Search results for " Silicon"

showing 10 items of 247 documents

Positron Annihilation in Defected Monocrystalline Gold Samples

2005

Angular distribution of the positron annihilation quanta was measured for monocrystalline gold samples, oriented in (110) and (111) directions. The samples were deformed by elongation for different deformation degrees. The S and W parameters as a function of deformation degree of the sample were determined. It was found that the dynamics of the dislocations and vacancy generation during the sliding of some crystallographic planes, depends on the crystallographic direction.

Monocrystalline siliconCondensed Matter::Materials ScienceMaterials scienceAngular distributionCondensed matter physicsVacancy defectPhysics::Accelerator PhysicsGeneral Physics and AstronomyDeformation (meteorology)ElongationPositron annihilationActa Physica Polonica A
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Positron Annihilation in Metals Defected by Action of the Tensile Force

2006

Results of experimental investigations of uniaxially elongated mono- and polycrystalline samples of several metals (Fe, Ta, Pd, Ag, and Au), performed using the positron annihilation methods, are reviewed. The dependences of the S-parameters and positron lifetimes on the relative elongation of the samples were presented. The data obtained for polycrystalline samples indicate that in the proportionality and limited proportionality regions the changes in the physical properties are governed mainly by generation of vacancies and by kinetics of formation and transformations of vacancy clusters occurring flrst of all on the grain boundaries of monocrystallites. In the region of plastic deformati…

Monocrystalline siliconCondensed Matter::Materials SciencePositronMaterials scienceCondensed matter physicsVacancy defectKineticsGeneral Physics and AstronomyGrain boundarySlip (materials science)CrystalliteElongationActa Physica Polonica A
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Morphology Study of the Porosity of the GaP Surface Layer Formed on the Surface of a Single Crystal by Electrochemical Etching

2021

The article analyzes the morphological characteristics of a porous GaP surface layer formed on the surface of monocrystalline gallium phosphide by electrochemical etching. The correlations between the etching time and the appropriate size, shape and density of pores have been established and studied in detail.

Monocrystalline siliconchemistry.chemical_compoundMorphology (linguistics)Materials sciencechemistryEtching (microfabrication)Gallium phosphidechemistry.chemical_elementSurface layerGalliumComposite materialPorositySingle crystal2021 IEEE 11th International Conference Nanomaterials: Applications & Properties (NAP)
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Micro‐tomographic characterization of composite recycled glass‐silicone foams for applications in civil engineering

2019

Noninvasive X‐ray micro‐computed tomography was applied for a complete quantitative and qualitative analysis of the cellular structure of composite foams constituted by a silicone matrix and a glass production waste filler. Composite foams with different glass filler weight content in the range 0–80% were synthesized and characterized. The tomographic analysis was employed in order to assess the structural heterogeneities, void fraction values, and bubble size distribution for all composite foams. The 3D micro‐CT images analysis, performed at different cross‐sections, highlighted heterogeneous cell growth or more elongated cells in the case of low and high filler content foams, respectively…

MorphologyMicro-CTGlass recyclingcomposites; foams; glass waste; morphology; siliconeMaterials sciencePolymers and PlasticsComposite numberGeneral ChemistryFoamSurfaces Coatings and FilmsCharacterization (materials science)chemistry.chemical_compoundSiliconechemistryMaterials ChemistryComposite materialSiliconeCompositesJournal of Applied Polymer Science
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Selenium Nanoparticles Synthesized via a Facile Hydrothermal Method

2012

Crystalline selenium nanostructures were synthesized from the reaction of a GeSe3 glass with water at 85°C for 144 hours. The hydrolysis of the Ge-Se bonds releases Se fragments in the solution where they form a colloidal suspension of amorphous nanospheres. The later evolve toward a more stable hexagonal phase (trigonal) leading to the anisotropic growth of one-dimensional monocrystalline structures. Filaments, bars and tubes of monocrystalline trigonal selenium were obtained with diameters ranging from 10 nm to 1 µm and aspect ratio up to 180. This simple process in aqueous solution opens new perspectives for the synthesis of 1D nanoparticles of trigonal selenium at large scale.

NanostructureMaterials scienceAqueous solutionInorganic chemistryGeneral EngineeringHexagonal phaseNanoparticlechemistry.chemical_elementChalcogenide glassAmorphous solidMonocrystalline siliconchemistryChemical engineeringSeleniumAdvanced Materials Research
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Signal to Noise Ratio of Silicon Photomultipliers measured in the Continuous Wave Regime

2014

We performed a Signal to Noise Ratio characterization, in the continuous wave regime, at different bias voltages, frequencies and temperatures, on a novel class of silicon photomultipliers fabricated in planar technology on silicon p-type substrate. Signal to Noise Ratio has been measured as the ratio of the photogenerated current, filtered and averaged by a lock-in amplifier, and the Root Mean Square deviation of the overall current flowing to the device. The measured noise takes into account the shot noise, resulting from the photocurrent and the dark current. We have also performed a comparison between our SiPMs and a photomultiplier tube in terms of Signal to Noise Ratio, as a function …

Noise temperatureMaterials sciencePhysics::Instrumentation and Detectorsbusiness.industryphotomultipliers sipm snr detector siliconNoise spectral densityElectrical engineeringShot noiseSettore ING-INF/02 - Campi ElettromagneticiNoise figureNoise (electronics)Settore ING-INF/01 - ElettronicaSignal-to-noise ratioOpticsNoise generatorFlicker noisebusiness
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The DAMPE silicon–tungsten tracker

2016

Abstract The DArk Matter Particle Explorer (DAMPE) is a spaceborne astroparticle physics experiment, launched on 17 December 2015. DAMPE will identify possible dark matter signatures by detecting electrons and photons in the 5 GeV–10 TeV energy range. It will also measure the flux of nuclei up to 100 TeV, for the study of the high energy cosmic ray origin and propagation mechanisms. DAMPE is composed of four sub-detectors: a plastic strip scintillator, a silicon–tungsten tracker–converter (STK), a BGO imaging calorimeter and a neutron detector. The STK is composed of six tracking planes of 2 orthogonal layers of single-sided micro-strip detectors, for a total detector surface of ca. 7 m2. T…

Nuclear and High Energy PhysicsCosmic rays; Dark matter; Silicon tracker; Spaceborne experiment; Nuclear and High Energy Physics; InstrumentationPhysics::Instrumentation and DetectorsCosmic rayParticle detectorsTracking (particle physics)01 natural sciencesParticle detectorOpticscosmic rays0103 physical sciencesDark matterNeutron detection010303 astronomy & astrophysicsInstrumentationAstroparticle physicsPhysicsLarge Hadron ColliderCalorimeter (particle physics)010308 nuclear & particles physicsbusiness.industryDetectorSettore FIS/01 - Fisica SperimentaleParticle detectors cosmic raysSpaceborne experimentSilicon trackerHigh Energy Physics::Experimentbusiness
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Heavy-Ion Microbeam Studies of Single-Event Leakage Current Mechanism in SiC VD-MOSFETs

2020

Heavy-ion microbeams are employed for probing the radiation-sensitive regions in commercial silicon carbide (SiC) vertical double-diffused power (VD)-MOSFETs with micrometer accuracy. By scanning the beam spot over the die, a spatial periodicity was observed in the leakage current degradation, reflecting the striped structure of the power MOSFET investigated. Two different mechanisms were observed for degradation. At low drain bias (gate and source grounded), only the gate-oxide (at the JFET or neck region) is contributing in the ion-induced leakage current. For exposures at drain–source bias voltages higher than a specific threshold, additional higher drain leakage current is observed in t…

Nuclear and High Energy PhysicsMaterials sciencemicrobeamsilicon carbide (SiC) vertical double-diffused power(VD)-MOSFETleakage current degradation01 natural sciencesDie (integrated circuit)chemistry.chemical_compoundpuolijohteet0103 physical sciencesMOSFETSilicon carbideNuclear Physics - ExperimentPower semiconductor deviceElectrical and Electronic EngineeringPower MOSFETsingle-event effect (SEE)010308 nuclear & particles physicsbusiness.industryionisoiva säteilyHeavy ion; leakage current degradation; microbeam; silicon carbide (SiC) vertical double-diffused power(VD)-MOSFET; single-event effect (SEE); single-event leakage current (SELC)JFETSELCMicrobeamSiC VD-MOSFET620single event effectsäteilyfysiikkaNuclear Energy and Engineeringchemistryheavy-ionOptoelectronicsddc:620Heavy ionbusinesssingle-event leakage current (SELC)Voltage
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Crystallographic analysis of extended defects in diamond-type crystals

2005

Abstract To investigate irradiation-induced Si amorphization during its initial stages, we have performed a classical molecular-dynamics (MD) calculation for the case of self-irradiation by 5 keV ions at a low temperature of 100 K. We examined the geometry of self-interstitial atom (SIA) clusters using the pixel mapping (PM) method, on the output data of MD calculations. Perfect crystalline silicon (c-Si) is amorphized by self-irradiation, and we observe that many SIA are produced. During sequential self-irradiation, the most frequently observed species were isolated SIA, i.e. I1 (monomer). The fractions of SIA clusters decreased as I2 (dimer), I3 (trimer), and I4 (tetramer) clusters, respe…

Nuclear and High Energy PhysicsMolecular dynamicschemistry.chemical_compoundCrystallographyDiamond typechemistryTetramerDimerAtomTrimerCrystalline siliconInstrumentationIonNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
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Results on radiation hardness of black silicon induced junction photodetectors from proton and electron radiation

2020

Abstract The stability of black silicon induced junction photodetectors under high-energy irradiation was tested with 11 MeV protons and 12 MeV electrons using fluence of 1 ⋅ 10 10 protons/cm2 and dose of 67 krad(Si) for protons and electrons, respectively. The energies and dose levels were selected to test radiation levels relevant for space applications. The degradation was evaluated through dark current and external quantum efficiency changes during (within 1 h after each step) and after (some days after) full irradiation sequences. Furthermore, the black silicon photodetectors were compared to planar silicon induced junction and planar silicon pn-junction photodetectors to assess the co…

Nuclear and High Energy PhysicsPassivationSiliconPhysics::Instrumentation and Detectorschemistry.chemical_element02 engineering and technology01 natural scienceschemistry.chemical_compound0103 physical sciencesRadiation damageElectron beam processingIrradiationInstrumentationPhysics010308 nuclear & particles physicsbusiness.industryBlack silicontechnology industry and agricultureequipment and supplies021001 nanoscience & nanotechnologySemiconductorchemistryOptoelectronicsQuantum efficiency0210 nano-technologybusinessNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
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