Search results for "Microscopy"

showing 10 items of 3390 documents

Surface plasmon polariton propagation length: A direct comparison using photon scanning tunneling microscopy and attenuated total reflection

2001

The propagation of surface plasmon polaritons (SPP's) is studied using a photon scanning tunneling microscope (PSTM) and conventional attenuated total reflection (ATR). The PSTM experiment uses localized (focused beam) launching of SPP's at a wavelength of 632.8 nm. Propagation of the SPP is observed as an exponentially decaying tail beyond the launch site and the $1/e$ propagation length is measured directly for a series of Ag films of different thicknesses. The ATR measurements are used to characterize the thin film optical and thickness parameters, revealing, notably, the presence of a contaminating adlayer of ${\mathrm{Ag}}_{2}\mathrm{S}$ of typical dielectric function, $8.7+i2.7,$ and …

Materials sciencebusiness.industryScanning tunneling spectroscopySurface plasmonPhysics::OpticsSpin polarized scanning tunneling microscopySurface plasmon polaritonMolecular physicslaw.inventionOpticslawDispersion relationPolaritonScanning tunneling microscopebusinessLocalized surface plasmonPhysical Review B
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Mapping surface plasmon propagation by collection-mode near-field microscopy

2011

Surface plasmon propagation along striped Gold structures has been investigated by collection-mode near-field microscopy, leading to map the field intensity at the structure surface and to assess the system behavior at the nanoscale.

Materials sciencebusiness.industrySurface plasmonNanophotonicsPhysics::OpticsSurface plasmon polaritonlaw.inventionOpticslawMicroscopyNear-field scanning optical microscopeSurface plasmon resonanceScanning tunneling microscopebusinessLocalized surface plasmonFrontiers in Optics 2011/Laser Science XXVII
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Curvature effects in surface plasmon dispersion and coupling

2005

We have studied the resonant coupling of surface plasmons in curved thin-film tunneling geometries by obtaining the dispersion relations for the system. The surface plasmon dispersion relations are calculated for a metal-coated dielectric probe above a dielectric half space with and without metal coating. The system is modeled in the prolate spheroidal system, and the dispersion relations are studied as functions of the parameter that defines the boundaries of the tip and the corresponding coating, and as functions of the involved coating thicknesses. Using this type of probe-substrate configuration, the nonradiative surface plasmon coupling mechanism is investigated in the visible spectrum…

Materials sciencebusiness.industrySurface plasmonPhysics::OpticsDielectricCondensed Matter PhysicsMolecular physicsSurface plasmon polaritonElectronic Optical and Magnetic MaterialsScanning probe microscopyOpticsDispersion relationDispersion (optics)Surface plasmon resonancebusinessLocalized surface plasmonPhysical Review B
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Space-time features of THz emission from optical rectification in sub-wavelength areas

2011

We present our investigation on the THz space-time emission characteristic induced by the non-paraxial generation regime in highly localized THz generation via optical rectification on sub-wavelength areas.

Materials sciencebusiness.industryTerahertz radiationPhysics::OpticsNonlinear opticsTeraHertz science and deviceSettore ING-INF/01 - ElettronicaTerahertz spectroscopy and technologyOptical pumpingOptical rectificationOpticsRectificationMicroscopyOptoelectronicsNear-field scanning optical microscopebusiness
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Spatial and spectral properties of small area THz generation for sub-wavelength microscopy

2010

A highly localized THz source is a promising candidate for sub-wavelength microscopy, due to its superior radiation power throughput with respect to others near-field techniques. Here, we report on the spatial and the spectral near-field properties of our highly localized THz source.

Materials sciencebusiness.industryTerahertz radiationSpectral propertiesPhysics::OpticsNonlinear opticsRadiationTerahertz sourcesSub wavelengthOpticsMicroscopyOptoelectronicsnonlinear optics terahertz spectroscopybusinessThroughput (business)Image resolution35th International Conference on Infrared, Millimeter, and Terahertz Waves
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Real-space imaging and motion analysis in sheared colloidal crystals

2007

Microscopic imaging of single particles is a powerful tool to investigate the local structure of colloidal suspensions. For single-particle identification with high-resolution microscopy the resolution power is limited by refraction to roughly the wavelength of light. In this case the depth of sharpness is on a scale of less than this limit. For this reason the simultaneous observation of particles in two or more layers of a colloidal crystal seems to be impossible. We report a method with which we can image more than one particle layer in dilute colloidal suspensions with preserved resolution. The analysis of the images obtained, in particular for the investigation of crystal layer motion …

Materials sciencebusiness.industrydigestive oral and skin physiologyResolution (electron density)Colloidal crystalRefractionCondensed Matter::Soft Condensed MatterCrystalWavelengthColloidOpticsMicroscopyParticlebusiness
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Phase defect inspection of multilayer masks for 13.5 nm optical lithography using PEEM in a standing wave mode

2007

We report on recent developments of an "at wavelength" full-field imaging technique for defect inspection of multilayer mask blanks for extreme ultraviolet lithography (EUVL). Our approach uses photoemission electron microscopy (PEEM) in a near normal incidence mode at 13.5 nut wavelength to image the photoemission induced by the EUV wave field on the multilayer blank surface. We analyze buried defects on Mo/Si multilayer samples down to a lateral size of 50 nm and report on first, results obtained from a six inches mask blank prototype as prerequisite for industrial usage. (c) 2007 Elsevier B.V. All rights reserved.

Materials sciencebusiness.industryphotoemission electronExtreme ultraviolet lithographydefect analysisPhase (waves)Surfaces and InterfacesCondensed Matter PhysicsBlankSurfaces Coatings and Filmslaw.inventionStanding waveextreme ultraviolet lithography (EUVL)WavelengthPhotoemission electron microscopyOpticslawmultilayer mask blanksMaterials ChemistryOptoelectronicsEUV-PEEMPhotolithographybusinessLithographymicroscopy (PEEM)
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Surface properties of AlInGaN/GaN heterostructure

2016

Abstract Surface structural, electronic and electrical properties of the quaternary alloy AlInGaN/GaN heterostructures are investigated. Surface termination, atomic arrangement, electronic and electrical properties of the (0001) surface and (10–11) V-defect facets have been experimentally analyzed using various surface sensitive techniques including spectroscopy and microscopy. Moreover, the effect of sub-band gap (of the barrier layer) illumination on contact potential difference (VCPD) and the role of oxygen chemisorption have been studied.

Materials sciencechemistry.chemical_elementCondensed Matter Physic02 engineering and technologyKelvin probe force microscopy01 natural sciencesOxygenlaw.inventionBarrier layerlaw0103 physical sciencesMicroscopyMechanics of MaterialGeneral Materials ScienceScanning tunneling microscopySpectroscopy010302 applied physicsV-defectbusiness.industryMechanical EngineeringHeterojunctionAlInGaN/GaNCiència dels materials021001 nanoscience & nanotechnologyCondensed Matter PhysicsMicroscòpiachemistryMechanics of MaterialsChemisorptionOptoelectronicsMaterials Science (all)Scanning tunneling microscope0210 nano-technologybusinessVolta potentialMaterials Science in Semiconductor Processing
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Insights into the formation of metal carbon nanocomposites for energy storage using hybrid NiFe layered double hydroxides as precursors

2020

[EN] NiFe-carbon magnetic nanocomposites prepared using hybrid sebacate intercalated layered double hydroxides (LDHs) as precursors are shown to be of interest as supercapacitors. Here, the low-temperature formation mechanism of these materials has been deciphered by means of a combined study using complementaryin situ(temperature-dependent) techniques. Specifically, studies involving X-ray powder diffraction, thermogravimetry coupled to mass spectrometry (TG-MS), statistical Raman spectroscopy (SRS), aberration-corrected scanning transmission electron microscopy (STEM) and electron energy-loss spectroscopy (EELS) have been carried out. The experimental results confirm the early formation o…

Materials sciencechemistry.chemical_elementNanoparticle02 engineering and technologyengineering.material010402 general chemistry01 natural sciencessymbols.namesakeScanning transmission electron microscopyNanocompositeLayered double hydroxidesGeneral ChemistryQuímicaEnergia Desenvolupament021001 nanoscience & nanotechnology0104 chemical sciencesThermogravimetryChemistrychemistryChemical engineeringengineeringsymbols0210 nano-technologyRaman spectroscopyCarbonPowder diffraction
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Two-component self-assembly with solvent leading to "wet" and microcrystalline organogel fibers

2014

Abstract Hypothesis The microcrystalline fibers of N -(2-aminoethyl)-3α-hydroxy-5β-cholan-24-amide 1 provided a useful model system for studying the complex relationship between morphology, experimental parameters, solvent, and the phenomenon of organogelation. The presence of solvents in the solid forms of 1 along with crystallization behavior suggested solvate formation and polymorphic behavior. Experiments Forty solid state- and xerogel samples of 1 formed in organic solvents and in three categories of experimental conditions were analyzed with single crystal X-ray diffraction (XRD), powder X-ray diffraction (PXRD), Raman microscopy, and attenuated total reflection Fourier-transform infr…

Materials sciencecrystallizationbile acid amideInfrared spectroscopylaw.inventioninclusion crystalBiomaterialsCrystalColloid and Surface Chemistrysolvatelawmicrocrystalline fiberCrystallizationIsostructuralta116x-ray crystallographyorganogelxerogelraman microscopySurfaces Coatings and FilmsElectronic Optical and Magnetic Materialsfourier transform infrared spectroscopyCrystallographyMicrocrystallineAttenuated total reflectionSingle crystalPowder diffractionJournal of Colloid and Interface Science
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