Search results for "NICS"

showing 10 items of 15025 documents

Multi-pulse characterization of trapping/detrapping mechanisms in AlGaN/GaN high electromobility transistors

2019

GaN high-electro mobility transistors (HEMTs) are among the most promising candidates for use in high-power, high-frequency, and high-temperature electronics owing to their high electrical breakdown threshold and their high saturation electron velocity. The applications of these AlGaN/GaN HEMTs in power converters are limited by the surface trapping effects of drain-current collapse. Charge-trapping mechanisms affect the dynamic performance of all GaN HEMTs used in power switching applications. This study analyzes the dynamic resistance of GaN HEMTs and finds that the effects of dynamic resistance can be suppressed by controlling switching conditions and on-off cycles.

010302 applied physicsMaterials sciencebusiness.industryTransistorElectrical breakdownAlgan gan02 engineering and technologyTrappingConverters021001 nanoscience & nanotechnologyCondensed Matter Physics01 natural sciencesElectronic Optical and Magnetic Materialslaw.inventionDynamic resistancelaw0103 physical sciencesMaterials ChemistryOptoelectronicsElectronicsElectrical and Electronic Engineering0210 nano-technologybusinessSaturation (magnetic)Semiconductor Science and Technology
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Deformation of bubbles in silicon gel insulation under an alternating electric field

2019

The behavior of silicone gel under electrical stress plays a significant role in the reliability and durability of high voltage electronic power devices due to its widespread use for the insulation of IGBT modules and other components. The charges accumulation at the bubble boundaries leads to significant displacements due to the establishment of Coulombic forces and the high deformability of colloidal system. The main purpose of this work is to validate a numerical approach useful to investigate, for a given silicone gel, the non-linear relation between the applied HVDC stress and the electric field over an air bubble within the insulation bulk. The analysis has been carried out by means o…

010302 applied physicsMaterials scienceinsulationreliabilityDeformation (mechanics)020209 energyBubbleHigh voltage02 engineering and technologyDielectric01 natural sciencesSpace chargeIGBTSilicone gelStress (mechanics)chemistry.chemical_compoundpartial dischargeSettore ING-IND/31 - ElettrotecnicaSiliconechemistryElectric field0103 physical sciences0202 electrical engineering electronic engineering information engineeringComposite material
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Power efficiency improvements with the radio frequency H− ion source

2016

CW 13.56 MHz radio frequency-driven H(-) ion source is under development at the University of Jyväskylä for replacing an existing filament-driven ion source at the MCC30/15 cyclotron. Previously, production of 1 mA H(-) beam, which is the target intensity of the ion source, has been reported at 3 kW of RF power. The original ion source front plate with an adjustable electromagnet based filter field has been replaced with a new front plate with permanent magnet filter field. The new structure is more open and enables a higher flux of ro-vibrationally excited molecules towards the plasma electrode and provides a better control of the potential near the extraction due to a stronger separation …

010302 applied physicsMaterials scienceta114ta213Electromagnetbusiness.industryRF power amplifierCyclotronPlasma01 natural sciencesIon sourcelaw.inventionion sourceslawMagnet0103 physical sciencesOptoelectronicsRadio frequencypower efficiency010306 general physicsbusinessInstrumentationElectrical efficiencyReview of Scientific Instruments
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Quasi-static behaviour and damage assessment of flax/epoxy composites

2015

Experimental investigations were conducted on flax and E-glass fibres reinforced epoxy matrix composites subjected to quasi-static loadings. Flax/epoxy samples having [0]12, [90]12, [0/90]3S and [±45]3S stacking sequences, with a fibre volume fraction of 43% have been tested under tension, compression and in-plane shear loadings. Overall, the compression strength of glass/epoxy was 76% greater than for the flax/epoxy composite. The damage evolution of flax/epoxy of [0/90]3S and [±45]3S samples has been evaluated in terms of transverse crack densities with respect to the load increment. The crack density exhibited a classical “S” shaped pattern for [0/90]3S and linearly for [±45]3S specimens…

010302 applied physicsMatériaux [Sciences de l'ingénieur]Materials sciencePolymer-matrix compositesComposite numberMechanical properties02 engineering and technologyEpoxy matrixEpoxy021001 nanoscience & nanotechnologyE-glass fibres01 natural sciences[SPI]Engineering Sciences [physics]Compressive strengthDamage mechanicsDamage mechanicsvisual_art0103 physical sciencesVolume fractionvisual_art.visual_art_mediumFlax fibresMécanique: Mécanique des matériaux [Sciences de l'ingénieur]Composite material0210 nano-technologyQuasistatic process
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Study of the multipactor phenomenon using a full-wave integral equation technique

2017

Abstract Multipactor effect is a well-known phenomenon of RF breakdown in satellite payloads which degrades components, generates undesirable harmonics, contributes to power dissipation and increases noise in communications. Traditionally, multipactor has been investigated with the aim of obtaining the so-called multipactor threshold voltage, or to present different multipaction detection methods. However, very little attention has been focused on analysing this phenomenon using a multimodal approach. The main goal of this work is to analyse the interaction between a multipactor current and a realistic microwave cavity by means of a rigorous and accurate formulation. For the first time to t…

010302 applied physicsMultipactor effect020206 networking & telecommunications02 engineering and technologyDissipation01 natural sciencesNoise (electronics)Integral equationAdmittance parametersHarmonics0103 physical sciences0202 electrical engineering electronic engineering information engineeringElectronic engineeringElectrical and Electronic EngineeringRepresentation (mathematics)Microwave cavityMathematicsAEU - International Journal of Electronics and Communications
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Hydrodynamic Modeling of Transport and Noise Phenomena in Bipolar Two-Terminal Silicon Structures

1998

International audience

010302 applied physicsNoise temperatureMaterials scienceSiliconMechanical EngineeringShot noisechemistry.chemical_element02 engineering and technology021001 nanoscience & nanotechnologyCondensed Matter Physics01 natural sciences[SPI.TRON]Engineering Sciences [physics]/Electronics[PHYS.PHYS.PHYS-COMP-PH]Physics [physics]/Physics [physics]/Computational Physics [physics.comp-ph]NoisechemistryTerminal (electronics)Mechanics of Materials0103 physical sciencesElectronic engineeringGeneral Materials Science[PHYS.COND]Physics [physics]/Condensed Matter [cond-mat]0210 nano-technologyComputingMilieux_MISCELLANEOUSMaterials Science Forum
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Analysis of thin high-k and silicide films by means of heavy ion time-of-flight forward-scattering spectrometry

2006

The use of forward scattered heavy incident ions in combination with a time-of-flight-energy telescope provides a powerful tool for the analysis of very thin (5–30 nm) films. This is because of greater stopping powers and better detector energy resolution for heavier ions than in conventional He-RBS. Because of the forward scattering angle, the sensitivity is greatly enhanced, thus reducing the ion beam induced desorption during the analysis of very thin films. The drawback of forward scattering angle is the limited mass separation for target elements. We demonstrate the performance of the technique with the analysis of 25 nm thick NiSi films and atomic layer deposited 6 nm thick HfxSiyOz f…

010302 applied physicsNuclear and High Energy PhysicsMaterials scienceIon beamSiliconbusiness.industryScatteringForward scatterchemistry.chemical_element02 engineering and technology021001 nanoscience & nanotechnology01 natural sciences7. Clean energyIonElastic recoil detectionTime of flightchemistry0103 physical sciencesOptoelectronicsAtomic physicsThin film0210 nano-technologybusinessInstrumentationNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
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Comparison of Single Event Transients Generated at Four Pulsed-Laser Test Facilities-NRL, IMS, EADS, JPL

2012

Four pulsed-laser single-event effects systems, differing in wavelength and pulse width, were used to generate single event transients in a large-area silicon photodiode and an operational amplifier (LM124) to determine how transient amplitude and charge collection varied among the different systems. The optical wavelength and the focused spot size are the primary factors influencing the resultant charge density profile. In the large-area photodiode the transients can be distorted by high charge-injection densities that occur for tightly focused, higher energy optical pulses. When the incident laser-pulse energies are corrected for reflection losses and photon efficiency, with collection de…

010302 applied physicsNuclear and High Energy PhysicsMaterials sciencePhotonta114010308 nuclear & particles physicsbusiness.industryTransistorLaser01 natural sciences7. Clean energy[SPI.TRON]Engineering Sciences [physics]/Electronicslaw.inventionPhotodiodeSemiconductor laser theoryWavelengthOpticsNuclear Energy and Engineeringlaw0103 physical sciencesOptoelectronicsTransient (oscillation)Electrical and Electronic EngineeringbusinessPulse-width modulationIEEE Transactions on Nuclear Science
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Stopping cross-section measurements of 4He in TiN1.1O0.27

2000

Abstract The stopping cross-section for 4He projectiles in TiNx compounds has been measured using the backscattering method. A multi-compound marker layer deposited between the test film and the substrate was used to obtain the stopping cross-section at several energies with one energy of the incident beam. Two RBS spectra at definite tilt angles of the sample are taken for each beam energy. The assistance of computer codes to synthesize RBS spectra is very useful to obtain the pertinent information from the displacements of the peaks of the marker layers. Stopping cross-section values are obtained with an estimated uncertainty of about 6%.

010302 applied physicsNuclear and High Energy PhysicsMaterials scienceProjectile02 engineering and technologySubstrate (electronics)021001 nanoscience & nanotechnology01 natural sciencesSpectral lineCross section (physics)Tilt (optics)0103 physical sciencesAtomic physics0210 nano-technologyInstrumentationLayer (electronics)Beam energyEnergy (signal processing)Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
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Radiation resistance of nanolayered silicon nitride capacitors

2020

Abstract Single-layered and multi-layered 20–60 nm thick silicon nitride (Si3N4) dielectric nanofilms were fabricated using a low-pressure chemical vapour deposition (LPCVD) method. The X-ray photoelectron spectroscopy (XPS) confirmed less oxygen content in the multi-layered nanofilms. The capacitors with Si3N4 multilayer demonstrated a tendency to a higher breakdown voltage compared to the capacitors with Si3N4 single layer. Si3N4 nanofilms and capacitors with Si3N4 dielectric were exposed to 1 kGy dose of gamma photons. Fourier transform infrared (FTIR) spectroscopy analysis showed that no modifications of the chemical bonds of Si3N4 were present after irradiation. Also, gamma irradiation…

010302 applied physicsNuclear and High Energy PhysicsMaterials sciencebusiness.industry02 engineering and technologyDielectricChemical vapor deposition021001 nanoscience & nanotechnology01 natural sciencesCapacitancelaw.inventionchemistry.chemical_compoundCapacitorSilicon nitridechemistrylaw0103 physical sciencesOptoelectronicsBreakdown voltageIrradiation0210 nano-technologybusinessInstrumentationRadiation resistanceNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
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