Search results for "Microelectronics"

showing 10 items of 234 documents

Dispositif microtechnique à capteur d'image.

2011

L'invention vise un dispositif microtechnique. Le dispositif microtechnique comprend une micro-pince comprenant un support, avec un actionneur est un équipage mobile montés sur ledit support, ainsi qu'un capteur d'image, l'équipage mobile comprenant une embase avec une tête, l'embase étant déplaçable en translation par rapport au support et latdite têt étant déplaçable en rotation par rapport à l'embase, et dans lequel ledit capteur d'image est disposé sur ladite tête de l'équipage mobile en regard dudit actionneur.

[SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics[ SPI.NANO ] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
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A CMOS Image Sensor Design for Speed Determination of Fast Moving Luminous Objects

2003

International audience

[SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics[ SPI.NANO ] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsComputingMilieux_MISCELLANEOUS
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Acoustic Topological Circuitry in Square and Rectangular Phononic Crystals

2021

International audience; We systematically engineer a series of square and rectangular phononic crystals to create experimental realizations of complex topological phononic circuits. The exotic topological transport observed is wholly reliant upon the underlying structure which must belong to either a square or rectangular lattice system and not to any hexagonal-based structure. The phononic system chosen consists of a periodic array of square steel bars which partitions acoustic waves in water over a broadband range of frequencies (∼0.5MHz). An ultrasonic transducer launches an acoustic pulse which propagates along a domain wall, before encountering a nodal point, from which the acoustic si…

[SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics[PHYS.MPHY]Physics [physics]/Mathematical Physics [math-ph]Crystal systemFOS: Physical sciencesGeneral Physics and Astronomy02 engineering and technology[SPI.MAT] Engineering Sciences [physics]/MaterialsTopology01 natural sciencesSignal09 EngineeringSquare (algebra)Physics AppliedWAVE-GUIDE[SPI.MAT]Engineering Sciences [physics]/MaterialsDESIGNcond-mat.mes-hallMesoscale and Nanoscale Physics (cond-mat.mes-hall)0103 physical sciences[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics010306 general physicsElectronic circuit[SPI.ACOU]Engineering Sciences [physics]/Acoustics [physics.class-ph]Physics[SPI.ACOU] Engineering Sciences [physics]/Acoustics [physics.class-ph]BENDS[PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics]Science & Technology02 Physical SciencesCondensed Matter - Mesoscale and Nanoscale PhysicsPhysicsAcoustic waveEDGE STATES021001 nanoscience & nanotechnology[PHYS.MECA.ACOU]Physics [physics]/Mechanics [physics]/Acoustics [physics.class-ph]Pulse (physics)Cardinal pointSPINPhysical Sciences2-DIMENSIONAL PHOTONIC CRYSTALHIGH TRANSMISSIONUltrasonic sensor0210 nano-technologyPhysical Review Applied
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Surface plasmon interference excited by tightly focused laser beams

2007

International audience; We show that interfering surface plasmon polaritons can be excited with a focused laser beam at normal incidence to a plane metal film. No protrusions or holes are needed in this excitation scheme. Depending on the axial position of the focus, the intensity distribution on the metal surface is either dominated by interferences between counterpropagating plasmons or by a two-lobe pattern characteristic of localized surface plasmon excitation. Our experiments can be accurately explained by use of the angular spectrum representation and provide a simple means for locally exciting standing surface plasmon polaritons.

[SPI.OPTI] Engineering Sciences [physics]/Optics / Photonic[SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsNanophotonicsPhysics::Optics02 engineering and technology01 natural scienceslaw.invention010309 opticsOpticslaw[ PHYS.COND.CM-MSQHE ] Physics [physics]/Condensed Matter [cond-mat]/Mesoscopic Systems and Quantum Hall Effect [cond-mat.mes-hall]0103 physical sciencesSurface plasmon resonance[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsPlasmon[PHYS.COND.CM-MSQHE]Physics [physics]/Condensed Matter [cond-mat]/Mesoscopic Systems and Quantum Hall Effect [cond-mat.mes-hall]Physicsbusiness.industrySurface plasmon021001 nanoscience & nanotechnologyLaserSurface plasmon polaritonAtomic and Molecular Physics and Optics[PHYS.COND.CM-MSQHE] Physics [physics]/Condensed Matter [cond-mat]/Mesoscopic Systems and Quantum Hall Effect [cond-mat.mes-hall]Angular spectrum method[SPI.OPTI]Engineering Sciences [physics]/Optics / Photonic[ SPI.NANO ] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics[ SPI.OPTI ] Engineering Sciences [physics]/Optics / Photonic0210 nano-technologybusinessLocalized surface plasmon
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Cavity Resonator Integrated Guided mode resonance Filter : Spectral & Modal Reflector

2015

International audience; CRIGF is a new generation of narrowband filter. It consists of subwavelength gratings nearby or upon a waveguide. At the center, a small GMRF (Guided Mode Resonance Filter) or GC (Grating Coupler) coupled radiated & guided mode, then, DBR (Distributed Bragg Reflector) at each side localise mode inside a horizontal Fabry-Pérot cavity. Two PS (Phase sections) are use to fine tune the Fabry-Pérot modes with the grating coupler.

[SPI.OPTI] Engineering Sciences [physics]/Optics / Photonic[SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics[SPI.OPTI]Engineering Sciences [physics]/Optics / PhotonicPhysics::OpticsGRIGF[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
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P-Type Doping of 4H-SiC for Integrated Bipolar and Unipolar Devices

2015

International audience; P-type 4H-SiC layers formed by ion implantation need high temperature processes, which generate surface roughness, losing and incomplete activation of dopants. Due to dopant redistribution and channeling effect, it is difficult to predict the depth of the formed junctions. Vapor-Liquid-Solid (VLS) selective epitaxy is an alternative method to obtain locally highly doped p-type layers in the 1020 cm-3 range or more. The depth of this p-type layers or regions is accurately controlled by the initial Reactive-Ion-Etching (RIE) of the SiC. Lateral Junction Field Effect Transistor (JFET) devices are fabricated by integrating p-type layers created by Al ion implantation or …

[SPI.OTHER]Engineering Sciences [physics]/OtherJFETVLS epitaxial growthRIE[ SPI.OTHER ] Engineering Sciences [physics]/Other[SPI.OTHER] Engineering Sciences [physics]/Other[SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronicsion implantation[ SPI.NANO ] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
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Hf02 based RRAM: from materials engineering to integrated modules

2015

10 mars 2015; International audience; no abstract

[SPI]Engineering Sciences [physics][SPI.OPTI] Engineering Sciences [physics]/Optics / Photonic[SPI] Engineering Sciences [physics][SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics[ SPI.MAT ] Engineering Sciences [physics]/Materials[ SPI ] Engineering Sciences [physics][SPI.OPTI]Engineering Sciences [physics]/Optics / Photonic[ SPI.NANO ] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics[ SPI.OPTI ] Engineering Sciences [physics]/Optics / Photonic[SPI.MAT] Engineering Sciences [physics]/Materials[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics[SPI.MAT]Engineering Sciences [physics]/Materials
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Absorption enhancement in monocrystalline Si thin films using pseudodisordered structures

2015

21-25 june 2015; International audience; no abstract

[SPI]Engineering Sciences [physics][SPI.OPTI] Engineering Sciences [physics]/Optics / Photonic[SPI] Engineering Sciences [physics][SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics[ SPI.MAT ] Engineering Sciences [physics]/Materials[ SPI ] Engineering Sciences [physics][SPI.OPTI]Engineering Sciences [physics]/Optics / Photonic[ SPI.NANO ] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics[ SPI.OPTI ] Engineering Sciences [physics]/Optics / Photonic[SPI.MAT] Engineering Sciences [physics]/Materials[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics[SPI.MAT]Engineering Sciences [physics]/Materials
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When nanophotonics meet thin crystalline-silicon photovoltaics

2015

11-18 sept. 2015; International audience; no abstract

[SPI]Engineering Sciences [physics][SPI.OPTI] Engineering Sciences [physics]/Optics / Photonic[SPI] Engineering Sciences [physics][SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics[ SPI.MAT ] Engineering Sciences [physics]/Materials[SPI.OPTI]Engineering Sciences [physics]/Optics / Photonic[ SPI ] Engineering Sciences [physics][ SPI.NANO ] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics[ SPI.OPTI ] Engineering Sciences [physics]/Optics / Photonic[SPI.MAT] Engineering Sciences [physics]/Materials[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics[SPI.MAT]Engineering Sciences [physics]/Materials
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Changes in surface stress, morphology and chemical composition of silica and silicon nitride surfaces during the etching by gaseous HF acid

2007

International audience; HF acid attack of SiO2 and Si3N4 substrates is analyzed to improve the sensitivity of a sensor based on inicrocantilever. Ex situ analysis of the etching using XPS, SIMS and AFM show significant changes in the anisotropy and the rate of the etching of the oxides on SiO2 and Si3N4 surface. Those differences influence the kinetic evolution of the plastic bending deflection of the cantilever coated with SiO2 and Si3N4 layer, respectively. The linear dependence between the HF concentration and the Si3N4 cantilever bending corresponds to a deep attack of the layer whereas the nonlinear behavior observed for SiO2 layer can be explained by a combination of deep and lateral …

atomic force microscope (AFM)[SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicssiliconX-ray photoelectron spectroscopy (XPS)HYDROGEN-FLUORIDECORROSIONRESONANCEAQUEOUS HYDROFLUORIC-ACIDhydrofluoric acid (HF)sensorCERAMICSMICROCANTILEVERSsecondaryEOLEOLion mass spectroscopy (SIMS)[ SPI.NANO ] Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsSI(111) SURFACESCANTILEVERS[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicscantileverGAS SENSORS
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