Search results for " Transmission"

showing 10 items of 1099 documents

A Scanning Electron Microscope for Ultracold Atoms

2006

We propose a new technique for the detection of single atoms in ultracold quantum gases. The technique is based on scanning electron microscopy and employs the electron impact ionization of trapped atoms with a focussed electron probe. Subsequent detection of the resulting ions allows for the reconstruction of the atoms position. This technique is expected to achieve a much better spatial resolution compared to any optical detection method. In combination with the sensitivity to single atoms, it makes new in situ measurements of atomic correlations possible. The detection principle is also well suited for the addressing of individual sites in optical lattices.

Condensed Matter::Quantum GasesMaterials scienceStatistical Mechanics (cond-mat.stat-mech)Physics and Astronomy (miscellaneous)Scanning confocal electron microscopyFOS: Physical sciencesElectron tomographyUltracold atomScanning transmission electron microscopyPhysics::Atomic and Molecular ClustersEnergy filtered transmission electron microscopyPhysics::Atomic PhysicsElectron beam-induced depositionAtomic physicsHigh-resolution transmission electron microscopyInstrumentationEnvironmental scanning electron microscopeCondensed Matter - Statistical Mechanics
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A low-pass velocity filter for ultracold neutrons

2012

Abstract We have built a device to filter ultracold neutrons with axial velocities v n ≤ 8.0 m / s from faster neutrons. The apparatus has been successfully tested at the Institut Laue-Langevin in Grenoble and is used in specific experiments, e.g., the measurement of ultracold neutron transmission through various types of neutron guides.

Condensed Matter::Quantum GasesNuclear physicsPhysicsNuclear and High Energy PhysicsFilter (video)Astrophysics::High Energy Astrophysical PhenomenaLow-pass filterNuclear TheoryUltracold neutronsNeutronNeutron transmissionNuclear ExperimentInstrumentationNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
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Detection of power line insulators on digital images with the use of laser spots

2019

The massive growth of technologies used to register and process digital images allow for their application in evaluating the technical condition of power lines. However, it is not possible without a set of dedicated methods for obtaining diagnostic information based on registered video data. The method described here details the detection of power line insulators in digital images featuring diversified backgrounds using laser spots. The algorithm of detecting an insulator in analysed images is based on testing the digital signal of pixel intensity profiles read between subsequent pairs of laser points in the image. The method is comprised of the following stages: import the image with laser…

Contextual image classificationComputer sciencebusiness.industryComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISIONImage registration020206 networking & telecommunications02 engineering and technologyLaserObject detectionlaw.inventionMaxima and minimaDigital imageElectric power transmissionlawSignal ProcessingDigital image processing0202 electrical engineering electronic engineering information engineering020201 artificial intelligence & image processingComputer visionComputer Vision and Pattern RecognitionArtificial intelligenceElectrical and Electronic EngineeringbusinessSoftwareIET Image Processing
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Methodologies for the Exploitation of Existing Energy Corridors. GIS Analysis and DTR Applications

2018

The exploitation of power lines currently in operation has now become a common practice among electric system operators. The construction of new power lines requires taking economic, political and social problems into consideration. This paper considers two methodologies adopted by the Italian Transmission System Operator (TSO), Terna S.p.A.: Dynamic Thermal Rating (DTR) and Laser Imaging Detection and Ranging-Geographic Information System (L-GIS). DTR systems dynamically calculate the real transport capacity of a power line. The L-GIS system allows, after the geo-referencing of the power line, the management of any interference between the line and the nearby obstacles, permitting the opti…

Control and OptimizationRenewable Energy Sustainability and the EnvironmentComputer scienceoverhead transmission lines020209 energy020208 electrical & electronic engineeringLIDAR (Laser Imaging Detection and Ranging)-GIS; DTR; overhead transmission linesEnergy Engineering and Power TechnologyHigh voltage02 engineering and technologyLine (electrical engineering)Reliability engineeringPower (physics)Settore ING-IND/33 - Sistemi Elettrici Per L'EnergiaElectric power transmission0202 electrical engineering electronic engineering information engineeringLIDAR (Laser Imaging Detection and Ranging)-GISTransmission system operatorElectric powerElectrical and Electronic EngineeringDTREngineering (miscellaneous)Energy (signal processing)Energy (miscellaneous)Energies
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A New Coupling Solution for G3-PLC Employment in MV Smart Grids

2019

This paper proposes a new coupling solution for transmitting narrowband multicarrier power line communication (PLC) signals over medium voltage (MV) power lines. The proposed system is based on an innovative PLC coupling principle, patented by the authors, which exploits the capacitive divider embedded in voltage detecting systems (VDS) already installed inside the MV switchboard. Thus, no dedicated couplers have to be installed and no switchboard modifications or energy interruptions are needed. This allows a significant cost reduction of MV PLC implementation. A first prototype of the proposed coupling system was presented in previous papers: it had a 15 kHz bandwidth useful to couple sin…

Control and Optimizationpower system measurementComputer scienceOrthogonal frequency-division multiplexingEnergy Engineering and Power Technologylcsh:Technologypower system communicationNarrowbandsmart gridsElectrical and Electronic EngineeringCenter frequencysmart gridEngineering (miscellaneous)Renewable Energy Sustainability and the Environmentbusiness.industrylcsh:TBandwidth (signal processing)Electrical engineeringpower system measurementsnarrow band power line communicationPower-line communicationElectric power transmissionSmart gridModulationcommunication system performanceICT infrastructure for smart gridbusinessSettore ING-INF/07 - Misure Elettriche E ElettronicheEnergy (miscellaneous)VoltageEnergies
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Compact, cost-effective and field-portable microscope prototype based on MISHELF microscopy

2016

AbstractWe report on a reduced cost, portable and compact prototype design of lensless holographic microscope with an illumination/detection scheme based on wavelength multiplexing, working with single hologram acquisition and using a fast convergence algorithm for image processing. All together, MISHELF (initials coming from Multi-Illumination Single-Holographic-Exposure Lensless Fresnel) microscopy allows the recording of three Fresnel domain diffraction patterns in a single camera snap-shot incoming from illuminating the sample with three coherent lights at once. Previous implementations have proposed an illumination/detection procedure based on a tuned (illumination wavelengths centered…

Conventional transmission electron microscopeDiffractionMultidisciplinaryMicroscopeComputer sciencebusiness.industryComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISIONHolographyImage processing02 engineering and technology021001 nanoscience & nanotechnology01 natural sciencesArticleInterference microscopylaw.invention010309 opticsOpticslaw0103 physical sciencesPhase imagingMicroscopyMiniaturization0210 nano-technologybusinessScientific Reports
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Peculiarities of imaging one- and two-dimensional structures in an emission electron microscope. 1. theory

2000

Local changes in work function cause deviations of the electrical microfield near a sample surface as a result of the uniform accelerating field distribution between the sample (cathode) and the extractor electrode (anode). This results in a change in the electron trajectories. As a consequence, the microscope image shows remarkable changes in position, size, intensity and lateral resolution of distinct details, which can be quantitatively described by the calculations presented here. Analysing these effects in the image gives an opportunity to determine the real lateral size of the observed structures and the distribution of local contact potentials.

Conventional transmission electron microscopeHistologyMicroscopebusiness.industryScanning electron microscopeChemistryMolecular physicsCathodePathology and Forensic Medicinelaw.inventionOpticslawScanning transmission electron microscopyWork functionsense organsElectron microscopeElectron beam-induced depositionbusinessJournal of microscopy
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Probing of nanocontacts inside a transmission electron microscope

2007

In the past twenty years, powerful tools such as atomic force microscopy have made it possible to accurately investigate the phenomena of friction and wear, down to the nanometer scale. Readers of this book will become familiar with the concepts and techniques of nanotribology, explained by an international team of scientists and engineers, actively involved and with long experience in this field. Edited by two pioneers in the field, 'Fundamentals of Frictions and Wear at the Nanoscale' is suitable both as first introduction to this fascinating subject, and also as a reference for researchers wishing to improve their knowledge of nanotribology and to keep up with the latest results in this …

Conventional transmission electron microscopeMaterials sciencebusiness.industryNanotribologyTransmission electron microscopeImagingScanning probe microscopyScanning probe microscopyTransmission electron microscopyScanning transmission electron microscopyNanotribologyOptoelectronicsScanning probe microscope (SPM)Transmission electron microscopy (TEM)business
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Spatially-multiplexed interferometric microscopy (SMIM): converting a standard microscope into a holographic one

2014

We report on an extremely simple, low cost and highly stable way to convert a standard microscope into a holographic one. The proposed architecture is based on a common-path interferometric layout where the input plane is spatially-multiplexed to allow reference beam transmission in a common light-path with the imaging branch. As consequence, the field of view provided by the layout is reduced. The use of coherent illumination (instead of the broadband one included in the microscope) and a properly placed one-dimensional diffraction grating (needed for the holographic recording) complete the experimental layout. The proposed update is experimentally validated in a regular Olympus BX-60 upri…

Conventional transmission electron microscopeMicroscopeMaterials sciencebusiness.industryComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISIONHolographyInterferometric microscopyAtomic and Molecular Physics and Opticslaw.inventionInterferometryOpticslawReference beamMicroscopyDigital holographic microscopybusinessOptics Express
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Dopant Contrast in Semiconductors as Interpretation Challenge at Imaging by Electrons

2007

Mechanisms responsible for the contrast between differently doped areas in semiconductors, which is observed in electron micrographs, is discussed as regards the key factors determining the sign and magnitude of the contrast. Experimental data obtained by means of the scanning electron microscope (SEM), scanning low energy electron microscope and photoelectron emission microscope are reviewed together with hints following from them for compilation of a model of the contrast mechanism.

Conventional transmission electron microscopeMicroscopeMaterials sciencebusiness.industryMechanical Engineeringtechnology industry and agricultureLow-voltage electron microscopeCondensed Matter Physicslaw.inventionOpticsMechanics of MaterialslawScanning transmission electron microscopyOptoelectronicsGeneral Materials ScienceElectron beam-induced depositionElectron microscopeHigh-resolution transmission electron microscopybusinessEnvironmental scanning electron microscopeMATERIALS TRANSACTIONS
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