Search results for "Optoelectronics"

showing 10 items of 2306 documents

Heavy-ion induced single event effects and latent damages in SiC power MOSFETs

2022

The advantages of silicon carbide (SiC) power MOSFETs make this technology attractive for space, avionics and high-energy accelerator applications. However, the current commercial technologies are still susceptible to Single Event Effects (SEEs) and latent damages induced by the radiation environment. Two types of latent damage were experimentally observed in commercial SiC power MOSFETs exposed to heavy-ions. One is observed at bias voltages just below the degradation onset and it involves the gate oxide. The other damage type is observed at bias voltages below the Single Event Burnout (SEB) limit, and it is attributed to alterations of the SiC crystal-lattice. Focused ion beam (FIB) and s…

Materials scienceScanning electron microscopeRadiationFocused ion beamelektroniikkakomponentitIonSEEschemistry.chemical_compoundstomatognathic systempuolijohteetGate oxideSilicon carbideSiC MOSFETsHeavy-ionDetectors and Experimental TechniquesElectrical and Electronic EngineeringPower MOSFETSafety Risk Reliability and Qualitybusiness.industryionisoiva säteilyCondensed Matter PhysicsLatent damageAtomic and Molecular Physics and OpticsSurfaces Coatings and FilmsElectronic Optical and Magnetic MaterialssäteilyfysiikkachemistrytransistoritOptoelectronicsSiC MOSFETs; Heavy-ion; Latent damage; SEEsbusinessVoltageMicroelectronics Reliability
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Incident angle effect on heavy ion induced reverse leakage current in SiC Schottky diodes

2016

Heavy-ion induced degradation in the reverse leakage current of SiC Schottky power diodes shows distinct dependence on the angle of incidence. TCAD simulations have been used to study the physical mechanisms involved.

Materials scienceSchottky barrierchemistry.chemical_elementSchottky diodes01 natural sciencesIonpower semiconductor devicesReverse leakage currentchemistry.chemical_compoundXenonsilicon carbide0103 physical sciencesSilicon carbidecurrent-voltage characteristicsDiode010302 applied physicsta114ta213010308 nuclear & particles physicsbusiness.industrySchottky diodeAngle of incidencemodelingchemistryOptoelectronicsbusinession radiation effects
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Structural defects in Hg1−xCdxI2 layers grown on CdTe substrates by vapor phase epitaxy

1997

Hg1−xCdxI2 20–25-μm-thick layers with a uniform composition in the range of x = 0.1–0.2 were grown on CdTe substrates by vapor phase epitaxy (VPE). The growth was carried out using an α-HgI2 polycrystalline source at 200 °C and in the time range of 30–100 h. The layers were studied by scanning electron microscopy (SEM) and high resolution synchrotron x-ray topography (SXRT). The SEM and SXRT images of Hg1−xCdxI2 VPE layers allow one to identify the defects affecting the layer structure. The two main types of structural defects in the layers are subgrain boundaries and densely spaced striations similar to those referred generally to as vapor grown HgI2 bulk crystals. The effect of the growth…

Materials scienceSemiconductor MaterialsGrain BoundariesScanning electron microscopeVapor phaseGeneral Physics and AstronomyMercury Compounds ; Cadmium Compounds ; Semiconductor Materials ; Vapour Phase Epitaxial Growth ; Semiconductor Growth ; Semiconductor Epitaxial Layers ; Scanning Electron Microscopy ; X-Ray Topography ; Grain BoundariesEpitaxylaw.inventionlaw:FÍSICA [UNESCO]Cadmium CompoundsSemiconductor Epitaxial Layersbusiness.industryMercury CompoundsX-Ray TopographyUNESCO::FÍSICASynchrotronCadmium telluride photovoltaicsCrystallographySemiconductor GrowthOptoelectronicsVapour Phase Epitaxial GrowthGrain boundaryCrystalliteScanning Electron MicroscopybusinessLayer (electronics)
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Spectroscopic Properties of Holmium-Aluminum-Germanium Co-doped Silica Fiber

2020

We report the basic spectroscopic properties of a home-made holmium-aluminum-germanium co-doped silica fiber, designed for laser applications. We present the ground-state and excited-state absorpti...

Materials scienceSilica fiberAnalytical chemistryPhysics::Opticschemistry.chemical_elementGermanium02 engineering and technologyLaser01 natural sciencesAtomic and Molecular Physics and OpticsElectronic Optical and Magnetic Materialslaw.invention010309 opticsCondensed Matter::Materials Science020210 optoelectronics & photonicschemistryAluminiumlaw0103 physical sciences0202 electrical engineering electronic engineering information engineeringExcited state absorptionHolmiumCo dopedFiber and Integrated Optics
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Experimental investigation of Brillouin and Raman scattering in a 2SG sulfide glass microstructured chalcogenide fiber.

2008

International audience; In this work, we investigate the Brillouin and Raman scattering properties of a Ge15Sb20S65 chalcogenide glass microstructured single mode fiber around 1.55 microm. Through a fair comparison between a 2-m long chalcogenide fiber and a 7.9-km long classical single mode silica fiber, we have found a Brillouin and Raman gain coefficients 100 and 180 larger than fused silica, respectively.

Materials scienceSilica fiberLightChalcogenideChalcogenide glass02 engineering and technologySulfidesSpectrum Analysis Raman01 natural sciences010309 opticschemistry.chemical_compound020210 optoelectronics & photonicsOpticsDouble-clad fiberBrillouin scattering0103 physical sciences0202 electrical engineering electronic engineering information engineeringFiber Optic TechnologyScattering RadiationComputer Simulationbusiness.industryMicrostructured optical fiberEquipment Design[CHIM.MATE]Chemical Sciences/Material chemistryModels TheoreticalAtomic and Molecular Physics and OpticsEquipment Failure AnalysischemistryNonlinear Dynamics[ CHIM.MATE ] Chemical Sciences/Material chemistryChalcogensGlassbusinessHard-clad silica optical fiberPhotonic-crystal fiber
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Tb/s switching fabrics for optical interconnects using heterointegration of plasmonics and silicon photonics: The FP7 PLATON approach

2010

We present recent work that is carried out within the FP7 project PLATON on novel Tb/s switch fabric architectures and technologies for optical interconnect applications, employing heterointegration of plasmonics, silicon photonics and electronics.

Materials scienceSilicon photonicsSiliconbusiness.industryOptical interconnectchemistry.chemical_elementOptical switchMultiplexingchemistryHardware_INTEGRATEDCIRCUITSOptoelectronicsIntegrated opticsElectronicsbusinessPlasmon2010 IEEE Photinic Society's 23rd Annual Meeting
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Telecom to mid-infrared supercontinuum generation in a silicon germanium waveguide

2015

We report the first demonstration of broadband supercontinuum generation in silicon-germanium waveguides. Upon propagation of ultra-short femtosecond pulses in a 3-cm-long waveguide, the broadening extended from 1.455µm to 2.788µm (at the −30-dB point).

Materials scienceSilicon photonicsbusiness.industryMid infraredchemistry.chemical_elementWaveguide (optics)SupercontinuumSilicon-germaniumErbiumchemistry.chemical_compoundOpticschemistryBroadbandFemtosecondOptoelectronicsbusiness
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Optical propagation loss measurements in electro optical host-guest waveguides

2013

Thin organic waveguiding layers are applied more and more frequently as optical components in novel optoelectronic devices. For development of such devices it is important to know the optical properties of the used waveguides. One of the most important parameters is optical propagation loss in the waveguide. In this paper we present optical propagation loss measurements in planar electro optical waveguides using travelling fiber method. Using this method attenuation coefficient α at 633 nm as a function of chromophore concentration for the first two guiding modes in the slab waveguide was determined.

Materials scienceSilicon photonicsbusiness.industryPhysics::OpticsMicrostructured optical fiberChromophoreWaveguide (optics)PlanarOpticsAttenuation coefficientSlabOptoelectronicsFiberbusinessNonlinear Sciences::Pattern Formation and SolitonsSPIE Proceedings
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Colorimetric gas detection by the varying thickness of a thin film of ultrasmall PTSA-coated TiO2 nanoparticles on a Si substrate

2017

Financial support from the Estonian Research Council (IUT2-25, PUT170, PUT1096, PUT748, PUTJD680), the Estonian Centre of Excellence in Research Projects “Advanced materials and high-technology devices for sustainable energetics, sensorics and nanoelectronics” TK141 (2014-2020.4.01.15-0011), “Emerging orders in quantum and nanomaterials” TK134 and the Development Fund of the University of Tartu, are all gratefully acknowledged.

Materials scienceSiliconAnalytical chemistryGeneral Physics and Astronomychemistry.chemical_element02 engineering and technologySubstrate (electronics)engineering.material010402 general chemistrylcsh:Chemical technology01 natural scienceslcsh:TechnologyCoating:NATURAL SCIENCES:Physics [Research Subject Categories]General Materials Sciencelcsh:TP1-1185Electrical and Electronic EngineeringThin filmAbsorption (electromagnetic radiation)lcsh:ScienceOptical path lengthbusiness.industrylcsh:Tp-toluenesulfonic acid (PTSA)021001 nanoscience & nanotechnologylcsh:QC1-9990104 chemical scienceschemistryengineeringOptoelectronicslcsh:QNaked eye0210 nano-technologybusinessRefractive indexTiO2 nanoparticlescolorimetric gas sensinglcsh:PhysicsBeilstein Journal of Nanotechnology
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Carrier-induced quenching processes on the erbium luminescence in silicon nanocluster devices

2006

The luminescence-quenching processes limiting quantum efficiency in Er-doped silicon nanocluster light-emitting devices are investigated and identified. It is found that carrier injection, while needed to excite Er ions through electron-hole recombination, at the same time produces an efficient nonradiative Auger deexcitation with trapped carriers. This phenomenon is studied in detail and, on the basis of its understanding, we propose device structures in which sequential injection of electrons and holes can improve quantum efficiency by avoiding Auger processes. © 2006 The American Physical Society.

Materials scienceSiliconAstrophysics::High Energy Astrophysical Phenomenalight-emitting deviceschemistry.chemical_elementElectronElectroluminescenceSettore ING-INF/01 - ElettronicaSettore FIS/03 - Fisica Della MateriaAugerErbiumCondensed Matter::Materials ScienceELECTROLUMINESCENCEPhysics::Atomic and Molecular ClustersPhysics::Atomic PhysicsQuenchingOPTICAL GAINbusiness.industryCondensed Matter PhysicsElectronic Optical and Magnetic Materials1.54 MU-MchemistryOptoelectronicsQuantum efficiencySI NANOCRYSTALSENERGY-TRANSFERLuminescencebusinessPhysical Review B
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