Search results for "Microscope"
showing 10 items of 1412 documents
X-ray diffraction line-broadening study on two vibrating, dry-milling procedures in kaolinites
2009
Due to the great technological importance of the microstructure of kaolinite, characterizing its evolution during dry milling of kaolin and analyzing the microstructural information obtained from different methods were the main aims of this work. The microstructural alteration of kaolinite is evaluated by X-ray diffraction and electron microscopy methods, comparing the results obtained and analyzing the correlations between them. The Warren-Averbach and Voigt-function methods of X-ray diffraction microstructural analysis have been applied successfully to the study of the effects of two different, vibrating-cup dry-milling configurations in the microstructure of kaolinite from the reflection…
Gas sensing properties of Zn-doped p-type nickel ferrite
2012
Abstract The influence of zinc ion to the NiFe2O4 p-type semiconductor gas response characteristics is demonstrated. For characterization of gas sensor material, synthesized by sol–gel auto combustion method, X-ray diffraction (XRD), scanning electron microscopy (SEM), DC resistance and impedance spectroscopy (IS) measurements were employed. The response change of Zn doped nickel ferrite is related to the interruption of hole hopping between nickel ions. This was improved by change of conductivity type with temperature and gas exposure.
Preparation and Electric Properties of Barium Zirconium Titanate Ceramic
2015
The relaxor behavior of barium zirconium titanate ceramics BaZr0.35Ti0.65O3 prepared by a conventional sintering process was investigated. The synthesized material was determined by an X-ray diffraction and scanning electron microscopy. Based on performed studies, the BaZr0.35Ti0.65O3 ceramic material has been identified as canonical relaxor, related to the Ti-rich polar regions. The freezing temperature Tf and activation energy Ea are calculated from the Vogel-Fulcher relationship.
CuInS2 Films for Photovoltaic Applications Deposited by a Low-Cost Method.
2006
We report an atmospheric-pressure deposition method for preparing well-adhered and compact CuInS 2 films. The precursor film is obtained by a solution-coating technique and is subjected to a low-cost and safe one-step reduction-sulfurization treatment. A maximum thickness of 300 nm is achieved per layer, and up to three layers were sulfurized at a time. The obtained films were characterized by X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM) and visible-near-infrared (vis-NIR) spectrophotometry.
Investigating the performance of reconstruction methods used in structured illumination microscopy as a function of the illumination pattern's modula…
2016
Surpassing the resolution of optical microscopy defined by the Abbe diffraction limit, while simultaneously achieving optical sectioning, is a challenging problem particularly for live cell imaging of thick samples. Among a few developing techniques, structured illumination microscopy (SIM) addresses this challenge by imposing higher frequency information into the observable frequency band confined by the optical transfer function (OTF) of a conventional microscope either doubling the spatial resolution or filling the missing cone based on the spatial frequency of the pattern when the patterned illumination is two-dimensional. Standard reconstruction methods for SIM decompose the low and hi…
Structural investigation of four-centre photopolymerisation of bis-phthalamic bis-chalcone derivative in the crystalline state
1997
By combining the results obtained from an electron diffraction tilting series with solid state NMR and powder X-ray diffraction, it was possible to determine the unit cell parameters and space group of BPABC crystals grown from DMAA solution both before and after irradiation. Subsequently semi-empirical quantum mechanical and packing energy calculations led to a model structure which agreed well with all the electron diffraction data and thus provided insight into the cross-linking mechanism. © 1997 John Wiley & Sons Ltd.
Influence of mechanoactivation on the adhesion and mechanical properties of metal/oxide interfaces
2005
Properties of interfaces in solid state metal/oxide joints (Al/SiO2, Al/MgO, Al/glass, Mg/MgO, In/glass, Mg/SiO2 etc.) are reported. Interfaces were formed at plastic deformation of metal on the oxide surface at room temperature. Structure, composition, and micromechanical properties of the interfaces are studied by AFM, X-ray diffraction, SIMS, electron, optical microscopy, and precision microindentation. A noticeable adhesion is observed in the regions of maximum shear strain in case of metals with low oxide formation energy. Formation of a reaction zone with oxygen concentration gradient is detected in which the metal near the interface hardens. The effect of mechanoactivation is conside…
Template-based synthesis of nickel oxide
2015
Nanocrystalline NiO has been produced using a facile template-based synthesis from nickel nitrate solutions using cellulose as a template. Thus obtained oxides were studied by scanning electron microscopy, x-ray diffraction, Raman scattering spectroscopy, photoluminescence spectroscopy and confocal spectromicroscopy. The filamentary/coral morphology of the samples has been evidenced and is built up of agglomerated nanocrystallites with a size in the range of about 26-36 nm. The presence of two-magnon contribution in Raman scattering spectra suggests the existence of antiferromagnetic ordering at room temperature. Finally, the observed near-infrared photoluminescence band at 850 nm has been …
Effect of gamma radiation on thermostimulated exoelectron emission from Gd2O3 films
2020
Abstract The effect of gamma irradiation on Gd2O3 films was studied using the thermostimulated exoelectron emission (TSEE) technique. The films were deposited on a glass and Si/SiO2 substrates using an extraction-pyrolytic method. Crystalline structure, chemical composition, film thickness and surface morphology were characterized by means of X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM) and atomic force microscopy (AFM). The films were irradiated by 10 MeV gamma photons and TSEE was measured from the irradiated films. It was found that gamma irradiation decreases TSEE intensity and the area below TSEE spectral curves. A linear correlati…
Speckle random coding for 2D super resolving fluorescent microscopic imaging.
2006
In this manuscript we present a novel super resolving approach based upon projection of a random speckle pattern onto samples observed through a microscope. The projection of the speckle pattern is created by coherent illumination of the inspected pattern through a diffuser. Due to local interference of the coherent wave front with itself, a random speckle pattern is superimposed on the sample. This speckle pattern can be scanned over the object. A super-resolved image can be extracted from a temporal sequence of images by appropriate digital processing of the image stream. The resulting resolution is significantly higher than the diffraction limitation of the microscope objective. The new …