Search results for "Scanning"

showing 10 items of 1808 documents

Ab Initio Structure Determination of Vaterite by Automated Electron Diffraction

2012

tion that is fundamental for understanding material properties. Still, a number of compounds have eluded such kinds of analysis because they are nanocrystalline, highly disordered, with strong pseudosymmetries or available only in small amounts in polyphasic or polymorphic systems. These materials are crystallographically intractable with conventional Xray or synchrotron radiation diffraction techniques. Single nanoparticles can be visualized by high-resolution transmission electron microscopy (HR-TEM) up to sub�ngstrom resolution, [2] but obtaining 3D information is still a difficult task, especially for highly beam-sensitive materials and crystal structures with long cell parameters. Elec…

DiffractionReflection high-energy electron diffractionmetastable phaseElectron crystallographyChemistryResolution (electron density)Analytical chemistrybiomineralization; calcium carbonate; electron crystallography; metastable phase; structure determinationElectronsGeneral ChemistrybiomineralizationCatalysisNanocrystalline materialstructure determinationAutomationCrystallographyelectron crystallographyX-Ray DiffractionElectron diffractionMicroscopy Electron ScanningNanoparticlescalcium carbonateAntacidsPowder diffractionElectron backscatter diffraction
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Vapor growth of Hg1−xCdxI2 on glass using CdTe buffer

2001

Abstract Vapor phase epitaxy (VPE) of Hg1−xCdxI2 layers on glass substrates covered by a CdTe buffer layer has been studied. The buffer layers of 2–4 μm thickness were formed by VPE using polycrystalline CdTe and Cd metal sources. The Hg1−xCdxI2 layers were grown using a (Hg1−yCdy)1−z(I2)z polycrystalline source, with a composition in the range of y=0.1–0.5 and z=0.5–0.8. Scanning electron microscopy and X-ray diffraction studies have shown that the composition and structure of Hg1−xCdxI2 layers depend strongly on the VPE conditions. Varying the growth time and source composition, it has been possible to obtain Hg1−xCdxI2 layers with the composition x in the range from approximately 0 (HgI2…

DiffractionScanning electron microscopeChemistrybusiness.industryMetals and AlloysAnalytical chemistrySurfaces and InterfacesEpitaxyCadmium telluride photovoltaicsSurfaces Coatings and FilmsElectronic Optical and Magnetic MaterialsMetalTetragonal crystal systemOpticsvisual_artMaterials Chemistryvisual_art.visual_art_mediumCrystallitebusinessLayer (electronics)Thin Solid Films
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X-ray diffraction line broadening on vibrating dry-milled Two Crows sepiolite

2006

A reference sample of sepiolite and products of its comminution by vibrating dry-milling have been studied using X-ray diffraction (XRD) line-broadening analysis, complementary field emission scanning electron microscopy (FESEM) images and surface area measurements. The apparent crystallite sizes determined via XRD are in agreement with observations on FESEM images. The sepiolite aggregates consist of lath-shaped agglutinations of prisms and pinacoids elongated along [001], each lath including several crystallites in that direction. The surface area magnitudes are in the range of previous experimental measurements of other sepiolites. The results obtained show the effectiveness of vibro-mil…

DiffractionScanning electron microscopeCrystalline Lattice StrainSepioliteAnalytical chemistrySoil ScienceMineralogyLathengineering.materialchemistry.chemical_compoundReference ClayGeochemistry and PetrologyNevada SepioliteEarth and Planetary Sciences (miscellaneous)Crystallite SizeWater Science and TechnologySepioliteX-ray DiffractionLine BroadeningSurface AreaSilicatechemistryX-ray crystallographyengineeringCrystalliteComminutionGeologyClays and Clay Minerals
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Investigation of Silicon Carbide Polytypes by Raman Spectroscopy

2014

Abstract Polytypes of colourless and coloured single crystals of silicon carbide (SiC) grown on SiC substrates by chemical vapour deposition are studied using Raman spectroscopy supplemented by scanning electron microscopy (SEM) and X-ray diffraction (XRD) analyses. The SEM analysis of the defect stacking faults, inclusions of defects and their distribution has shown that they correlate with the peak positions of the obtained Raman spectra and with the XRD data on the crystal structure

DiffractionScanning electron microscopePhysicsQC1-999General EngineeringStackingAnalytical chemistryGeneral Physics and AstronomySem analysisChemical vapor depositionCrystal structurex-ray diffraction (xrd)silicon carbide (sic)symbols.namesakechemistry.chemical_compoundraman spectroscopychemistrysymbolsSilicon carbidepolytypesRaman spectroscopyLatvian Journal of Physics and Technical Sciences
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Investigation of AC Electrical Properties of MXene-PCL Nanocomposites for Application in Small and Medium Power Generation

2021

The paper examined Ti3C2Tx MXene (T—OH, Cl or F), which is prepared by etching a layered ternary carbide Ti3AlC2 (312 MAX-phase) precursor and deposited on a polycaprolactone (PCL) electrospun membrane (MXene-PCL nanocomposite). X-ray Diffraction analysis (XRD) and Scanning Electron Microscopy (SEM) indicates that the obtained material is pure Ti3C2 MXene. SEM of the PCL-MXene composite demonstrate random Ti3C2 distribution over the nanoporous membrane. Results of capacitance, inductance, and phase shift angle studies of the MXene-PCL nanocomposite are presented. It was found that the frequency dependence of the capacitance exhibited a clear sharp minima in the frequency range of 50 Hz to o…

DiffractionTechnologyControl and OptimizationNanocompositeMaterials scienceRenewable Energy Sustainability and the EnvironmentScanning electron microscopeTEnergy Engineering and Power TechnologyMXene-PCL nanocompositesElectronflexible electronicsCapacitanceMolecular physicsInductanceAmplitudeelectrical propertiesElectrical and Electronic EngineeringMXeneTernary operationEngineering (miscellaneous)small and medium power generationEnergy (miscellaneous)Energies
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Determinant role of the edges in defining surface plasmon propagation in stripe waveguides and tapered concentrators

2012

International audience; In this paper, we experimentally show the effect of waveguide discontinuity on the propagation of the surface plasmon in metal stripes and tapered terminations. Dual-plane leakage microscopy and near-field microscopy were performed on Au stripes with varied widths to imag29e the surface plasmon intensity distribution in real and reciprocal spaces. We unambiguously demonstrate that edge diffraction is the limiting process determining the cutoff conditions of the surface plasmon mode. Finally, we determine the optimal tapered geometry leading to the highest transmission.

DiffractionTotal internal reflectionMaterials sciencebusiness.industrySurface plasmonNanophotonicsPhysics::OpticsStatistical and Nonlinear Physics02 engineering and technology021001 nanoscience & nanotechnology01 natural sciencesSurface plasmon polaritonAtomic and Molecular Physics and Opticslaw.inventionOpticslaw0103 physical sciencesNear-field scanning optical microscope[ SPI.NANO ] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics010306 general physics0210 nano-technologybusinessWaveguideLocalized surface plasmon
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Phase separation as a key to a thermoelectric high efficiency

2012

This work elucidates the possible reasons for the outstanding, but never reproduced thermoelectric properties of the doped Ti(0.5)Zr(0.25)Hf(0.25)NiSn Heusler compounds. The structural investigations done via synchrotron X-ray diffraction measurements and scanning electron microscope measurements, which clearly show that the microstructure consists of three temperature stable C1(b) phases with possible semi-coherent interfaces, are presented. The exceptional thermoelectric properties are due to this intrinsic phase separation. It is possible to reproduce the high Figure of Merit values with ZT = 1.2 at 830 K. Furthermore, the influence of doping different elements on the Sn position in this…

DiffractionWork (thermodynamics)Materials scienceCondensed matter physicsScanning electron microscopeDopingGeneral Physics and AstronomyMicrostructureSynchrotronlaw.inventionCrystallographylawThermoelectric effectFigure of meritPhysical and Theoretical ChemistryPhys. Chem. Chem. Phys.
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Structural, microstructural and impedance spectroscopy study of functional ferroelectric ceramic materials based on barium titanate

2013

The differences between the physical properties of barium titanate BaTiO3 and newly obtained BaHfxTi1-xO3 were identified. These ceramics were prepared by solid-phase reaction from simple oxides and carbonates using the conventional method. The structure and morphology of investigated samples were characterised by X-ray diffraction (XRD) and scanning electron microscopy (SEM). The application of impedance spectroscopy made possible to characterize of these materials in the terms of electrical properties.

Diffractionchemistry.chemical_compoundMaterials sciencechemistryScanning electron microscopevisual_artBarium titanatevisual_art.visual_art_mediumMineralogyCeramicComposite materialFerroelectricityDielectric spectroscopyIOP Conference Series: Materials Science and Engineering
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Microscopic evidence of a flat melting curve of tantalum

2010

International audience; New data on the high-pressure melting curve of Ta up to 48GPa are reported. Evidence of melting from changes in sample texture was found in five different experiments using scanning electron microscopy. The obtained melting temperatures are in excellent agreement with earlier measurements using x-ray diffraction or the laser-speckled method but are in contrast with several theoretical calculations. The results are also compared with shock-wave data. These findings are of geophysical relevance because they confirm the validity of earlier experimental techniques that resulted in low melting slopes of the transition metals measured in the diamond-anvil cell, including i…

Diffractionlaser-heatingMaterials sciencehigh-pressurePhysics and Astronomy (miscellaneous)Scanning electron microscope62.50.-p64.70.djTantalumAnalytical chemistrychemistry.chemical_element02 engineering and technology01 natural sciencesdiamond-anvil cellDiamond anvil cellMelting curve analysistransition metalsTransition metal0103 physical sciencesTexture (crystalline)010306 general physics62.50.EfAstronomy and Astrophysics021001 nanoscience & nanotechnologyCrystallographyGeophysicsmelting curvechemistrySpace and Planetary Science0210 nano-technologyMelting-point depression
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Differential scanning calorimetry investigation of phase transition in $BaZr_{x}Ti_{1-x}O_{3}$

2009

ABSTRACT Lead-free BaZrxTi1-xO3 (x = 0; 0.025; 0.125) ceramics have been obtained by a conventional method. A single-phase perovskite structure of the ceramics was identified by the X-ray diffraction method. EDS analysis, performed for the individual grains of the tested sample, showed a good homogeneous distribution of all elements throughout the grains. The thermal behaviour of BaZrxTi1-xO3 (x = 0; 0.025; 0.125) ceramics was studied using the Differential Scanning Calorimetry (DSC). Measurements showed the influence of Zr addition on the character of phase transition in the BaTiO3 structure. The results were compared with these ones obtained for pure BaTiO3.

Diffractionstructural propertiesPhase transitionMaterials scienceAnalytical chemistryDielectricCondensed Matter PhysicsHomogeneous distributionElectronic Optical and Magnetic MaterialsDSCDifferential scanning calorimetrybarium-zirconium titanate $BaZr_{x}Ti_{1-x}O_{3}$ (BZT)Control and Systems Engineeringdielectric propertiesvisual_artThermalMaterials ChemistryCeramics and Compositesvisual_art.visual_art_mediumCeramicElectrical and Electronic Engineering
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