Search results for "Scanning probe microscopy"

Imaging of surface plasmon propagation and edge interaction using a photon scanning tunneling microscope

1994

We report the direct imaging of surface plasmon propagation on thin silver films using the photon scanning tunneling microscope. It is found that the surface plasmon remains tightly confined in the original launch direction with insignificant scattering to other momentum states. A propagation length of 13.2 \ensuremath{\mu}m is measured at \ensuremath{\lambda}=632.8 nm. We also present images showing the interaction of a surface plasmon with the edge of the metal film supporting it. The most remarkable feature is the absence of specularly reflected beam.

A computer controlled patterning system for scanning probe microscopes

1999

Abstract A pattern generator system for lithography based on scanning force microscopes has been developed. Patterns to be miniaturized onto a chip can be scanned or drawn by any common graphical program. The pattern file is used to control a voltage simultaneously with the microscope probe scanning the surface of the substrate. The voltage can be used in numerous different ways to manipulate the substrate, depending on the lithographic method preferred. We have demonstrated the system by adding this voltage to the z -piezo voltage of the scanner, in order to make the probe plow the pattern into a film spinned on the sample. To maintain linearity in zooming in and rotating the scanning dire…

<title>Scanning probe microscopy of nanocrystalline iridium oxide thin films</title>

2003

Structural investigations of nanocrystalline iridium oxide thin films, prepared by dc magnetron sputtering technique were performed by scanning probe microscopy (SPM). SPM studies, using both atomic force microscopy (AFM) and scanning tunnelling microscopy (STM), indicate that the thin films are composed of grains with a size of about 20-50 nm. Fine crystallinity and small RMS microroughness of the films, being well below 2 nm, make iridium oxide thin films promising candidates for nanolithographic applications. The possibility to perform nanolithograhpic processes at a scale of less than 150 nm was successfully examined in AFM and STM modes.© (2003) COPYRIGHT SPIE--The International Societ…

Watching Ions Move: Scanning Probe Microscopy on Perovskite Solar Cells

2018

Photon Scanning Tunneling Microscopy and Reflection Scanning Microscopy

1991

The Photon Scanning Tunneling Microscope (PSTM) is the photon analogue to the Electron Scanning Tunneling Microscope (ESTM). It uses the evanescent field due to the total internal reflection (TIR) of a light beam in a prism modulated by a sample attached to the prism. The exponential decay of the evanescent field is characterized by the penetration depth dp and depends on the angle of incidence θ, the wavelength and polarization of the incident beam. Changes in intensity are monitored by a probe tip scanned over the surface, and the data are processed to generate an image of the sample. Images produced by a prototype instrument are shown to have a vertical resolution of about 3 A and a late…

Resolution of the photon scanning tunneling microscope: influence of physical parameters

1992

Abstract The photon scanning tunneling microscope (PSTM) is the photon analogue of the electron scanning tunneling microscope (ESTM). It uses the evanescent field due to total internal reflection (TIR) of a light beam in a prism modulated by a sample placed on the base of the prism. Our experimental results shown details which present a lateral size as small as 200 A. The PSTM axial resolution is more difficult to evaluate. It is a function of the roughness of the sample. For very smooth samples, images shown an axial resolution of about 10 A. At last we discuss how both lateral and axial resolution can be affected by several parameters such as the tip surface distance and the roughness of …

Near-field observation of subwavelength confinement of photoluminescence by a photonic crystal microcavity

2006

We present a direct, room-temperature near-field optical study of light confinement by a subwavelength defect microcavity in a photonic crystal slab containing quantum-well sources. The observations are compared with three-dimensional finite-difference time-domain calculations, and excellent agreement is found. Moreover, we use a subwavelength cavity to study the influence of a near-field probe on the imaging of localized optical modes. © 2006 Optical Society of America.

International Scanning Probe Microscopy Conference

2016

International audience

SPM and TOF-SIMS investigation of the physical and chemical modification induced by tip writing of self-assembled monolayers

2003

Abstract The nanoelectrochemical modification of alkyl self-assembled monolayers (SAMs) obtained on hydrogenated silicon surfaces via radical-initiated reactions of 1-octadecene has been investigated. Scanning Probe Microscopy (SPM) showed that the modification of the organic layer occurs by applying either positive or negative biases to the tip at a threshold of about ±5 V. When the bias absolute value was ≤6 V, the height of the monolayer was only faintly modified, whereas a consistent increase in tip/sample friction force was observed, in agreement with the formation of hydrophilic moieties at the organic surface. In addition to the increase of friction, bias absolute values larger than …