Search results for "Microscope"
showing 10 items of 1412 documents
High-resolution hard-x-ray photoelectron diffraction in a momentum microscope—the model case of graphite
2019
New journal of physics 21(11), 113031 - (2019). doi:10.1088/1367-2630/ab51fe
Electromagnetic Singularities and Resonances in Near-Field Optical Probes
2007
Over the last two decades scanning near-field optical microscopy (SNOM) has demonstrated its ability to provide optical resolution significantly better than the diffraction limit (<20 nm). The general principle of SNOM relies on the approach of a nanometer-sized object in the optical near-field of a sample to be studied. This nano-object (NO) is usually the extremity of a probe. Regardless of the nature of the observed SNOM signal (inelastic scattering, fluorescence, etc.), the detection of the light is achieved in the far-field regime where the NO acts as a mediator between the optical near-field and the detector. Figure 1 is a schematic illustration of the SNOM principle.
The Effects of 3d Admixtures on Properties of Relaxor PLZT8/65/35 Ceramics
2012
A study of the effects of the 3d dopants Mn, Fe, Co, Ni, and Cu on relaxor behavior and other properties of the ferroelectric PLZT8/65/35(La8) ceramic compound by X-ray diffraction, electron microscopy and other techniques is reported. The complex dielectric permittivity ϵ* = ϵ′-iϵ′′ is measured in the 20–400°C range of temperature at frequencies within the range of 102 – 106 Hz. Essential changes caused by the admixtures in the behavior of dielectric permittivity with frequency and temperature are observed along with changes in the XRD SEM patterns are observed. The mechanisms of the phenomena are discussed.
Vapor growth of Hg1−xCdxI2 on glass using CdTe buffer
2001
Abstract Vapor phase epitaxy (VPE) of Hg1−xCdxI2 layers on glass substrates covered by a CdTe buffer layer has been studied. The buffer layers of 2–4 μm thickness were formed by VPE using polycrystalline CdTe and Cd metal sources. The Hg1−xCdxI2 layers were grown using a (Hg1−yCdy)1−z(I2)z polycrystalline source, with a composition in the range of y=0.1–0.5 and z=0.5–0.8. Scanning electron microscopy and X-ray diffraction studies have shown that the composition and structure of Hg1−xCdxI2 layers depend strongly on the VPE conditions. Varying the growth time and source composition, it has been possible to obtain Hg1−xCdxI2 layers with the composition x in the range from approximately 0 (HgI2…
X-ray diffraction line broadening on vibrating dry-milled Two Crows sepiolite
2006
A reference sample of sepiolite and products of its comminution by vibrating dry-milling have been studied using X-ray diffraction (XRD) line-broadening analysis, complementary field emission scanning electron microscopy (FESEM) images and surface area measurements. The apparent crystallite sizes determined via XRD are in agreement with observations on FESEM images. The sepiolite aggregates consist of lath-shaped agglutinations of prisms and pinacoids elongated along [001], each lath including several crystallites in that direction. The surface area magnitudes are in the range of previous experimental measurements of other sepiolites. The results obtained show the effectiveness of vibro-mil…
Investigation of Silicon Carbide Polytypes by Raman Spectroscopy
2014
Abstract Polytypes of colourless and coloured single crystals of silicon carbide (SiC) grown on SiC substrates by chemical vapour deposition are studied using Raman spectroscopy supplemented by scanning electron microscopy (SEM) and X-ray diffraction (XRD) analyses. The SEM analysis of the defect stacking faults, inclusions of defects and their distribution has shown that they correlate with the peak positions of the obtained Raman spectra and with the XRD data on the crystal structure
A study of a differential method for a field diffracted by a rough surface
2006
Since more than one decade, a new generation of microscopes was developed. It is about near field microscopes. Among these devices, we are interested in the PSTM (Photon Scanning Tunnelling Microscopy). Images obtained by this instrument do not reflect, with a better resolution, the topography of the studied samples. In order to improve the performance of this apparatus, several models have been developed. In our case, we propose to retake, by using a differential method, the study of a rough surface. The surface is modelled as two pavements of different sizes and refractive indices. Theoretically, the obtained results agree well with results obtained for a surface having submicronic asperi…
Superresolved Holographic Microscopy
2008
Superresolution methods in digital holographic microscopy provide a useful tool to overcome the Abbe's diffraction limit when using modest microscope lenses. The process improves the cutoff frequency of the microscope lens by means of the generation of a synthetic aperture based on time multiplexing and using 3 main stages: optical coding, optical decoding, and digital postprocessing. After the whole process, a superresolved image is obtained by Fourier transformation of the synthetic aperture.
Investigation of AC Electrical Properties of MXene-PCL Nanocomposites for Application in Small and Medium Power Generation
2021
The paper examined Ti3C2Tx MXene (T—OH, Cl or F), which is prepared by etching a layered ternary carbide Ti3AlC2 (312 MAX-phase) precursor and deposited on a polycaprolactone (PCL) electrospun membrane (MXene-PCL nanocomposite). X-ray Diffraction analysis (XRD) and Scanning Electron Microscopy (SEM) indicates that the obtained material is pure Ti3C2 MXene. SEM of the PCL-MXene composite demonstrate random Ti3C2 distribution over the nanoporous membrane. Results of capacitance, inductance, and phase shift angle studies of the MXene-PCL nanocomposite are presented. It was found that the frequency dependence of the capacitance exhibited a clear sharp minima in the frequency range of 50 Hz to o…
Determinant role of the edges in defining surface plasmon propagation in stripe waveguides and tapered concentrators
2012
International audience; In this paper, we experimentally show the effect of waveguide discontinuity on the propagation of the surface plasmon in metal stripes and tapered terminations. Dual-plane leakage microscopy and near-field microscopy were performed on Au stripes with varied widths to imag29e the surface plasmon intensity distribution in real and reciprocal spaces. We unambiguously demonstrate that edge diffraction is the limiting process determining the cutoff conditions of the surface plasmon mode. Finally, we determine the optimal tapered geometry leading to the highest transmission.