Search results for "NEAR-FIELD"
showing 10 items of 101 documents
Generalized bloch equations for optical interactions in confined geometries
2005
By combining the field-susceptibility technique with the optical Bloch equations, a general formalism is developed for the investigation of molecular photophysical phenomena triggered by nanometer scale optical fields in the presence of complex environments. This formalism illustrate the influence of the illumination regime on the fluorescence signal emitted by a single molecule in a complex environment. In the saturated case, this signal is proportional to the optical local density of states, while it is proportional to the near-field intensity in the non-saturated case. (C) 2005 Elsevier B.V. All rights reserved.
Resolution enhancement in quantitative phase microscopy
2019
Quantitative phase microscopy (QPM), a technique combining phase imaging and microscopy, enables visualization of the 3D topography in reflective samples, as well as the inner structure or refractive index distribution of transparent and translucent samples. Similar to other imaging modalities, QPM is constrained by the conflict between numerical aperture (NA) and field of view (FOV): an imaging system with a low NA has to be employed to maintain a large FOV. This fact severely limits the resolution in QPM up to 0.82λ/NA, λ being the illumination wavelength. Consequently, finer structures of samples cannot be resolved by using modest NA objectives in QPM. Aimed to that, many approaches, suc…
Near-field optical response of a two-dimensional grating of gold nanoparticles
2001
Laboratoire de Physique, Optique Submicronique, Universite´de Bourgogne, Boite Postale 47870, F-21078 Dijon, France~Received 1 August 2000; published 4 April 2001!This article reports on the near-field optical response of a small square grating of gold nanoparticles tailoredby electron-beam lithography. The investigation of the grating is aimed at a deepened understanding ofelectromagnetic interaction among particles due to scattered light fields. Therefore, a photon scanning tunnel-ing microscope is applied to acquire near-field optical images. Two different incident wavelengths are used tocharacterize the intensity and the spatial localization of the electromagnetic near field both in and out…
Properties of silicon integrated photonic lenses: bandwidth, chromatic aberration, and polarization dependence
2013
We analyze the properties of silicon integrated photonic lenses based on scattering optical elements. The devices have been inverse- designed by combining genetic algorithms and the multiple scattering theory. These lenses are able to focus an infrared plane wave front on a position freely determined during the design stage. The nanofabricated silicon integrated lenses have proved effective over a large range of wave- lengths, measured to be of the order of 100 nm. The lenses show chromatic aberration, with a displacement of the position of the focus mea- sured to be higher than 1.5 μm when the wavelength varies from 1500 to 1600 nm. Moreover, we analyze the polarization of the focused beam…
Mapping electron-beam-injected trapped charge with scattering scanning near-field optical microscopy.
2016
Scattering scanning near-field optical microscopy (s-SNOM) has been demonstrated as a valuable tool for mapping the optical and optoelectronic properties of materials with nanoscale resolution. Here we report experimental evidence that trapped electric charges injected by an electron beam at the surface of dielectric samples affect the sample-dipole interaction, which has direct impact on the s-SNOM image content. Nanoscale mapping of the surface trapped charge holds significant potential for the precise tailoring of the electrostatic properties of dielectric and semiconductive samples, such as hydroxyapatite, which has particular importance with respect to biomedical applications. The meth…
Relationship between scanning near-field optical images and local density of photonic states
2001
From numerical calculations based on Green's dyadic formalism, we show that a scanning near-field optical microscope (SNOM) working with a point-like illuminating probe delivers images that contain features directly related to the local density of photonic states (LDOS). More precisely, an unambiguous identification of the partial LDOSs (x, y or z polarized) can be made in the SNOM images when the solid angle of detection reaches 2π sr.
Mapping surface plasmon propagation by collection-mode near-field microscopy
2011
Surface plasmon propagation along striped Gold structures has been investigated by collection-mode near-field microscopy, leading to map the field intensity at the structure surface and to assess the system behavior at the nanoscale.
Scanning near-field optical microscopy using semiconductor nanocrystals as a local fluorescence and fluorescence resonance energy transfer source
2003
Local fluorescence probes based on CdSe semiconductor nanocrystals were prepared and tested by recording scanning near-field optical microscopy (SNOM) images of calibration samples and fluorescence resonance energy transfer SNOM (FRET SNOM) images of acceptor dye molecules inhomogeneously deposited onto a glass substrate. Thousands of nanocrystals contribute to the signal when this probe is used as a local fluorescence source while only tens of those (the most apical) are involved in imaging for the FRET SNOM operation mode. The dip-coating method used to make the probe enables diminishing the number of active fluorescent nanocrystals easily. Prospects to realize FRET SNOM based on a single…
Optical addressing at the subwavelength scale
2000
The Green dyadic formalism is applied to the study of the optical properties of dielectric subwavelength structures integrated in coplanar geometry. We first consider homogeneous wires with high refractive index featuring subwavelength cross sections. We show that such wires may have guiding properties and that they may be coupled with a local illumination produced by a focused Gaussian beam totally reflected at the substrate interface. When excited by the focused beam, these subwavelength optical waveguides (SOW's) provide a confined source of light that could be used to excite a single nanoscopic object. Well designed heteregeneous wires resulting from the alignment of dielectric particle…
Near-field study with a photon scanning tunneling microscope: Comparison between dielectric nanostructure and metallic nanostructure
2007
Abstract Scanning near-field optical microscopy (SNOM) integrates standard optical methods with scanning probe microscopy (SPM) techniques allowing to collect optical information with resolution well beyond the diffraction limit. We study the influence on image formation of several parameters in scanning near-field microscopy. The numerical calculations have been carried out using the differential method. We investigate a 2D-PSTM configuration with a dielectric rectangular object. We will focus on the collection type SNOM in a constant height scanning mode. Various oscillation patterns are observed from both sides of the nanostructure, which we interpret as interference between the diffract…