Search results for "Instrumentation"
showing 10 items of 4914 documents
Gas sensing properties of Zn-doped p-type nickel ferrite
2012
Abstract The influence of zinc ion to the NiFe2O4 p-type semiconductor gas response characteristics is demonstrated. For characterization of gas sensor material, synthesized by sol–gel auto combustion method, X-ray diffraction (XRD), scanning electron microscopy (SEM), DC resistance and impedance spectroscopy (IS) measurements were employed. The response change of Zn doped nickel ferrite is related to the interruption of hole hopping between nickel ions. This was improved by change of conductivity type with temperature and gas exposure.
Towards automated diffraction tomography. Part II--Cell parameter determination.
2008
Automated diffraction tomography (ADT) allows the collection of three-dimensional (3d) diffraction data sets from crystals down to a size of only few nanometres. Imaging is done in STEM mode, and diffraction data are collected with quasi-parallel beam nanoelectron diffraction (NED). Here, we present a set of developed processing steps necessary for automatic unit-cell parameter determination from the collected 3d diffraction data. Cell parameter determination is done via extraction of peak positions from a recorded data set (called the data reduction path) followed by subsequent cluster analysis of difference vectors. The procedure of lattice parameter determination is presented in detail f…
The use of simulation methods to obtain the structure and conformation of 10-cyano-9,9′-bianthryl by electron diffraction and high-resolution imaging
1995
Abstract Experimental electron diffraction patterns and high-resolution images were used to determine the space group and unit cell dimensions of 10-cyano-9,9′-bianthryl. Subsequently the molecular conformation was calculated by semi-empirical quantum-mechanical methods. The molecule was then placed with the appropriate symmetry into the unit cell and the conformational as well as the packing energy deduced by an iterative procedure until good agreement was obtained between experiment and theory.
Simultaneous IR and time-resolved X-ray diffraction measurements for studying self-sustained reactions.
1998
Self-propagating high-temperature synthesis provides an attractive practical method for producing advanced materials such as ceramics, composites and intermetallics. This kind of reaction has been investigated in situ using time-resolved X-ray diffraction, with an X-ray synchrotron beam (D43 beamline, LURE, Orsay) coupled to simultaneous IR thermography to study structural transformations and thermal evolution. With short acquisition times (30 ms per pattern) it has been possible to observe several steps before obtaining compounds. Two different compound formations have been described: (i) the different steps of reaction, aluminium melting, subsequent temperature increase and fast reaction …
Time-resolved X-ray powder diffraction on a three-way catalyst at the GILDA beamline
2003
Time-resolved X-ray diffraction experiments carried out at the beamline BM08-GILDA of ESRF allowed a study of the structural modifications taking place in a Pt/ceria-zirconia catalyst while the CO oxidation reaction was in progress. The capillary tube in which the sample is stored acts effectively as a chemical microreactor that ensures homogeneity of the sample treatments and minimization of diffusion effects. During the flowing of the reactant CO/He mixture, the investigated catalyst undergoes a fast Ce(IV)-Ce(III) partial reduction that involves the release of one O atom for every two reduced Ce cations. Because Ce(III) has a larger ionic radius than Ce(IV), the structural modification p…
Effect of gamma radiation on thermostimulated exoelectron emission from Gd2O3 films
2020
Abstract The effect of gamma irradiation on Gd2O3 films was studied using the thermostimulated exoelectron emission (TSEE) technique. The films were deposited on a glass and Si/SiO2 substrates using an extraction-pyrolytic method. Crystalline structure, chemical composition, film thickness and surface morphology were characterized by means of X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM) and atomic force microscopy (AFM). The films were irradiated by 10 MeV gamma photons and TSEE was measured from the irradiated films. It was found that gamma irradiation decreases TSEE intensity and the area below TSEE spectral curves. A linear correlati…
Imaging spin filter for electrons based on specular reflection from iridium (001)
2013
Abstract As Stern–Gerlach type spin filters do not work with electrons, spin analysis of electron beams is accomplished by spin-dependent scattering processes based on spin–orbit or exchange interaction. Existing polarimeters are single-channel devices characterized by an inherently low figure of merit (FoM) of typically 10 −4 –10 −3 . This single-channel approach is not compatible with parallel imaging microscopes and also not with modern electron spectrometers that acquire a certain energy and angular interval simultaneously. We present a novel type of polarimeter that can transport a full image by making use of k -parallel conservation in low-energy electron diffraction. We studied specul…
Focal shift in optical waves with off-axis focus
2003
We present a formulation for a suitable description of the focal shift in optical waves that have an off-axis focus. This shift that is primarily produced along the chief axis is given in terms of the focal distance and depends only on a parameter that is named as the generalized Fresnel number. Any non-uniform, either truncated and non-apertured optical beam with off-axis focus may be considered.
Single-zone-plate achromatic fresnel-transform setup: Pattern tunability
1997
Abstract White-light point-source illumination results in the chromatic blurring of the optical field diffracted by an aperture. In this paper, broadband dispersion compensation for a continuous set of Fresnel diffraction patterns associated with an arbitrary input transparency is carried out, in a sequential way, by means of a single on-axis blazed zone plate. The input is illuminated with a white-light converging spherical wavefront and the diffractive lens is inserted at the virtual source plane. We recognize that the position of the input along the optical axis permits to achieve a different achromatic Fresnel diffraction pattern with low residual chromatic aberrations. The theory deriv…
Totally incoherent optical processing operations with achromatic diffraction-based setups
2000
We report on a novel family of totally incoherent, chromatic-dispersion compensated hybrid (refractive-diffractive) lens setups for implementing, in the Fraunhofer or in the Fresnel diffraction region, different achromatic diffraction-based processing operations.