (MOS)-like sensors in which deoxyribonucleic acid (DNA) strands are covalently immobilized either on Si oxide or on a gold surface were electrically characterized. Si oxide fabrication process allowed us to have a surface insensitive to the solution pH. A significant shift in the flat band voltage was measured after single strand DNA immobilization (+0.47 +/- 0.04 V) and after the complementary strand binding (+0.07 +/- 0.02 V). The results show that DNA sensing can be performed using a MOS structure which can be easily integrated in a more complex design, thus avoiding the problems related to the integration of micro-electrochemical cells.

FabricationMaterials scienceComplementary strandPhysics and Astronomy (miscellaneous)OxideNanotechnologyElectrical characterizationSettore ING-INF/01 - ElettronicaComplex designSIO2 SURFACESMetalSi oxidechemistry.chemical_compoundCAPACITORSComplementary DNASolution pHFlat-band voltageMicro-electrochemical cellFIELD-EFFECT DEVICESMolecular biophysicsMetal oxide semiconductorDNAGold surfaceMOS structureIMMOBILIZATIONChemical engineeringchemistryFabrication proceCovalent bondvisual_artvisual_art.visual_art_mediumSingle strand DNABiosensorDNADNA sensing
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Effect of a fluctuating electric field on electron spin dephasing in III-V semiconductors

2011

In the present work we investigate electron spin relaxation in low-doped n-type GaAs semiconductor bulks driven by a static electric field. The electron dynamics is simulated by a Monte Carlo procedure which keeps into account all the possible scattering phenomena of the hot electrons in the medium and includes the evolution of spin polarization. Spin relaxation lengths are computed through the D’yakonov-Perel process, which is the only relevant relaxation mechanism in zinc-blende semiconductors. Since semiconductor based devices are always imbedded into a noisy environment that can strongly affect their performance, the decay of initial spin polarization of conduction electrons is calculat…

Fluctuation phenomena random processes noise and Brownian motionSpin polarized transport in semiconductorDistribution theory and Monte Carlo studieSpin relaxation and scatteringSettore FIS/03 - Fisica Della Materia
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