Search results for "ELECTRONICS"

Potentialities of microfibers for non linear optics

2010

Micro- and nanofibers present attractive optical properties and may be used in a variety of structures and devices. We report in this work the first global study on the non linear properties of these microfibers: an adequate source is built and its characteristics are described, our first results with a silica loop resonator are presented. Third harmonic generation is obtained in these conditions, however, the low intrinsic non linear index prevents the generation of large non linear effects. The use of highly non linear materials, such as soft glasses, is therefore discussed, with their potentialities and the challenges their integration with standard microfibers represent.

Narrow Band Solid-Liquid Composite Arrangements: Alternative Solutions for Phononic Crystal-Based Liquid Sensors

2019

Periodic elastic composite structures attract great attention. They offer the ability to design artificial properties to advance the control over the propagation of elastic/acoustic waves. In previous work, we drew attention to composite periodic structures comprising liquids. It was shown that the transmission spectrum of the structure, specifically a well-isolated peak, follows the material properties of liquid constituent in a distinct manner. This idea was realized in several liquid sensor concepts that launched the field of phononic crystal liquid sensors. In this work we introduce a novel concept&mdash

The Wide Field Imager of the International X-ray Observatory

2010

The International X-ray Observatory (IXO) will be a joint X-ray observatory mission by ESA, NASA and JAXA. It will have a large effective area (3 m 2 at 1.25 keV) grazing incidence mirror system with good angular resolution (5 arcsec at 0.1–10 keV) and will feature a comprehensive suite of scientific instruments: an X-ray Microcalorimeter Spectrometer, a High Time Resolution Spectrometer, an X-ray Polarimeter, an X-ray Grating Spectrometer, a Hard X-ray Imager and a Wide-Field Imager. The Wide Field Imager (WFI) has a field-of-view of 18 ft � 18 ft. It will be sensitive between 0.1 and 15 keV, offer the full angular resolution of the mirrors and good energy resolution. The WFI will be imple…

High-Z Materials for X-ray Detection: Material Properties and Characterization Techniques

2023

This book will provide readers with a good overview of some of most recent advances in the field of High-Z materials. There will be a good mixture of general chapters in both technology and applications in opto-electronics, X-ray detection and emerging optoelectronics applications. The book will have an in-depth review of the research topics from world-leading specialists in the field.

Electroplated Indium Bumps as Thermal and Electrical Connections of NTD-Ge Sensors for the Fabrication of Microcalorimeter Arrays

2012

We are developing a method to build arrays of Ge-based microcalorimeters for soft X-rays detection using micro-photolithographic techniques. A key element of the process is the electrical and thermal connection between the germanium sensors and the interconnection electrical tracks, that lay on a substrate acting as mechanical support and thermal sink. The geometry of the sensors, that have a square base truncated pyramid shape, makes feasible a connection through indium soldering. We describe a technique, based on microlithography and electroplating, adopted to grow indium bumps of a few tens of square microns of area and several microns high on top of the contact pads patterned on the sub…

Author response: The primary structural photoresponse of phytochrome proteins captured by a femtosecond X-ray laser

2020

Large 256-Pixel X-ray Transition-Edge Sensor Arrays With Mo/TiW/Cu Trilayers

2015

We describe the fabrication and electrical characterization of 256-pixel X-ray transition-edge sensor (TES) arrays intended for materials analysis applications. The processing is done on 6-in wafers, providing capabilities on a commercial scale. TES films were novel proximity coupled Mo/TiW/Cu trilayers, where the thin TiW layer in between aims to improve the stability of the devices by preventing unwanted effects such as Mo/Cu interdiffusion. The absorber elements were electrodeposited gold of thickness 2 μm. The single-pixel design discussed here is the so-called Corbino geometry. Most design goals were successfully met, such as the critical temperature, thermal time constant, and transit…

Microscopic defects and impurity analyses of multicrystalline silicon solar cells from different manufacturing routes

2013

It is important to fully understand the physical behavior of solar cells made by materials from alternative process routes. Solar cells from Elkem Solar Grade Silicon and standard polysilicon have been investigated with light beam induced current and electroluminescence imaging. The low efficiency regions have been further analyzed by Scanning Electron Microscopy under different imaging modes. It was found that cell regions of low performance had undergone plastic deformations resulting in the creation of crystalline defects appearing as subgrain patterns. Similar patterns were observed in both ESS™ and standard polysilicon. Energy-dispersive X-ray spectroscopy (EDS) and electron backscatte…

Time-dependent current-voltage characteristics of Al/p-CdTe/Pt x-ray detectors

2012

Current-voltage (I-V) characteristics of Schottky Al/p-CdTe/Pt detectors were investigated in dark and at different temperatures. CdTe detectors with Al rectifying contacts, very appealing for high resolution x-ray and gamma ray spectroscopy, suffer from bias-induced polarization phenomena which cause current increasing with the time and severe worsening of the spectroscopic performance. In this work, we studied the time-dependence of the I-V characteristics of the detectors, both in reverse and forward bias, taking into account the polarization effects. The I-V measurements, performed at different time intervals between the application of the bias voltage and the measurement of the current…

OPTICAL PROPERTIES OF DEFECTS IN SILICA

2000

The optical properties of point defects are frequently the most important parameter in applications of glassy silica. They are relatively easy to measure on standard spectrophotometers and yield direct information on the quality of practical silica-based devices, e.g., attenuation of fiber-optic waveguides or ultraviolet (UV)- transmitting windows. However, optical measurements alone usually do not give enough information to establish the origin and atomic structure of the respective point defects.