Search results for "TRANSMISSION ELECTRON"

Preparation and characterisation of Ce:YAG -polycarbonate composites for white LED

2016

Ce:YAG-polycarbonate composites were prepared with several amounts of Ce:YAG in the range 0.1-5 wt.% by using melt compounding. The structure and morphology of the composites were investigated by means of X-ray diffractometry and transmission electron microscopy. The optical properties of the composites were studied by using photoluminescence spectroscopy. The intermolecular interaction between the polymer and the filler surface was investigated using 13C cross-polarization magic-angle spinning NMR spectroscopy (13C {1H} CP-MAS NMR). The results showed that the dispersion of the particles in the polymer, and the optical properties, depend on the Ce:YAG amount. The composites were combined w…

Probing Physical Properties of Confined Fluids within Individual Nanobubbles

2008

Spatially resolved electron energy-loss spectroscopy (EELS) in a scanning transmission electron microscope (STEM) has been used to investigate as fluidic phase in nanoubbles embedded in a metallic Pd90Pt10 matrix. Using the 1s->2p excitation of the He atoms, maps of the He distribution, in particular of its density an pressure in bubbles of different diameter have been realized, thus providing an indication of the involved bubble formation mechanism. However, the short-range Pauli repulsion mechanism between electrons on neighboring atoms seems insufficient to interpret minute variations of the local local measurements performed at the interface between the metal and the He bubble. Simul…

A Scanning Electron Microscope for Ultracold Atoms

2006

We propose a new technique for the detection of single atoms in ultracold quantum gases. The technique is based on scanning electron microscopy and employs the electron impact ionization of trapped atoms with a focussed electron probe. Subsequent detection of the resulting ions allows for the reconstruction of the atoms position. This technique is expected to achieve a much better spatial resolution compared to any optical detection method. In combination with the sensitivity to single atoms, it makes new in situ measurements of atomic correlations possible. The detection principle is also well suited for the addressing of individual sites in optical lattices.

Compact, cost-effective and field-portable microscope prototype based on MISHELF microscopy

2016

AbstractWe report on a reduced cost, portable and compact prototype design of lensless holographic microscope with an illumination/detection scheme based on wavelength multiplexing, working with single hologram acquisition and using a fast convergence algorithm for image processing. All together, MISHELF (initials coming from Multi-Illumination Single-Holographic-Exposure Lensless Fresnel) microscopy allows the recording of three Fresnel domain diffraction patterns in a single camera snap-shot incoming from illuminating the sample with three coherent lights at once. Previous implementations have proposed an illumination/detection procedure based on a tuned (illumination wavelengths centered…

Peculiarities of imaging one- and two-dimensional structures in an emission electron microscope. 1. theory

2000

Local changes in work function cause deviations of the electrical microfield near a sample surface as a result of the uniform accelerating field distribution between the sample (cathode) and the extractor electrode (anode). This results in a change in the electron trajectories. As a consequence, the microscope image shows remarkable changes in position, size, intensity and lateral resolution of distinct details, which can be quantitatively described by the calculations presented here. Analysing these effects in the image gives an opportunity to determine the real lateral size of the observed structures and the distribution of local contact potentials.

Probing of nanocontacts inside a transmission electron microscope

2007

In the past twenty years, powerful tools such as atomic force microscopy have made it possible to accurately investigate the phenomena of friction and wear, down to the nanometer scale. Readers of this book will become familiar with the concepts and techniques of nanotribology, explained by an international team of scientists and engineers, actively involved and with long experience in this field. Edited by two pioneers in the field, 'Fundamentals of Frictions and Wear at the Nanoscale' is suitable both as first introduction to this fascinating subject, and also as a reference for researchers wishing to improve their knowledge of nanotribology and to keep up with the latest results in this …

Spatially-multiplexed interferometric microscopy (SMIM): converting a standard microscope into a holographic one

2014

We report on an extremely simple, low cost and highly stable way to convert a standard microscope into a holographic one. The proposed architecture is based on a common-path interferometric layout where the input plane is spatially-multiplexed to allow reference beam transmission in a common light-path with the imaging branch. As consequence, the field of view provided by the layout is reduced. The use of coherent illumination (instead of the broadband one included in the microscope) and a properly placed one-dimensional diffraction grating (needed for the holographic recording) complete the experimental layout. The proposed update is experimentally validated in a regular Olympus BX-60 upri…

Dopant Contrast in Semiconductors as Interpretation Challenge at Imaging by Electrons

2007

Mechanisms responsible for the contrast between differently doped areas in semiconductors, which is observed in electron micrographs, is discussed as regards the key factors determining the sign and magnitude of the contrast. Experimental data obtained by means of the scanning electron microscope (SEM), scanning low energy electron microscope and photoelectron emission microscope are reviewed together with hints following from them for compilation of a model of the contrast mechanism.

The future of transmission electron microscopy (TEM) in biology and medicine.

2000

1996

The uses of atomic force microscopy, scanning tunneling microscopy, electron spectroscopic imaging, electron energy loss spectroscopy and low voltage, high resolution scanning electron microscopy in polymer research are reviewed