Search results for "Optical microscope"

showing 10 items of 157 documents

On-line monitoring of one-step laser fabrication of micro-optical components

2002

The use of an on-line monitoring method based on photoelasticity techniques for the fabrication of micro-optical components by means of controlled laser heating is described. From this description it is possible to show in real time the mechanical stresses that form the microelement. A new parameter, stressed area, is introduced that quantifies the stresses of a microelement during its fabrication, facilitating a deeper understanding of the physical phenomena involved in the process as well as being a useful test of quality. It also permits the stress produced in the manufacturing process and the optical properties of the final microelement to be correlated. The results for several microlen…

PhotoelasticityFabricationMaterials sciencebusiness.industryMaterials Science (miscellaneous)Process (computing)Mechanical engineeringIndustrial and Manufacturing EngineeringLine (electrical engineering)law.inventionStress (mechanics)InterferometryOpticsOptical microscopelawBusiness and International ManagementbusinessRefractive indexApplied Optics
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Scanning optical microscopy modeling in nanoplasmonics

2012

International audience; One of the main purposes of nanoplasmonics is the miniaturization of optical and electro-optical components that could be integrable in coplanar geometry. In this context, we propose a numerical model of a polarized scanning optical microscope able to faithfully reproduce both photon luminescence and temperature distribution images associated with complex plasmonic structures. The images are computed, pixel by pixel, through a complete self-consistent scheme based on the Green dyadic functions (GDF) formalism. The basic principle consists in the numerical implementation of a realistic three-dimensional light beam acting as a virtual light tip able to probe the volume…

PhotonPhysics::Optics02 engineering and technologyNANOWIRESNANOSTRUCTURES01 natural scienceslaw.inventionGOLD NANORODSOpticsOptical microscopelaw0103 physical sciencesMiniaturizationLight beam010306 general physicsPlasmonPhysicsELECTROMAGNETIC DIFFRACTIONSURFACE-PLASMONbusiness.industryNear-field opticsMISMATCHED REFRACTIVE-INDEXESStatistical and Nonlinear Physics021001 nanoscience & nanotechnologyNEAR-FIELD MICROSCOPYAtomic and Molecular Physics and OpticsNETWORKSLIGHTOptoelectronicsNear-field scanning optical microscope0210 nano-technologybusinessLuminescencePLANAR INTERFACEJournal of the Optical Society of America B
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Chapter 1 The Resolution Challenge in 3D Optical Microscopy

2009

Publisher Summary This chapter discusses the theoretical principles of 3D microscopy with the widespread realizations of 3D microscopy.Based on the paraxial diffraction equations, it has been shown that conventional microscopes, when dealing with 3D fluorescent samples, provide sets of 2D images. These images of the different transverse sections of the 3D object contain, in addition to the sharp image of the in focus section, the blurred images of the rest of the specimen. The paraxial formalism has been generalized in a very simple way to a non-paraxial context, showing that the equations that govern non-paraxial imaging are similar to those that govern paraxial imaging. The only differenc…

Physics2d imagesFormalism (philosophy of mathematics)OpticsMicroscopeOptical microscopebusiness.industrylawParaxial approximationbusiness3d microscopyKirchhoff's diffraction formulalaw.invention
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Resolution enhancement in quantitative phase microscopy

2019

Quantitative phase microscopy (QPM), a technique combining phase imaging and microscopy, enables visualization of the 3D topography in reflective samples, as well as the inner structure or refractive index distribution of transparent and translucent samples. Similar to other imaging modalities, QPM is constrained by the conflict between numerical aperture (NA) and field of view (FOV): an imaging system with a low NA has to be employed to maintain a large FOV. This fact severely limits the resolution in QPM up to 0.82λ/NA, λ being the illumination wavelength. Consequently, finer structures of samples cannot be resolved by using modest NA objectives in QPM. Aimed to that, many approaches, suc…

PhysicsDiffractionbusiness.industryResolution (electron density)02 engineering and technology021001 nanoscience & nanotechnology01 natural sciencesAtomic and Molecular Physics and OpticsNumerical aperture010309 opticsSpeckle patternOptics0103 physical sciencesMicroscopyNear-field scanning optical microscope0210 nano-technologybusinessRefractive indexImage resolutionAdvances in Optics and Photonics
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Analysis of the imaging method for assessment of the smile of laser diode bars.

2009

We study imaging systems designed to assess the smile of laser diode bars (LDBs). The magnification matrix is derived from the required sampling period and the geometries of the LDBs and the charge-coupled device (CCD) array. These image-forming systems present in-plane pure translation invariance, but in the case of anamorphic ones, lack in-plane rotation invariance. It is shown that the smile parameters of the image of the LDB are linked with the smile parameters of the LDB by simple mathematical expressions. The spatial resolution of such optical systems is estimated at approximately 1 microm for a mean wavelength of lambda approximately 800 nm. Our results suggest that, with the current…

PhysicsLaser diodebusiness.industryMaterials Science (miscellaneous)Optical instrumentMagnificationIndustrial and Manufacturing Engineeringlaw.inventionWavelengthOpticslawDigital image processingNear-field scanning optical microscopeBusiness and International ManagementbusinessRotation (mathematics)Image resolutionApplied optics
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Physics of Near-Field Optical Images

2005

PhysicsOpticsComputer simulationOptical microscopelawAtomic force microscopybusiness.industryDetection theoryOptical polarizationNear and far fieldbusinessLithographylaw.inventionCLEO/Europe Conference on Lasers and Electro-Optics
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From Measurement to Control of Electromagnetic Waves using a Near‐field Scanning Optical Microscope

2013

PhysicsOpticsbusiness.industryOptoelectronicsNear-field scanning optical microscopeNear and far fieldbusinessElectromagnetic radiationMeasurements using Optic and RF Waves
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Simultaneous observation of light localization and confinement in near-field optics

2001

We report on the observation, in direct space, of both light localization and confinement effects near lithographically designed structures. The sample is observed in the optical near-field zone with a Photon Scanning Tunneling Microscope (PSTM). Several patterns composed of a few periods of TiO2 dots, arranged as a hexagonal lattice, have been investigated. When the central dot of the pattern is removed, a phenomenon of light localization above the vacancy can be observed in the PSTM image. The occurrence of this phenomenon can be related to the variation of the electromagnetic local density of state.

PhysicsPhotonbusiness.industryNear-field opticsGeneral Physics and AstronomyCondensed Matter::Mesoscopic Systems and Quantum Hall EffectSpace (mathematics)law.inventionOpticslawVacancy defectDensity of statesNear-field scanning optical microscopeHexagonal latticeScanning tunneling microscopebusinessEurophysics Letters (EPL)
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Quasi-isotropic 3-D resolution in two-photon scanning microscopy.

2009

One of the main challenges in three-dimensional microscopy is to overcome the lack of isotropy of the spatial resolution, which results from the axially-elongated shape of the point spread function. Such anisotropy gives rise to images in which significant axially-oriented structures of the sample are not resolved. In this paper we achieve an important improvement in z resolution in two-photon excitation microscopy through spatial modulation of the incident beam. Specifically, we demonstrate that the design and implementation of a simple shaded ring performs quasi-isotropic three-dimensional imaging and that the corresponding loss in luminosity can be easily compensated by most available fe…

PhysicsPoint spread functionbusiness.industryIsotropyResolution (electron density)Physics::OpticsAtomic and Molecular Physics and OpticsOpticsTwo-photon excitation microscopyMicroscopyFemtosecondNear-field scanning optical microscopebusinessImage resolutionOptics express
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Reduction of focus size in tightly focused linearly polarized beams

2004

The electromagnetic theory predicts that when a linearly polarized collimated field is focused by a high-angle focusing system, components perpendicular to the initial polarization are generated. The use of annular masks to reduce the area of the focal spot usually increases the magnitude of this phenomenon, known as depolarization. We present a class of masks, the three-ring masks, which are important because they narrow the central lobe of the focal intensity distribution without increasing the depolarization. This can be very useful in modern optical applications, such as confocal microscopy or multiphoton scanning microscopy.

PhysicsPolarized light microscopyPhysics and Astronomy (miscellaneous)Linear polarizationbusiness.industryDepolarizationPolarization (waves)Collimated lightlaw.inventionOpticsOptical microscopelawConfocal microscopyPerpendicularbusinessApplied Physics Letters
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