Search results for "Atomic force microscopy"
showing 10 items of 208 documents
Atomic Force Microscopy Study of Yeast Cells Influenced by High Voltage Electrical Discharge
2008
Human cells are the eukaryotic ones. Simulation of wide-spectrum electromagnetic radiation influence on eukaryotic cells was performed with yeast which is usually used now in molecular biological and medical biological investigations as the ideal model of eukaryotic system. The aim of the research was to observe possible induced alterations of the cell morphology. Atomic force microscopy (AFM) and electron scanning microscopy (ESM) have been applied to image the surface of cells exposed to electromagnetic radiation.
Adhesion and Friction Forces between Spherical Micrometer-Sized Particles
1999
An experimental setup, based on the principles of atomic force microscopy (AFM), was used to measure directly the adhesion and rolling-friction forces between individual silica microspheres of radii between 0.5 and 2.5 \ensuremath{\mu}m. It showed that the linear dependence of the pull-off force on the particle radius is still valid for micron-sized particles. Rolling-friction forces between silica microspheres were measured for the first time by combining AFM methods and optical microscopy: They are $\ensuremath{\sim}100$ times lower than the corresponding adhesion forces.
Surface pattern recording in Sb2Se3 thin films
2013
Abstract Results on the modification of Sb 2 Se 3 thin film surface topology by irradiation followed by wet-etching are given. Comparison of study results revealed the possible role of purely electronic and thermal processes in the relief formation. The latter is supposed to be connected with radiation-induced defect creation, free volume increase under the increased fluidity conditions as well as with the possible additional influence of electrostatic forces and stress. Changes in surface characteristics are presented and potential applications of this treatment are discussed.
Assisted-assembly of coordination materials into advanced nanoarchitectures by Dip Pen nanolithography
2011
3 páginas, 4 figuras.
Achieving high effectiveQ-factors in ultra-high vacuum dynamic force microscopy
2010
The effective Q-factor of the cantilever is one of the most important figures-of-merit for a non-contact atomic force microscope (NC-AFM) operated in ultra-high vacuum (UHV). We provide a comprehensive discussion of all effects influencing the Q-factor and compare measured Q-factors to results from simulations based on the dimensions of the cantilevers. We introduce a methodology to investigate in detail how the effective Q-factor depends on the fixation technique of the cantilever. Fixation loss is identified as a most important contribution in addition to the hitherto discussed effects and we describe a strategy for avoiding fixation loss and obtaining high effective Q-factors in the forc…
Mechanical properties of sol–gel derived SiO2 nanotubes
2014
The mechanical properties of thick-walled SiO2 nanotubes (NTs) prepared by a sol–gel method while using Ag nanowires (NWs) as templates were measured by using different methods. In situ scanning electron microscopy (SEM) cantilever beam bending tests were carried out by using a nanomanipulator equipped with a force sensor in order to investigate plasticity and flexural response of NTs. Nanoindentation and three point bending tests of NTs were performed by atomic force microscopy (AFM) under ambient conditions. Half-suspended and three-point bending tests were processed in the framework of linear elasticity theory. Finite element method simulations were used to extract Young’s modulus values…
Structural investigation of crystallized Ge-Ga-Se chalcogenide glasses
2018
H. Klym thanks to the Ministry of Education and Science of Ukraine for support and Dr. P. Demchenko for the assistance in XRD experiments.
Molecular Scale Study of Domain Boundaries and Frictional Stick-Slip Motion on Lipid Bilayers
1995
A highly 2-dimensional (2D) anisotropic crystal formation of an organic one component lipid bilayer system is presented measured in air by atomic force microscopy. 2D domains with different crystal orientation could be observed. Their molecularly smooth domain boundaries are perceived to be either commensurable or incommensurable lattice joints. Differences in the orientation of the crystal lattice affects dynamic friction on the micrometer scale. High resolution friction images provide stick-slip motions depending on the scan direction in respect to the lattice orientation. It is shown that sliding friction can be determined by an averaged value of the molecular stick-slip motion of the fr…
Critical currents and micro-structure in YBa2Cu3O7−δ thin films
1996
In an attempt to clarify the origin of the large critical current densitiesJ c observed in Laser Ablated and Sputtered YBa2Cu3O7−δ (YBCO) thin films, we make a systematic study of the low temperatureJ c in samples carefully analysed using STM and AFM.J c (B) is determined from torque-magnetometry performed in ring-patterned thin films. Epitaxial YBCO films nucleate in c-axis oriented single-crystalline islands with sizes ranging between 200 and 700 nm. We show thatJ c can be mainly explained by vortex pinning localised in the island boundaries.
The Use of Atomic Force Microscopy in Determining the Stiffness and Adhesion Force of Human Dentin After Exposure to Bleaching Agents
2009
Introduction: Oxidant bleaching agents may induce several alterations on mineralized teeth tissues. Our aim is to study,at the ultrastructurallevel,mechanicalmodifications induced on dentin after exposure to different bleaching agents.Methods: Nanoindentation performed with atomic force microscopy was used to measure changes in dentin stiffness as well as the adhesion force between the tip and the tissue both in intertubular and peritubulardentin.Foreachspecimen,dentinlocalization, and bleaching agent, 100 independent nanoindentations were performed. Carbamide peroxide (30%) and hydrogenperoxide(35%) wereusedasbleaching agents. Results: A significant reduction of both stiffness and adhesion…