Search results for " technology"

showing 10 items of 23337 documents

High spatial resolution strain measurements at the surface of duplex stainless steels

2007

International audience; The determination of local strain fields at the surface of materials is of major importance for understanding their reactivity. In the present paper, lithography is used to fabricate grid points at the microscale and to map strain gradients within grains and between grains. This method was applied to duplex stainless steels which exhibit heterogeneous strain distributions under straining conditions. The influence of various parameters (the specimen microstructure, the density of slip bands, the number of systems activated and the grid geometry) on the strain value was discussed.

010302 applied physicsMaterials science[ SPI.MAT ] Engineering Sciences [physics]/MaterialsMetallurgyLüders bandtechnology industry and agriculture02 engineering and technologySlip (materials science)Plasticity021001 nanoscience & nanotechnologyCondensed Matter PhysicsMicrostructure01 natural sciences[SPI.MAT]Engineering Sciences [physics]/Materials0103 physical sciences0210 nano-technologyLocal fieldLithographyImage resolutionMicroscale chemistryPhilosophical Magazine
researchProduct

Reducing the Schottky barrier height at the MoSe2/Mo(110) interface in thin-film solar cells: Insights from first-principles calculations

2016

Abstract We report on first-principles calculations of the properties of the MoSe2/Mo(110) interface. Due to mismatch between the lattice parameters of the two structures, different patterns can form at the interface. We have studied the formation energy and the band alignment of six patterns for the MoSe2 (0001)/Mo(110) interface and one pattern for the MoSe2 (11 2 0)/Mo(110) interface. The MoSe2 (11 2 0)/Mo(110) interface is more stable than the MoSe 2 (0001)/Mo(110) interface and in contrast to MoSe2 (0001)/Mo(110), no Schottky barrier forms at MoSe2 (11 2 0)/Mo(110). Doping with Na modifies the band alignment at the interfaces. The Schottky barrier height decreases, provided that a Na a…

010302 applied physicsMaterials science[PHYS.NUCL]Physics [physics]/Nuclear Theory [nucl-th]Schottky barriercu(InDopingMetals and Alloys02 engineering and technologySurfaces and InterfacesInterface[PHYS.NEXP]Physics [physics]/Nuclear Experiment [nucl-ex]021001 nanoscience & nanotechnology01 natural sciencesSurfaces Coatings and FilmsElectronic Optical and Magnetic MaterialsCrystallographyGa)Se 2MoSe2/Mo(110)Lattice (order)0103 physical sciencesMaterials ChemistryThin film solar cellThin-film solar cell0210 nano-technologySchottky barrier
researchProduct

SiC MOSFET vs SiC/Si Cascode short circuit robustness benchmark

2019

Abstract Nowadays, MOSFET SiC semiconductors short circuit capability is a key issue. SiC/Si Cascodes are compound semiconductors that, in some aspects, show a similar MOSFET behaviour. No interlayer dielectric insulation suggests, in theory, Cascode JFETs as more robust devices. The purpose of this paper is to compare the drift and degradation of two commercial devices static parameters by exposing them to different levels of repetitive 1.5 μs short-circuit campaigns at 85% of its breakdown voltage. Short-circuit time has been set experimentally, and longer times result in catastrophic failure of MOSFET devices due to over self-heating. For this purpose, pre- and post-test short circuit ch…

010302 applied physicsMaterials sciencebusiness.industry020208 electrical & electronic engineering02 engineering and technologyDielectricCondensed Matter Physics01 natural sciencesAtomic and Molecular Physics and OpticsSurfaces Coatings and FilmsElectronic Optical and Magnetic MaterialsSemiconductorCatastrophic failureRobustness (computer science)0103 physical sciencesMOSFET0202 electrical engineering electronic engineering information engineeringOptoelectronicsBreakdown voltageCascodeElectrical and Electronic EngineeringSafety Risk Reliability and QualitybusinessShort circuitMicroelectronics Reliability
researchProduct

3D magnetic and thermal fields for in the transformer with homogenised amorphous C-core under high frequency

2017

010302 applied physicsMaterials sciencebusiness.industry020208 electrical & electronic engineeringElectrical engineering02 engineering and technology01 natural sciencesAmorphous solidlaw.inventionlaw0103 physical sciencesThermal0202 electrical engineering electronic engineering information engineeringEddy currentAmorphous metal transformerElectrical and Electronic EngineeringComposite materialbusinessTransformerPRZEGLĄD ELEKTROTECHNICZNY
researchProduct

Space Charges and Partial Discharges Simultaneous Measurements under DC Stress

2016

In the field of HVDC, the main causes of insulation aging are due to the space charge and PD phenomena. In particular, the purpose of the present work is to verify a possibility to measure simultaneously the space charge and the PDs under DC stress in order to evaluate the correlation between both phenomena. The space charge was measured by using a modified PEA cell and PDs were measured by using a novel wireless sensor system. The space charge profile and the PD pulses carried out simultaneously have been reported and discussed.

010302 applied physicsMaterials sciencebusiness.industry020209 energyElectrical engineering02 engineering and technologyMechanicsSpace (mathematics)01 natural sciencesspace charge partial discharges DC stress HVDCStress (mechanics)Settore ING-IND/31 - Elettrotecnica0103 physical sciences0202 electrical engineering electronic engineering information engineeringbusiness
researchProduct

Partial discharge of gel insulated high voltage power modules subjected to unconventional voltage waveforms

2016

Performances and duration of the new generation of high voltage power electronic components are dependent on dielectric materials aim to insulating their internal terminals. The presence of defects, some due to faults generated during the manufacturing process, but also due to the internal design of layers and connections, can cause local enhancements of electric field and consequently possible activity of partial discharges phenomena or other effects (aging, tracking) that may result in reduction of device reliability. Furthermore, the usage of unconventional voltage waveforms, like square waves or pulse width modulated waves, additionally increases the electrical aging of the insulation s…

010302 applied physicsMaterials sciencebusiness.industryAcoustics020208 electrical & electronic engineeringElectrical engineeringHigh voltage02 engineering and technologyInsulated-gate bipolar transistor01 natural sciencesSettore ING-IND/31 - ElettrotecnicaReliability (semiconductor)Partial Discharge Gel insulation IGBTvisual_artInsulation systemPower module0103 physical sciencesElectronic componentPartial discharge0202 electrical engineering electronic engineering information engineeringvisual_art.visual_art_mediumbusinessVoltage2016 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)
researchProduct

Selective Band Gap to Suppress the Spurious Acoustic Mode in Film Bulk Acoustic Resonator Structures

2018

In this work, we investigate numerically the propagation of Lamb waves in a film bulk acoustic resonator (FBAR) structure formed by piezoelectric ZnO layer sandwiched between two Mo electrodes coupled with Bragg reflectors; the system is thus considered as a phononic-crystal (PnC) plate. The aim is to suppress the first-order symmetric Lamb wave mode considered as a spurious mode caused by the establishment of a lateral standing wave due to the reflection at the embedded lateral extremities of the structure; this spurious mode is superposing to the main longitudinal mode resonance of the FBAR. The finite element study, using harmonic and eigen-frequency analyses, is performed on the section…

010302 applied physicsMaterials sciencebusiness.industryBand gapGeneral EngineeringResonance02 engineering and technology021001 nanoscience & nanotechnologyAntiresonance01 natural sciencesStanding waveResonatorQ factor0103 physical sciencesReflection (physics)Optoelectronics0210 nano-technologybusinessSpurious relationshipJournal of Vibration and Acoustics
researchProduct

Cold gas dynamic spray technology: A comprehensive review of processing conditions for various technological developments till to date

2018

Abstract Today, cold gas dynamic spray (CGDS) technology has thrived with considerable capabilities for manufacturing various technological depositions. The deposition conditions have been developed through many years and that have led to produce ample experimental data which is available in the literature. But, recent research and development activities also reveal innovative findings regarding various deposition conditions. This paper contains a review of experimental deposition procedures for the cold spray additive manufacturing. Details of processing conditions are reported and classified into various categories of baseline working conditions, specific processing including deposition o…

010302 applied physicsMaterials sciencebusiness.industryBiomedical EngineeringGas dynamic cold sprayMechanical engineering02 engineering and technologyengineering.material021001 nanoscience & nanotechnology01 natural sciencesIndustrial and Manufacturing EngineeringCoating0103 physical sciencesengineeringGeneral Materials Science0210 nano-technologyProcess engineeringbusinessEngineering (miscellaneous)Additive Manufacturing
researchProduct

2018

Damping distances of surface plasmon polariton modes sustained by different thin titanium nitride (TiN) films are measured at the telecom wavelength of 1.55 μm. The damping distances are correlated to the electrical direct current resistivity of the films sustaining the surface plasmon modes. It is found that TiN/Air surface plasmon mode damping distances drop non-linearly from 40 to 16μm as the resistivity of the layers increases from 28 to 130μΩ.cm, respectively. The relevance of the direct current (dc) electrical resistivity for the characterization of TiN plasmonic properties is investigated in the framework of the Drude model, on the basis of parameters extracted from spectroscopic ell…

010302 applied physicsMaterials sciencebusiness.industryDirect currentSurface plasmonPhysics::Opticschemistry.chemical_element02 engineering and technology021001 nanoscience & nanotechnology01 natural sciencesDrude modelSurface plasmon polaritonAtomic and Molecular Physics and OpticsCondensed Matter::Materials ScienceOpticschemistryElectrical resistivity and conductivityPhysical vapor deposition0103 physical sciencesOptoelectronics0210 nano-technologybusinessTinPlasmonOptics Express
researchProduct

Emerging blue-UV luminescence in cerium doped YAG nanocrystals

2016

Physica status solidi / Rapid research letters 10(6), 475 - 479(2016). doi:10.1002/pssr.201600041

010302 applied physicsMaterials sciencebusiness.industryDopingchemistry.chemical_elementSynchrotron radiationPhosphor02 engineering and technologyScintillator021001 nanoscience & nanotechnologyCondensed Matter Physics01 natural sciences530CeriumchemistryNanocrystal0103 physical sciencesOptoelectronicsGeneral Materials Scienceddc:5300210 nano-technologybusinessLuminescence
researchProduct