Search results for "Probe"
showing 10 items of 534 documents
Near-field observation of evanescent light wave coupling in subwavelength optical waveguides
2002
International audience; We report the observation, in the range of visible frequencies, of the coupling of light into integrated waveguides of subwavelength cross-sections together with a subwavelength detection at the output, of such guides. Coupling in is produced by controlling the focusing of a laser beam totally reflected at the surface of the sample. Several tens of micrometres long dielectric ridges have been efficiently excited with this technique. The phenomenon is observed in direct space by a Photon Scanning Tunneling Microscope which also allows to test the principle of detection in a subwavelength volume.
Positron lifetime measurements on neutron‐irradiated InP crystals
1996
Neutron‐irradiated InP single crystals have been investigated by positron‐lifetime measurements. The samples were irradiated with thermal neutrons at different fluences yielding concentrations for Sn‐transmuted atoms between 2×1015 and 2×1018 cm−3. The lifetime spectra have been analyzed into one exponential decay component. The mean lifetimes show a monotonous increase with the irradiation dose from 246 to 282 ps. The increase in the lifetime has been associated to a defect containing an Indium vacancy. Thermal annealing at 550 °C reduces the lifetime until values closed to those obtained for the as‐grown and conventionally doped InP crystals. navarrof@evalvx.ific.uv.es ; Jose.Ferrero@uv.es
Forces between colloidal particles in aqueous solutions containing monovalent and multivalent ions
2017
The present article provides an overview of the recent progress in the direct force measurements between individual pairs of colloidal particles in aqueous salt solutions. Results obtained by two different techniques are being highlighted, namely with the atomic force microscope (AFM) and optical tweezers. One finds that the classical theory of Derjaguin, Landau, Verwey, and Overbeek (DLVO) represents an accurate description of the force profiles even in the presence of multivalent ions, typically down to distances of few nanometers. However, the corresponding Hamaker constants and diffuse layer potentials must be extracted from the force profiles. At low salt concentrations, double layer f…
Ultrathin metal films and inorganic clusters via thermodesorption of LB films
1991
Langmuir-Blodgett multilayers of cadmium arachidate and ferric stearate were investigated during heating in order to derive information on processes involved in thermodesorption and on the inorganic microstructures left on the substrate after thermodesorption. We studied these processes by X-ray induced photoelectron spectroscopy (XPS), interference enhanced reflection (IeR), Nomarsky microscopy, electron microprobe analysis and in the case of Fe57-ions by conversion electron Mossbauer spectroscopy (CEMS). Two different mechanisms of desorption were observed. In the case of cadmium arachidate multilayers it is shown that before desorption the film ruptures laterally and then forms droplets.…
Incremental lines in root cementum of human teeth: an approach to their ultrastructural nature by microscopy.
1998
In ground sections of human teeth, root cementum shows under the light microscope as alternating, almost concentric, dark and light rings. In paleontology and forensic medicine, the number of these incremental lines or annulations is used to derive the age-at-death of the individual. To find the ultrastructural features underlying these cemental annulations, we used bright-field light microscopy (LM), confocal laser scanning microscopy (CLSM), transmission electron microscopy (TEM), and electron-dispersive x-radiation (EDX) in a scanning electron microscope (SEM). Annulations visible in ground sections of about 100-μm thickness were no longer visible in semi-thin sections (thickness, 1-2 μ…
Atomic Force Microscopy and Spectroscopy
2021
Atomic force microscopy (AFM) is probably the most celebrated technique falling into the family of experimental methods known as scanning probe microscopy. AFM is primarily designed to obtain the morphology of the surface of a solid material by using the force of interaction between an inert probe and the sample. The AFM microscope can generally be operated in many ways for morphology investigations, but they can be roughly classified into two main groups: static- and dynamic-deflection modes. Since atomic force microscopy makes use of tip-surface interaction to reconstruct the surface morphology of materials, it is of fundamental importance to fully understand the nature and properties of …
Strain relaxation, extended defects and doping effects in InxGa1-xN/GaN heterostructures investigated by surface photovoltage
2020
Abstract We have analysed electrical properties of extended defects and interfaces in fully strained and partially relaxed InxGa1-xN/GaN heterostructures by means of Kelvin probe force microscopy and surface photovoltage spectroscopy. The study highlights the role of indium incorporation and Si doping levels on the charge state of extended defects including threading dislocations, V defects and misfit dislocations. Surface potential maps reveal that these defects are associated with a different local work function and thus could remarkably alter electron-hole recombination mechanisms of InxGa1-xN/GaN layers locally. Surface photovoltage spectra clearly demonstrate the role of misfit disloca…
Imaging of photonic nanopatterns by scanning near-field optical microscopy
2002
We define photonic nanopatterns of a sample as images recorded by scanning near-field optical microscopy with a locally excited electric dipole as a probe. This photonic nanopattern can be calculated by use of the Green’s dyadic technique. Here, we show that scanning near-field optical microscopy images of well-defined gold triangles taken with the tetrahedral tip as a probe show a close similarity to the photonic nanopattern of this nanostructure with an electric dipole at a distance of 15 nm to the sample and tilted 45° with respect to the scanning plane.
Probing large area surface plasmon interference in thin metal films using photon scanning tunneling microscopy.
2003
Abstract The interference of surface plasmons can provide important information regarding the surface features of the hosting thin metal film. We present an investigation of the interference of optically excited surface plasmons in the Kretschmann configuration in the visible spectrum. Large area surface plasmon interference regions are generated at several wavelengths and imaged with the photon scanning tunneling microscope. Furthermore, we discuss the non-retarded dispersion relations for the surface plasmons in the probe–metal system modeled as confocal hyperboloids of revolution in the spheroidal coordinate systems.
Curvature effects in surface plasmon dispersion and coupling
2005
We have studied the resonant coupling of surface plasmons in curved thin-film tunneling geometries by obtaining the dispersion relations for the system. The surface plasmon dispersion relations are calculated for a metal-coated dielectric probe above a dielectric half space with and without metal coating. The system is modeled in the prolate spheroidal system, and the dispersion relations are studied as functions of the parameter that defines the boundaries of the tip and the corresponding coating, and as functions of the involved coating thicknesses. Using this type of probe-substrate configuration, the nonradiative surface plasmon coupling mechanism is investigated in the visible spectrum…