Search results for "RADIATION"
showing 10 items of 5298 documents
Wavelet data analysis of EXAFS spectra
2009
Abstract The application of wavelet transform to the analysis of the extended X-ray absorption fine structure (EXAFS) from perovskite-type compounds is presented on the example of the Re L 3 -edge in ReO 3 and Co K-edge in LaCoO 3 . We propose a modified wavelet transform procedure, which allows better discrimination of the overlapped contributions into the EXAFS signal.
Chemical microimaging and microspectroscopy of surfaces with a photoemission microscope
1997
We applied element sensitive photoemission electron microscopy (PEEM) to investigate surfaces of devices built from complex materials. Conventional PEEM suffers from lack of information about the chemical composition of the imaged surface. Such information can be obtained by PEEM via tuning the photon energy to X-ray absorption edges. To apply spectromicroscopy we acquired and subtracted microscopic images using photon energies just below and at the edges. The resulting difference gives a micro-image of the lateral distribution of a specific element. Microspectroscopy is performed by recording the intensity of secondary electrons in selected spots during a sweep of the photon energy. We app…
<title>Iridium L<formula><inf><roman>3</roman></inf></formula>-edge and oxygen K-edge x-ray absorption spec…
2003
Structural investigations of the short range order around iridium and oxygen ions in nanocrystalline iridium oxide thin films, prepared by dc magnetron sputtering technique, were performed by x-ray absorption spectroscopy. The Ir L3-edge extended x-ray absorption fine structure and the O K-edge x-ray absorption near edge structure signals were measured at room temperature and analyzed within ab initio multiple-scattering and full-multiple-scattering approaches, respectively. The x-ray absorption spectroscopy results indicate the presence in the films of orderd regions - nanocrystals, having a size of about 10 angstrom and a structure rather close to that in crystalline iridium oxide IrO2. S…
High-pressure x-ray absorption spectroscopy study of tin tungstates
2015
Room-temperature pressure-dependent (0-25 GPa) x-ray absorption spectroscopy at the W -edges of α-SnWO4 and β-SnWO4 was performed using a dispersive setup and a high-pressure nanodiamond anvil cell. The detailed analysis of experimental x-ray absorption near-edge structure and extended x-ray absorption fine structure data suggests that upon increasing pressure, a displacement of tungsten atoms by about 0.2 A toward the center of the WO6 octahedra occurs in α-SnWO4, whereas the coordination of tungsten atoms changes from tetrahedral to distorted octahedral in β-SnWO4.
Broadband observations of the X-ray burster 4U1705-44 with Beppo SAX
2016
4U 1705-44 is one of the most-studied type I X-ray burster and Atoll sources. This source represents a perfect candidate to test different models proposed to self-consistently track the physical changes occurring between different spectral states because it shows clear spectral state transitions. The broadband coverage, the sensitivity and energy resolution of the BeppoSAX satellite offers the opportunity to disentangle the components that form the total X-ray spectrum and to study their changes according to the spectral state. Using two BeppoSAX observations carried out in August and October 2000, respectively, for a total effective exposure time of about 100 ks, we study the spectral evol…
High-Z Materials for X-ray Detection: Material Properties and Characterization Techniques
2023
This book will provide readers with a good overview of some of most recent advances in the field of High-Z materials. There will be a good mixture of general chapters in both technology and applications in opto-electronics, X-ray detection and emerging optoelectronics applications. The book will have an in-depth review of the research topics from world-leading specialists in the field.
The polarization dependence of x‐ray photoelectron yield of a Au photocathode
1994
We report a measurement of the total photoelectron yield of gold as a function of the incident x‐ray polarization. Polarized x rays with energies of 2.5, 2.7, and 4.0 keV were used to excite a gold photocathode at a glancing incidence angle between 5° and 50°. Contrary to a previous report, we found no measurable polarization dependence for all three x‐ray energies. We conclude that the modulation factor, i.e., the fractional change of the total yield when the polarization state is varied, is less than 4%.
Local structure studies of SrTi16O3and SrTi18O3
2014
In this work we report on the local structure of Ti in SrTi 16 O3 (STO16) and SrTi 18 O3 (STO18) investigated in the low temperature range (6‐300K) by extended x-ray absorption fine structure and x-ray absorption near edge structure (XANES) spectroscopy at Ti K-edge and by optical second harmonic generation (SHG). By comparing XANES of STO16 and STO18 we have identified the isotopic effect which produces at T < 100K a noticeable difference in the measured mean square relative displacements (MSRD) of Ti‐O1 bonds: while STO16 follow the expected Einstein-like behavior, for STO18 we have measured an increase of MSRD values with decreasing temperature. This is an indication of an increasing off…
Quantitative molecular plating of large-area 242Pu targets with improved layer properties
2015
Abstract For measurements of the neutron-induced fission cross section of 242Pu, large-area (42 cm2) 242Pu targets were prepared on Ti-coated Si wafers by means of constant current density molecular plating. Radiochemical separations were performed prior to the platings. Quantitative deposition yields (>95%) were determined for all targets by means of alpha-particle spectroscopy. Layer densities in the range of 100–150 μg/cm2 were obtained. The homogeneity of the targets was studied by radiographic imaging. A comparative study between the quality of the layers produced on the Ti-coated Si wafers and the quality of layers grown on normal Ti foils was carried out by applying scanning electron…
Using photoelectron emission microscopy with hard-X-rays
2001
We present several successful test cases of using photoelectron emission microscopy (PEEM) for photon energy up to 25 keV. First, the full extended X-ray absorption fine structure analysis was implemented in areas as small as 100 mum(2) for transition-metal K edge absorption spectra and, therefore, demonstrated the feasibility of combining structural and chemical analysis with hard-X-ray absorption spectroscopy with high lateral resolution. We also show that PEEM can be used in a transmission (radiography) mode as an imaging detector for hard-X-ray, This approach again leads to the unprecedented 0.3 mum lateral resolution, particularly critical for the use of coherence-based phase contrast …