Search results for "Scale integration"

showing 3 items of 23 documents

Spatial correction in dynamic photon emission by affine transformation matrix estimation

2014

International audience; Photon emission microscopy and Time Resolved Imaging have proved their efficiency for defect localization on VLSI. A common process to find defect candidate locations is to draw a comparison between acquisitions on a normally working device and a faulty one. In order to be accurate and meaningful, this method requires that the acquisition scene remains the same between the two parts. In practice, it can be difficult to set. In this paper, a method to correct position by affine matrix transformation is suggested. It is based on image features detection, description and matching and affine transformation estimation.

[ INFO.INFO-TS ] Computer Science [cs]/Signal and Image ProcessingMatching (graph theory)Computer science[INFO.INFO-TS] Computer Science [cs]/Signal and Image Processing[SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics02 engineering and technology[ SPI.SIGNAL ] Engineering Sciences [physics]/Signal and Image processing[INFO.INFO-TS]Computer Science [cs]/Signal and Image ProcessingPosition (vector)020204 information systems0202 electrical engineering electronic engineering information engineeringComputer vision[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics[SPI.SIGNAL] Engineering Sciences [physics]/Signal and Image processingVery-large-scale integrationHarris affine region detectorbusiness.industryProcess (computing)Affine shape adaptationTransformation (function)020201 artificial intelligence & image processing[ SPI.NANO ] Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsArtificial intelligenceAffine transformationbusiness[SPI.SIGNAL]Engineering Sciences [physics]/Signal and Image processing
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Cluster matching in time resolved imaging for VLSI analysis

2014

International audience; If scaling has the benefit of enabling manufacturers to design tomorrow's integrated circuits, from the failure analyst point of view it also has the drawback of making devices more complex. The test sequence for modern VLSI can be quite long, with thousands of vector. Dynamic photon emission databases can contain millions of photons representing thousands of state changes in the region of interest. Finding a candidate location where to perform physical analysis is quite challenging, especially if the fault occurs on a single vector. In this paper, we suggest a new methodology to find single vector fault in dynamic photon emission database. The process is applied at …

[ INFO.INFO-TS ] Computer Science [cs]/Signal and Image ProcessingMatching (graph theory)[INFO.INFO-TS] Computer Science [cs]/Signal and Image ProcessingComputer science[SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics[ SPI.SIGNAL ] Engineering Sciences [physics]/Signal and Image processing02 engineering and technologyIntegrated circuitFault (power engineering)computer.software_genre01 natural sciencesk-nearest neighbors algorithmlaw.invention[INFO.INFO-TS]Computer Science [cs]/Signal and Image Processinglaw0103 physical sciences0202 electrical engineering electronic engineering information engineeringPoint (geometry)[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsCluster analysisComputer Science::Databases[SPI.SIGNAL] Engineering Sciences [physics]/Signal and Image processing010302 applied physicsVery-large-scale integrationProcess (computing)Computer engineering[ SPI.NANO ] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics020201 artificial intelligence & image processingData mining[SPI.SIGNAL]Engineering Sciences [physics]/Signal and Image processingcomputerProceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
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Scheduling under the network of temporo-spatial proximity relationships

2017

We discuss and introduce to the schedulingeld a novel, qualitative optimization model - scheduling under the network of temporo-spatial proximity relationships.We introduce a half perimeter proximity measure as an objective of scheduling.We present and evaluate an incremental Sequence Pair neighborhood evaluation algorithm, applicable to both scheduling and rectangle packing problems in VLSI industry. In this paper, we discuss and introduce to the scheduling field a novel optimization objective - half perimeter proximity measure in scheduling under the network of temporo-spatial proximity relationships. The presented approach enables to qualitatively express various reasons of scheduling ce…

proximity relationshipsMathematical optimizationGeneral Computer Sciencerectangle packing problemEvaluation algorithm0102 computer and information sciences02 engineering and technologyIntegrated circuitManagement Science and Operations Research01 natural scienceslaw.inventionScheduling (computing)lawApproximation error0202 electrical engineering electronic engineering information engineeringschedulingComputer Science::Operating SystemsMathematicsVery-large-scale integrationProximity measureneighborhood evaluation010201 computation theory & mathematicsModeling and Simulation020201 artificial intelligence & image processingsequence pairRectangle packingComputers & Operations Research
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