Search results for "FLE"
showing 10 items of 3517 documents
Oblique incidence and polarization effects in coupled gratings.
2012
Oblique incidence and polarization orientation of the input beam have dramatic effects on the spectral response of coupled dielectric waveguide gratings. Coupled gratings with small periodic perturbations can be described as a problem of two coupled resonances at strictly normal incidence, but we find that the device involves four coupled resonances when oblique incidence and polarization effects are included in the analysis. Very small deviations from normal incidence change qualitatively the spectral response and four peaks are observed, whereas only two peaks are present at normal incidence. Polarization misalignments produce a decrease of the reflectance of the resonances at normal inci…
Cooperative atomic motion probed by ultrafast transmission electron diffraction
2015
In numerous solids exhibiting broken symmetry ground states, changes in electronic (spin) structure are accompanied by structural changes. Femtosecond time-resolved techniques recently contributed many important insights into the origin of their ground states by tracking dynamics of the electronic subsystem with femtosecond light pulses. Moreover, several studies of structural dynamics in systems with periodic lattice modulation (PLD) were performed. Since intensities of the super-lattice diffraction peaks are in the first approximation proportional to the square of the PLD amplitude, their temporal dynamics provides access to cooperative atomic motion. This process takes place on a fractio…
Phonon-induced optical superlattice
2005
We demonstrate the formation of a dynamic optical superlattice through the modulation of a semiconductor microcavity by stimulated acoustic phonons. The high coherent phonon population produces a folded optical dispersion relation with well-defined energy gaps and renormalized energy levels, which are accessed using reflection and diffraction experiments.
Imaging spin filter for electrons based on specular reflection from iridium (001)
2013
Abstract As Stern–Gerlach type spin filters do not work with electrons, spin analysis of electron beams is accomplished by spin-dependent scattering processes based on spin–orbit or exchange interaction. Existing polarimeters are single-channel devices characterized by an inherently low figure of merit (FoM) of typically 10 −4 –10 −3 . This single-channel approach is not compatible with parallel imaging microscopes and also not with modern electron spectrometers that acquire a certain energy and angular interval simultaneously. We present a novel type of polarimeter that can transport a full image by making use of k -parallel conservation in low-energy electron diffraction. We studied specul…
Excitation of a one-dimensional evanescent wave by conical edge diffraction of surface plasmon
2011
International audience; The experimental observation of a one-dimensional evanescent wave supported by a 90◦ metal edge is reported. Through a measurement of in-plane momenta, we clearly demonstrate the dimensional character of this surface wave and show that it is non-radiative in the superstrate. Excitation conditions, lateral extension and polarization properties of this wave are discussed. Finally, we explore the effect of the surrounding dielectric medium and demonstrate that a single edge can sustain distinct excitations.
The role of electron diffraction in zeolite structure determination
2006
Because electron diffraction can sample individual microcrystals, it is clear that this single crystal method can facilitate, in at least two ways, structure determination for inorganic materials, such as zeolites, that are preferentially microcrystalline. First, in a qualitative application, three-dimensional tilts of individual small crystals, to map the reciprocal lattice, greatly facilitates unit cell and space group determination when powder diffraction indexing programs fail. If incoherent multiple scattering leads to violation of systematic absences, these absences can be restored by collection of precession diffraction patterns based on the Vincent-Midgley method [1], as demonstrate…
Automated electron diffraction tomography - a new tool for nano crystal structure analysis
2011
Automated electron Diffraction Tomography (ADT) comprises an upcoming method for “ab intio” structure analysis of nano crystals. ADT allows fine sampling of the reciprocal space by sequential collection of electron diffraction patterns while tilting a nano crystal in fixed tilt steps around an arbitrary axis. Electron diffraction is collected in nano diffraction mode (NED) with a semi-parallel beam with a diameter down to 50 nm. For crystal tracking micro-probe STEM imaging is used. Full automation of the acquisition procedure allowed optimisation of the electron dose distribution and therefore analysis of highly beam sensitive samples. Cell parameters, space group and reflection intensitie…
Elucidating structural order and disorder phenomena in mullite-type Al4B2O9 by automated electron diffraction tomography
2017
The crystal structure and disorder phenomena of Al4B2O9, an aluminum borate from the mullite-type family, were studied using automated diffraction tomography (ADT), a recently established method for collection and analysis of electron diffraction data. Al4B2O9, prepared by sol-gel approach, crystallizes in the monoclinic space group C2/m. The ab initio structure determination based on three-dimensional electron diffraction data from single ordered crystals reveals that edge-connected AlO6 octahedra expanding along the b axis constitute the backbone. The ordered structure (A) was confirmed by TEM and HAADF-STEM images. Furthermore, disordered crystals with diffuse scattering along the b axis…
Towards automated diffraction tomography: Part I—Data acquisition
2007
Abstract The ultimate aim of electron diffraction data collection for structure analysis is to sample the reciprocal space as accurately as possible to obtain a high-quality data set for crystal structure determination. Besides a more precise lattice parameter determination, fine sampling is expected to deliver superior data on reflection intensities, which is crucial for subsequent structure analysis. Traditionally, three-dimensional (3D) diffraction data are collected by manually tilting a crystal around a selected crystallographic axis and recording a set of diffraction patterns (a tilt series) at various crystallographic zones. In a second step, diffraction data from these zones are com…
Ab Initio Structure Determination of Vaterite by Automated Electron Diffraction
2012
tion that is fundamental for understanding material properties. Still, a number of compounds have eluded such kinds of analysis because they are nanocrystalline, highly disordered, with strong pseudosymmetries or available only in small amounts in polyphasic or polymorphic systems. These materials are crystallographically intractable with conventional Xray or synchrotron radiation diffraction techniques. Single nanoparticles can be visualized by high-resolution transmission electron microscopy (HR-TEM) up to sub�ngstrom resolution, [2] but obtaining 3D information is still a difficult task, especially for highly beam-sensitive materials and crystal structures with long cell parameters. Elec…