Search results for "Electron microscope"
showing 10 items of 784 documents
Colonization pattern of primary tomato roots by Pseudomonas fluorescens A6RI characterized by dilution plating, flow cytometry, fluorescence, confoca…
2004
Early colonization of primary tomato roots, grown in vitro, by Pseudomonas fluorescens A6RI, introduced by seed bacterization, was monitored for 7 days in three different root zones (zone A, apex+elongation+young hairy zone; zone B, hairy zone; zone C, old hairy zone+collar). Bacterial quantification was assessed by enumeration of (i) colony forming units (cfu) after dilution plating and of (ii) total bacterial cells by flow cytometry. Bacterial distribution and organization in the root zones were analyzed by fluorescence, confocal and scanning electron microscopy. For all sampling dates and zones, the densities of total bacterial cells were significantly higher than those of the cfu. The k…
Comparison of Different Processing Methods to Prepare Poly(lactid acid)–Hydrotalcite Composites
2013
The effect of the compounding method on the morphology and on the properties of poly(lactic acid) (PLA)-hydrotalcite (HT) composites was studied. Moreover, the influence of two different kinds of HT - organically modified (OM-HT) and unmodified (U-HT) - and their concentration was evaluated. The composites were prepared using either a single screw extruder (SSE), a counter rotating twin-screw compounder (TSC) or a corotating twin-screw extruder (TSE). The prepared materials were characterized by scanning electron microscopy, gel permeation chromatography (GPC) analysis, mechanical and rheological measurements. The results indicated that the best morphology, i.e., particles dimension and dis…
A Scanning Electron Microscope for Ultracold Atoms
2006
We propose a new technique for the detection of single atoms in ultracold quantum gases. The technique is based on scanning electron microscopy and employs the electron impact ionization of trapped atoms with a focussed electron probe. Subsequent detection of the resulting ions allows for the reconstruction of the atoms position. This technique is expected to achieve a much better spatial resolution compared to any optical detection method. In combination with the sensitivity to single atoms, it makes new in situ measurements of atomic correlations possible. The detection principle is also well suited for the addressing of individual sites in optical lattices.
High-resolution scanning electron microscopy of an ultracold quantum gas
2008
Our knowledge of ultracold quantum gases is strongly influenced by our ability to probe these objects. In situ imaging combined with single-atom sensitivity is an especially appealing scenario, as it can provide direct information on the structure and the correlations of such systems. For a precise characterization a high spatial resolution is mandatory. In particular, the perspective to study quantum gases in optical lattices makes a resolution well below one micrometre highly desirable. Here, we report on a novel microscopy technique, which is based on scanning electron microscopy and allows for the detection of single atoms inside a quantum gas with a spatial resolution of better than 15…
Compact, cost-effective and field-portable microscope prototype based on MISHELF microscopy
2016
AbstractWe report on a reduced cost, portable and compact prototype design of lensless holographic microscope with an illumination/detection scheme based on wavelength multiplexing, working with single hologram acquisition and using a fast convergence algorithm for image processing. All together, MISHELF (initials coming from Multi-Illumination Single-Holographic-Exposure Lensless Fresnel) microscopy allows the recording of three Fresnel domain diffraction patterns in a single camera snap-shot incoming from illuminating the sample with three coherent lights at once. Previous implementations have proposed an illumination/detection procedure based on a tuned (illumination wavelengths centered…
Peculiarities of imaging one- and two-dimensional structures in an emission electron microscope. 1. theory
2000
Local changes in work function cause deviations of the electrical microfield near a sample surface as a result of the uniform accelerating field distribution between the sample (cathode) and the extractor electrode (anode). This results in a change in the electron trajectories. As a consequence, the microscope image shows remarkable changes in position, size, intensity and lateral resolution of distinct details, which can be quantitatively described by the calculations presented here. Analysing these effects in the image gives an opportunity to determine the real lateral size of the observed structures and the distribution of local contact potentials.
Probing of nanocontacts inside a transmission electron microscope
2007
In the past twenty years, powerful tools such as atomic force microscopy have made it possible to accurately investigate the phenomena of friction and wear, down to the nanometer scale. Readers of this book will become familiar with the concepts and techniques of nanotribology, explained by an international team of scientists and engineers, actively involved and with long experience in this field. Edited by two pioneers in the field, 'Fundamentals of Frictions and Wear at the Nanoscale' is suitable both as first introduction to this fascinating subject, and also as a reference for researchers wishing to improve their knowledge of nanotribology and to keep up with the latest results in this …
Spatially-multiplexed interferometric microscopy (SMIM): converting a standard microscope into a holographic one
2014
We report on an extremely simple, low cost and highly stable way to convert a standard microscope into a holographic one. The proposed architecture is based on a common-path interferometric layout where the input plane is spatially-multiplexed to allow reference beam transmission in a common light-path with the imaging branch. As consequence, the field of view provided by the layout is reduced. The use of coherent illumination (instead of the broadband one included in the microscope) and a properly placed one-dimensional diffraction grating (needed for the holographic recording) complete the experimental layout. The proposed update is experimentally validated in a regular Olympus BX-60 upri…
Dopant Contrast in Semiconductors as Interpretation Challenge at Imaging by Electrons
2007
Mechanisms responsible for the contrast between differently doped areas in semiconductors, which is observed in electron micrographs, is discussed as regards the key factors determining the sign and magnitude of the contrast. Experimental data obtained by means of the scanning electron microscope (SEM), scanning low energy electron microscope and photoelectron emission microscope are reviewed together with hints following from them for compilation of a model of the contrast mechanism.