Search results for "FORCE MICROSCOPY"

showing 10 items of 247 documents

Synthesis and characterisation of ordered arrays of mesoporous carbon nanofibres

2009

A facile and reproducible one-step pathway has been developed for preparing ordered arrays of mesoporous carbon nanostructures within the pores of anodized aluminium oxide (AAO) membranes, through the confined self-assembly of phenol/formaldehyde resol and amphiphilic copolymer templates. The morphology of the mesoporous carbon nanostructures can be controlled by varying the copolymer surfactant, the quantity of the resol–surfactant precursor sol used and the amount of phenol–formaldehyde resol introduced into the resol–surfactant sol. One-dimensional (1-D) carbon nanostructures, such as carbon fibres with a core–shell structure and carbon ribbons with circular mesopores running parallel to…

Materials scienceAnodic oxidationPolymersCarbon nanofiberNanotechnologyGeneral ChemistryConductive atomic force microscopySurface active agentsPhenolic resinsNanostructuresTemplate reactionMembraneCarbon nanofibersPhenolsCopolymerizationSolsNanofiberCarbon fibersMaterials ChemistryCopolymerCarbide-derived carbonMesoporous materialJournal of Materials Chemistry
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Conductive films of ordered nanowire arrays

2004

peer-reviewed High-density, ordered arrays of germanium nanowires have been synthesised within the pores of mesoporous thin films (MTFs) and anodized aluminium oxide (AAO) matrices using a supercritical fluid solution-phase inclusion technique. Conductive atomic force microscopy (C-AFM) was utilised to study the electrical properties of the nanowires within these arrays. Nearly all of the semiconductor nanowires contained within the AAO substrates were found to be conducting. Additionally, each individual nanowire within the substrate possessed similar electrical properties demonstrating that the nanowires are continuous and reproducible within each pore. C-AFM was also able to probe the co…

Materials scienceAnodizingbusiness.industryNanowirechemistry.chemical_elementNanotechnologyGermaniumGeneral ChemistryConductive atomic force microscopySubstrate (electronics)MTFsgermaniumSemiconductorchemistrynanowiresMaterials ChemistryThin filmMesoporous materialbusiness
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Atomic-force microscopy imaging of plasma membranes purified from spinach leaves

2000

Summary: Plasma membranes purified from spinach leaves by aqueous two-phase partitioning were examined by atomic-force microscopy (AFM) in phosphate buffer, and details on their structure were reported at nanometric scale. Examination of the fresh membrane preparation deposited on mica revealed a complex organization of the surface. It appeared composed of a first layer of material, about 8 nm in thickness, that practically covered all the mica surface and on which stand structures highly heterogeneous in shape and size. High-resolution imaging showed that the surface of the first layer appeared relatively smooth in some regions, whereas different characteristic features were observed in ot…

Materials scienceAqueous solutionbiologyProteolytic enzymesAtomic-force microscopyCell BiologyPlant ScienceGeneral MedicineSurface finishSpinachbiology.organism_classificationLeaf cellsPlasmalemmaMembraneddc:580Chemical engineeringBiochemistryPhase partitionMicroscopySpinachMicaLayer (electronics)
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Atomic Force Microscopy Study of Yeast Cells Influenced by High Voltage Electrical Discharge

2008

Human cells are the eukaryotic ones. Simulation of wide-spectrum electromagnetic radiation influence on eukaryotic cells was performed with yeast which is usually used now in molecular biological and medical biological investigations as the ideal model of eukaryotic system. The aim of the research was to observe possible induced alterations of the cell morphology. Atomic force microscopy (AFM) and electron scanning microscopy (ESM) have been applied to image the surface of cells exposed to electromagnetic radiation.

Materials scienceAtomic force microscopyElectron scanning microscopyHigh voltageNanotechnologyElectric dischargeCell morphologyElectromagnetic radiationYeast
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Adhesion and Friction Forces between Spherical Micrometer-Sized Particles

1999

An experimental setup, based on the principles of atomic force microscopy (AFM), was used to measure directly the adhesion and rolling-friction forces between individual silica microspheres of radii between 0.5 and 2.5 \ensuremath{\mu}m. It showed that the linear dependence of the pull-off force on the particle radius is still valid for micron-sized particles. Rolling-friction forces between silica microspheres were measured for the first time by combining AFM methods and optical microscopy: They are $\ensuremath{\sim}100$ times lower than the corresponding adhesion forces.

Materials scienceAtomic force microscopyMeasure (physics)Physics::OpticsGeneral Physics and AstronomyAdhesionMicrospherelaw.inventionMicrometreParticle radiusOptical microscopelawbiological sciencesComposite materialPhysical Review Letters
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Surface pattern recording in Sb2Se3 thin films

2013

Abstract Results on the modification of Sb 2 Se 3 thin film surface topology by irradiation followed by wet-etching are given. Comparison of study results revealed the possible role of purely electronic and thermal processes in the relief formation. The latter is supposed to be connected with radiation-induced defect creation, free volume increase under the increased fluidity conditions as well as with the possible additional influence of electrostatic forces and stress. Changes in surface characteristics are presented and potential applications of this treatment are discussed.

Materials scienceAtomic force microscopybusiness.industryCondensed Matter PhysicsElectronic Optical and Magnetic MaterialsSurface patternElectron beam irradiationStress (mechanics)OpticsVolume (thermodynamics)ThermalMaterials ChemistryCeramics and CompositesIrradiationThin filmComposite materialbusinessJournal of Non-Crystalline Solids
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Assisted-assembly of coordination materials into advanced nanoarchitectures by Dip Pen nanolithography

2011

3 páginas, 4 figuras.

Materials scienceAtomic force microscopytechnology industry and agricultureMetals and AlloysNanotechnologyGeneral Chemistryequipment and suppliescomplex mixturesCatalysisSurfaces Coatings and FilmsElectronic Optical and Magnetic MaterialsDip-pen nanolithographyMaterials ChemistryCeramics and CompositesChemical Communications
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Visible photothermal deflection spectroscopy using microcantilevers

2012

International audience; Photothermal deflection spectroscopy based on bi-material cantilevers combines the sensitivity of miniature sensors and the selectivity of optical spectroscopy. In this paper, we report on the photothermal response of the microcantilevers functionalized with nanometer thin organic films in the visible region. Unlike responses in the infrared regime, in the optical region, light absorption by all the cantilever constituents must be considered for extraction of the physical parameters of the organic layer. A model of photothermal deflection for the optical region has been developed for two absorbing layers consisting of a thick metal (>200 nm) and a thin organic film. …

Materials scienceCantileverADSORPTIONInfrared02 engineering and technologyDEVICE01 natural sciencesRhodamine 6Gchemistry.chemical_compoundUltraviolet visible spectroscopyOptics0103 physical sciencesMaterials ChemistrySENSORSElectrical and Electronic EngineeringThin filmSpectroscopyInstrumentation010302 applied physicsThin layersbusiness.industryFORCE MICROSCOPYMetals and AlloysPhotothermal therapyPERFORMANCE021001 nanoscience & nanotechnologyCondensed Matter PhysicsSurfaces Coatings and FilmsElectronic Optical and Magnetic MaterialsCANTILEVERchemistryENHANCED RAMAN-SPECTROSCOPY0210 nano-technologybusinessRHODAMINE 6G
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Achieving high effectiveQ-factors in ultra-high vacuum dynamic force microscopy

2010

The effective Q-factor of the cantilever is one of the most important figures-of-merit for a non-contact atomic force microscope (NC-AFM) operated in ultra-high vacuum (UHV). We provide a comprehensive discussion of all effects influencing the Q-factor and compare measured Q-factors to results from simulations based on the dimensions of the cantilevers. We introduce a methodology to investigate in detail how the effective Q-factor depends on the fixation technique of the cantilever. Fixation loss is identified as a most important contribution in addition to the hitherto discussed effects and we describe a strategy for avoiding fixation loss and obtaining high effective Q-factors in the forc…

Materials scienceCantileverMicroscopebusiness.industryApplied MathematicsUltra-high vacuumQ-factorNanotechnology530NC-AFMlaw.inventionforce microscopyFixation (surgical)lawQ factormounting lossMicroscopyForce dynamicsOptoelectronicscantileverbusinessInstrumentationEngineering (miscellaneous)Non-contact atomic force microscopyMeasurement Science and Technology
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Mechanical properties of sol–gel derived SiO2 nanotubes

2014

The mechanical properties of thick-walled SiO2 nanotubes (NTs) prepared by a sol–gel method while using Ag nanowires (NWs) as templates were measured by using different methods. In situ scanning electron microscopy (SEM) cantilever beam bending tests were carried out by using a nanomanipulator equipped with a force sensor in order to investigate plasticity and flexural response of NTs. Nanoindentation and three point bending tests of NTs were performed by atomic force microscopy (AFM) under ambient conditions. Half-suspended and three-point bending tests were processed in the framework of linear elasticity theory. Finite element method simulations were used to extract Young’s modulus values…

Materials scienceCantileverScanning electron microscopeThree point flexural testNanowiresilica nanotubesGeneral Physics and AstronomyNanotechnologyBendinglcsh:Chemical technologylcsh:TechnologyFull Research PaperFlexural strengthNanotechnologyatomic force microscopy (AFM)lcsh:TP1-1185General Materials ScienceElectrical and Electronic EngineeringComposite materiallcsh:Sciencelcsh:TLinear elasticityNanoindentationlcsh:QC1-999nanomechanical testsNanosciencelcsh:Qscanning electron microscopy (SEM)lcsh:PhysicsBeilstein Journal of Nanotechnology
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