Search results for "Microscopy"

showing 10 items of 3390 documents

Time-resolved photoemission electron microscopy

2009

The excellent time structure of Synchrotron radiation and short-pulse lasers has opened the door to a novel way of time-resolved imaging using PEEM. Periodic or repetitive processes can be studied by stroboscopic illumination with the pulsed photon beam. Since the first experiments in 2003, two fields of applications have been established in several groups. One concerns the investigation of fast magnetisation processes like precessional switching, Gigahertz-eigenmodes of ferromagnetic nanostructures or travelling spin waves in thin films. More recently, femtosecond lasers have been used for imaging of localised surface plasmons in nanoparticles and their temporal behaviour in the femtosecon…

Materials sciencebusiness.industryMagnetic circular dichroismSurface plasmonPhysics::OpticsSynchrotron radiationLaserlaw.inventionCondensed Matter::Materials SciencePhotoemission electron microscopyOpticsSpin wavelawFemtosecondAtomic physicsThin filmbusiness
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Scanning electron microscopy study of twins in ZnSe single crystals grown by solid-phase recrystallization

2001

ZnSe single crystals were grown from n-type microcrystalline boules by a solid phase recrystallization (SPR) method. During SPR, twinned regions appear with different electronic recombination properties. The recrystallizations were performed under different atmospheres, Ar or Se, and pressures to investigate the influence of growth conditions on these structural features. Recombination properties were studied by means of cathodoluminescence (CL) and remote-electron beam induced current (REBIC). Wavelength dispersive X-ray (WDX) mappings were also performed to analyze possible differences in stoichiometry related to the presence of extended defects.

Materials sciencebusiness.industryMechanical EngineeringAnalytical chemistryRecrystallization (metallurgy)CathodoluminescenceCondensed Matter PhysicsWavelengthOpticsMicrocrystallineMechanics of MaterialsGeneral Materials SciencebusinessScanning electron microscopy studyStoichiometryRecombinationMaterials Science and Engineering: B
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Combination of Confocal Raman Spectroscopy and Electron Microscopy on the Same Individual Bundles of Single-Walled Carbon Nanotubes

2002

We report a method to investigate the same individual single-walled carbon nanotube (SWNT) bundles with both transmission electron microscopy (TEM) and Raman spectroscopy. Free-standing individual bundles are obtained by depositing a solution of suspend SWNTs on a carbon film with a regular pattern of holes, which can be localized by TEM and also by confocal Raman microscopy. While most of the TEM images predict that the bundles consist of tubes with a similar diameter, we will show that occasionally a certain tube diameter can be associated with a particular radial breathing mode frequency of the Raman spectrum. Single-walled carbon nanotubes (SWNTs) are one-dimensional molecular structure…

Materials sciencebusiness.industryMechanical EngineeringConfocalAnalytical chemistryBioengineeringGeneral ChemistryCarbon nanotubeCondensed Matter Physicslaw.inventionOptical properties of carbon nanotubesCondensed Matter::Materials Sciencesymbols.namesakeCarbon filmTransmission electron microscopylawMicroscopysymbolsOptoelectronicsGeneral Materials ScienceElectron microscopebusinessRaman spectroscopyNano Letters
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Quantitative phase imaging by single-shot Hilbert-Huang phase microscopy.

2016

We propose a novel single-shot Hilbert-Huang transform-based algorithm applied to digital holographic microscopy (DHM) for robust, fast, and accurate single-shot quantitative phase imaging in on-axis and off-axis configurations. Fringe pattern with possible defects and closed fringes are adaptively filtered and accurately phase demodulated using local fringe direction estimation. Experimental validation of the proposed techniques is presented as the DHM study of microbeads and red blood cells phase samples. Obtained results compare very favorably with the Fourier approach (off-axis) and temporal phase shifting (on-axis).

Materials sciencebusiness.industryPhase (waves)02 engineering and technology021001 nanoscience & nanotechnology01 natural sciencesAtomic and Molecular Physics and OpticsInterference microscopy010309 opticssymbols.namesakeFourier transformOptics0103 physical sciencesMicroscopyPhase imagingsymbolsDigital holographic microscopySpatial frequency0210 nano-technologybusinessPhase retrievalOptics letters
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Simultaneous dual mode imaging platform in lensless holographic microscopy

2019

We present a novel layout capable of dual mode imaging in real time with different magnifications and resolution capabilities in lensless microscopy based on wavelength multiplexing. Experiments using static and dynamic samples are included.

Materials sciencebusiness.industryResolution (electron density)ComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISIONHolographyDual modeMultiplexingPtychographylaw.inventionWavelengthOpticslawMicroscopybusinessBeam splitterImaging and Applied Optics 2019 (COSI, IS, MATH, pcAOP)
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Photoemission Electron Microscopy as a tool for the investigation of optical near fields

2005

Photoemission electron microscopy was used to image the electrons photoemitted from specially tailored Ag nanoparticles deposited on a Si substrate (with its native oxide SiO$_{x}$). Photoemission was induced by illumination with a Hg UV-lamp (photon energy cutoff $\hbar\omega_{UV}=5.0$ eV, wavelength $\lambda_{UV}=250$ nm) and with a Ti:Sapphire femtosecond laser ($\hbar\omega_{l}=3.1$ eV, $\lambda_{l}=400$ nm, pulse width below 200 fs), respectively. While homogeneous photoelectron emission from the metal is observed upon illumination at energies above the silver plasmon frequency, at lower photon energies the emission is localized at tips of the structure. This is interpreted as a signat…

Materials sciencebusiness.industryResolution (electron density)General Physics and AstronomyFOS: Physical sciencesPhysics::OpticsElectronPhoton energyLaserlaw.inventionPhotoemission electron microscopyCondensed Matter::Materials ScienceOpticslawFemtosecondSapphireOptoelectronicsbusinessPlasmonOptics (physics.optics)Physics - Optics
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Femtosecond time-resolved photoemission electron microscopy operated at sample illumination from the rear side

2019

We present an advanced experimental setup for time-resolved photoemission electron microscopy (PEEM) with sub-20 fs resolution, which allows for normal incidence and highly local sample excitation with ultrashort laser pulses. The scheme makes use of a sample rear side illumination geometry that enables us to confine the sample illumination spot to a diameter as small as 6 μm. We demonstrate an operation mode in which the spatiotemporal dynamics following a highly local excitation of the sample is globally probed with a laser pulse illuminating the sample from the front side. Furthermore, we show that the scheme can also be operated in a time-resolved normal incidence two-photon PEEM mode w…

Materials sciencebusiness.industryResolution (electron density)Physics::OpticsLaserSample (graphics)Surface plasmon polaritonlaw.inventionInterferometryPhotoemission electron microscopyOpticslawFemtosecondbusinessInstrumentationExcitationReview of Scientific Instruments
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Evaluation of the apical sealing ability and adaptation to the dentin of two resin-based Sealers: An in vitro study

2013

Aim: To quantitatively evaluate the apical sealing ability and adaptation of two resin-based sealers to dentin. Materials and Methods: Fifty freshly extracted mandibular first premolars were taken and sectioned at the cemento-enamel junction. Thirty teeth were subjected to a leakage study by the resin infiltration method with two groups of 10 teeth each. Group I teeth were obturated with methacrylate resin-based sealer (EnoRez) and Group II teeth were obturated with epoxy resin-based sealer (AH Plus). The remaining 10 teeth were used as controls (positive and negative of five teeth each). Twenty teeth were divided into two groups and obturated as in the leakage study and subjected to a scan…

Materials sciencebusiness.industryRoot canalPhysical integrityGroup iiResin infiltrationDentistryquantitative methodstomatognathic diseasesmedicine.anatomical_structurestomatognathic systemMicroleakageresin sealerSealer penetrationmedicineDentinIn vitro studyElectronic microscopyOriginal ArticlebusinessGeneral DentistryJournal of Conservative Dentistry : JCD
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Imaging of photonic nanopatterns by scanning near-field optical microscopy

2002

We define photonic nanopatterns of a sample as images recorded by scanning near-field optical microscopy with a locally excited electric dipole as a probe. This photonic nanopattern can be calculated by use of the Green’s dyadic technique. Here, we show that scanning near-field optical microscopy images of well-defined gold triangles taken with the tetrahedral tip as a probe show a close similarity to the photonic nanopattern of this nanostructure with an electric dipole at a distance of 15 nm to the sample and tilted 45° with respect to the scanning plane.

Materials sciencebusiness.industryScanning confocal electron microscopyPhysics::OpticsStatistical and Nonlinear PhysicsScanning gate microscopyScanning capacitance microscopyAtomic and Molecular Physics and Opticslaw.inventionScanning probe microscopyOpticslawScanning ion-conductance microscopyNear-field scanning optical microscopeScanning tunneling microscopebusinessVibrational analysis with scanning probe microscopyJournal of the Optical Society of America B
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Probing large area surface plasmon interference in thin metal films using photon scanning tunneling microscopy.

2003

Abstract The interference of surface plasmons can provide important information regarding the surface features of the hosting thin metal film. We present an investigation of the interference of optically excited surface plasmons in the Kretschmann configuration in the visible spectrum. Large area surface plasmon interference regions are generated at several wavelengths and imaged with the photon scanning tunneling microscope. Furthermore, we discuss the non-retarded dispersion relations for the surface plasmons in the probe–metal system modeled as confocal hyperboloids of revolution in the spheroidal coordinate systems.

Materials sciencebusiness.industryScanning tunneling spectroscopySurface plasmonPhysics::OpticsSpin polarized scanning tunneling microscopyAtomic and Molecular Physics and OpticsElectrochemical scanning tunneling microscopeElectronic Optical and Magnetic Materialslaw.inventionScanning probe microscopyOpticsInterference (communication)lawScanning tunneling microscopebusinessInstrumentationLocalized surface plasmonUltramicroscopy
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