Search results for "Hardware_PERFORMANCEANDRELIABILITY"
showing 10 items of 91 documents
Continuous Monitoring of Parasitic Elements in Boost Converter Circuit
2021
The given paper explains the necessity of condition monitoring for DC/DC boost converter circuit. Further, an analytical model of circuit parasitic estimation is presented based on measured quantities in the circuit. The implementation of continuous estimation of circuit parasitic elements is analytically explained and verified by simulations and experimental results. Obtained results are acceptable for condition monitoring.
Improving topological mapping on NoCs
2010
Networks-on-Chip (NoCs) have been proposed as an efficient solution to the complex communications on System-on-chip (SoCs). The design flow of network-on-chip (NoCs) include several key issues, and one of them is the decision of where cores have to be topologically mapped. This thesis proposes a new approach to the topological mapping strategy for NoCs. Concretely, we propose a new topological mapping technique for regular and irregular NoC platforms and its application for optimizing application specific NoC based on distributed and source routing.
Fault Injection into VHDL Models: Experimental Validation of a Fault-Tolerant Microcomputer System
1999
This work presents a campaign of fault injection to validate the dependability of a fault tolerant microcomputer system. The system is duplex with cold stand-by sparing, parity detection and a watchdog timer. The faults have been injected on a chip-level VHDL model, using an injection tool designed with this purpose. We have carried out a set of injection experiments (with 3000 injections each), injecting transient and permanent faults of types stuck-at, open-line and indetermination on both the signals and variables of the system, running a workload. We have analysed the pathology of the propagated errors, measured their latency, and calculated both detection and recovery coverage. We have…
A Methodology for the Analysis of Memory Response to Radiation through Bitmap Superposition and Slicing
2015
A methodology is proposed for the statistical analysis of memory radiation test data, with the aim of identifying trends in the single-even upset (SEU) distribution. The treated case study is a 65nm SRAM irradiated with neutrons, protons and heavy-ions.
Critical analysis of conventional thermoeconomic approaches to the diagnosis of multiple faults in air conditioning units: Capabilities, drawbacks an…
2013
Abstract Faults diagnosis in air conditioning systems is a crucial activity, since malfunctions may induce heavy degradation of performance. Among the available techniques, thermoeconomic diagnosis has played a marginal role due to the difficulties encountered when applying the methodology to refrigeration plants. In this paper a critical analysis on capabilities and limits of thermoeconomic diagnosis is proposed. The reference plant is a 120 kWc air-cooled air conditioning system; a simulator is used to evaluate thermodynamic data under normal and faulty conditions, setting up “virtual experiments” to simulate each fault. Five malfunctions are imposed, either individually or simultaneously…
Numerical Simulation of Thermal Effects in Coupled Optoelectronic Device-circuit Systems
2008
The control of thermal effects becomes more and more important in modern semiconductor circuits like in the simplified CMOS transceiver representation described by U. Feldmann in the above article Numerical simulation of multiscale models for radio frequency circuits in the time domain. The standard approach for modeling integrated circuits is to replace the semiconductor devices by equivalent circuits consisting of basic elements and resulting in so-called compact models. Parasitic thermal effects, however, require a very large number of basic elements and a careful adjustment of the resulting large number of parameters in order to achieve the needed accuracy.
Electromagnetic Full-Wave Simulation of Partial Discharge Detection in High Voltage AC Cables
2019
Partial discharge (PD) activity in the insulation system of an electrical equipment can determine the failure of the whole apparatus. PD sensors are widely used in high-voltage electrical systems as the main elements of a detecting system oriented to real time monitoring. Recently, non-invasive sensors have been proposed in industrial applications for cable and other sensitive electrical parts: they are based both on capacitive and on the electromagnetic radiating coupling. In order to assess the real performance of a new sensor produced by a high voltage AC cables manufacturer, the paper proposes electromagnetic fullwave simulation results.
Excel Table with differentially expressed genes parasite success and attack from Ant behaviour and brain gene expression of defending hosts depend on…
2019
Parasite success and attack no Attack
CNN based Gearbox Fault Diagnosis and Interpretation of Learning Features
2021
Machine learning based fault diagnosis schemes have been intensively proposed to deal with faults diagnosis of rotating machineries such as gearboxes, bearings, and electric motors. However, most of the machine learning algorithms used in fault diagnosis are pattern recognition tools, which can classify given data into two or more classes. The underlined physical phenomena in fault diagnosis are not directly interpretable in machine learning schemes, thus it is usually called black/gray box models. In this study, convolutional neural networks (CNN) machine learning algorithm is proposed to classify gearbox faults, and the learning features of the CNN filters are visualized to understand the…
A Low-Power Fully-Mosfet Voltage Reference Generator for 90 nm CMOS Technology
2006
An integrated voltage reference generator, designed for being incorporated in standard 90-nm CMOS technology flash memories, is described in this paper. A fully MOSFET based approach, using also subthreshold operated devices, has been adopted in order to achieve low-voltage and low-power requirements and to overcome the difficulties of conventional band-gap reference circuits. The proposed circuit, based on current signals, internally generates two currents with opposite dependence on temperature. The two currents are added, thus canceling almost completely temperature dependence, and then linearly converted into the output voltage. For a temperature variation between -20degC and 90degC, th…