Search results for "Abstract"

showing 10 items of 1959 documents

Low Dose-Rate, High Total Dose Set-Up for Rad-Hard CMOS I/O Circuits Testing

2017

In this paper, the planning of low dose-rate, high total dose testing campaign for I/O circuits is reported. In particular, the paper describes all development steps, starting from the rad-hard I/O circuits design and the implementation of the test-chip, which is meant to allow comparative testing between rad-hard and standard devices. The designed experimental setup permits in situ measurements, therefore the circuits behavior can be remotely monitored for very long periods. This feature enables low dose-rate testing up to very high dose.

Set (abstract data type)CMOSComputer scienceFeature (computer vision)Total doseElectronic engineeringLow dose rateElectronic circuit
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The norm of the characteristic function of a set in the John‐Nirenberg space of exponent p

2020

Set (abstract data type)Characteristic function (convex analysis)Pure mathematicsGeneral MathematicsGeneral EngineeringExponentSpace (mathematics)Nirenberg and Matthaei experimentBounded mean oscillationMathematicsMathematical Methods in the Applied Sciences
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Geometric rigidity of a class of fractal sets

2017

We study geometric rigidity of a class of fractals, which is slightly larger than the collection of self-conformal sets. Namely, using a new method, we shall prove that a set of this class is contained in a smooth submanifold or is totally spread out. (© 2006 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)

Set (abstract data type)Class (set theory)Pure mathematicsIterated function systemFractalGeneral MathematicsFOS: MathematicsRigidity (psychology)Fractal setDynamical Systems (math.DS)Mathematics - Dynamical SystemsSubmanifoldMathematicsMathematische Nachrichten
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Derived length and character degrees of solvable groups

2003

We prove that the derived length of a solvable group is bounded in terms of certain invariants associated to the set of character degrees and improve some of the known bounds. We also bound the derived length of a Sylow p-subgroup of a solvable group by the number of different p-parts of the character degrees of the whole group.

Set (abstract data type)CombinatoricsCharacter (mathematics)Group (mathematics)Solvable groupApplied MathematicsGeneral MathematicsBounded functionSylow theoremsMathematicsProceedings of the American Mathematical Society
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A characterization of the line set of an odd-dimensional Baer subspace

1990

Generalizing a theorem of Beutelspacher and Seeger, we consider line sets\(\mathcal{L}\) inP=PG(2t + 1,q),t ∈ IN, with the following properties: (1) any (t + 1)-dimensional subspace ofP contains at least one line of\(\mathcal{L}\), (2) if a pointx ofP is incident with at least two lines of\(\mathcal{L}\) then the points in the factor geometryP/x which are induced by the lines of\(\mathcal{L}\) throughx form a blocking set of type (t, 1) inP/x, (3) any line of\(\mathcal{L}\) is coplanar with at least one further line of\(\mathcal{L}\). We will show that the examples of minimal cardinality are exactly the line sets of Baer subspaces ofP.

Set (abstract data type)CombinatoricsDiscrete mathematicsCardinalityBlocking setLine (geometry)Geometry and TopologyCharacterization (mathematics)Type (model theory)Linear subspaceSubspace topologyMathematicsJournal of Geometry
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Degrees of characters in the principal block

2021

Abstract Let G be a finite group. We prove that if the set of degrees of characters in the principal p-block of G has size at most 2 then G is p-solvable, and G / O p ′ ( G ) has a metabelian normal Sylow p-subgroup. The general question of proving that if an arbitrary p-block has two degrees then their defect groups are metabelian remains open.

Set (abstract data type)CombinatoricsFinite groupAlgebra and Number Theory010102 general mathematics0103 physical sciencesSylow theoremsPrincipal (computer security)Block (permutation group theory)010307 mathematical physics0101 mathematics01 natural sciencesMathematicsJournal of Algebra
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On finite products of soluble groups

1998

Let the finite groupG =AB be the product of two soluble subgroupsA andB, and letπ be a set of primes. We investigate under which conditions for the maximal normalπ-subgroups ofA, B andG the following holds:Oπ(G) ∩Oπ(G) ⊆Oπ(G).

Set (abstract data type)CombinatoricsGeneral MathematicsProduct (mathematics)ArithmeticAlgebra over a fieldMathematicsIsrael Journal of Mathematics
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Forbidden Factors and Fragment Assembly

2002

In this paper we approach the fragment assembly problem by using the notion of minimal forbidden factors introduced in previous paper. Denoting by M(w) the set of minimal forbidden factors of a word w, we first focus on the evaluation of the size of elements in M(w) and on designing of an algorithm to recover the word w from M(w). Actually we prove that for a word w randomly generated by a memoryless source with identical symbol probabilities, the maximal length m(w) of words in M(w) is logarithmic and that the reconstruction algorithm runs in linear time. These results have an interesting application to the fragment assembly problem, i.e. reconstruct a word w from a given set I of substrin…

Set (abstract data type)CombinatoricsLogarithmFragment (logic)Reconstruction algorithmFocus (optics)AlgorithmTime complexitySubstringWord (computer architecture)Mathematics
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Kontsevich–Zagier Periods

2017

We compare the set of Kontsevich–Zagier periods defined by integrals over semi-algebraic subsets of \(\mathbb {R}^n\) with cohomological periods.

Set (abstract data type)CombinatoricsMathematics::K-Theory and HomologyMathematics::Quantum AlgebraMathematics::Number TheoryImaginary numberMathematics
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On the packing sums of pairs

1993

Abstract This paper is concerned with the determination of the length of the largest interval of consecutive integers of the set hA k , where A k is a sequence of integers which is a B h -sequence.

Set (abstract data type)CombinatoricsSequenceInteger sequenceInterval (graph theory)Electrical and Electronic EngineeringSafety Risk Reliability and QualityCondensed Matter PhysicsAlgorithmAtomic and Molecular Physics and OpticsSurfaces Coatings and FilmsElectronic Optical and Magnetic MaterialsMathematicsMicroelectronics Reliability
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