Search results for "Transmission electron microscopy"

showing 10 items of 421 documents

Preparation and characterisation of Ce:YAG -polycarbonate composites for white LED

2016

Ce:YAG-polycarbonate composites were prepared with several amounts of Ce:YAG in the range 0.1-5 wt.% by using melt compounding. The structure and morphology of the composites were investigated by means of X-ray diffractometry and transmission electron microscopy. The optical properties of the composites were studied by using photoluminescence spectroscopy. The intermolecular interaction between the polymer and the filler surface was investigated using 13C cross-polarization magic-angle spinning NMR spectroscopy (13C {1H} CP-MAS NMR). The results showed that the dispersion of the particles in the polymer, and the optical properties, depend on the Ce:YAG amount. The composites were combined w…

Composite materials Surfaces and interfaces Luminescence NanostructuresLuminescencePhotoluminescenceMaterials sciencegenetic structuresComposite number02 engineering and technology010402 general chemistry01 natural sciencesMaterials ChemistrySurfaces and interfacesPolycarbonateComposite materialSpectroscopySettore CHIM/02 - Chimica Fisicachemistry.chemical_classificationMechanical EngineeringMetals and AlloysComposite materialsPolymer021001 nanoscience & nanotechnologyeye diseasesNanostructures0104 chemical scienceschemistryMechanics of MaterialsTransmission electron microscopyvisual_artvisual_art.visual_art_mediumsense organs0210 nano-technologyDispersion (chemistry)LuminescenceJournal of Alloys and Compounds
researchProduct

Probing Physical Properties of Confined Fluids within Individual Nanobubbles

2008

Spatially resolved electron energy-loss spectroscopy (EELS) in a scanning transmission electron microscope (STEM) has been used to investigate as fluidic phase in nanoubbles embedded in a metallic Pd90Pt10 matrix. Using the 1s->2p excitation of the He atoms, maps of the He distribution, in particular of its density an pressure in bubbles of different diameter have been realized, thus providing an indication of the involved bubble formation mechanism. However, the short-range Pauli repulsion mechanism between electrons on neighboring atoms seems insufficient to interpret minute variations of the local local measurements performed at the interface between the metal and the He bubble. Simul…

Condensed Matter - Materials ScienceMaterials scienceMaterials Science (cond-mat.mtrl-sci)FOS: Physical sciencesGeneral Physics and AstronomyElectronPhase (matter)AtomScanning transmission electron microscopyEnergy filtered transmission electron microscopyLiquid bubbleAtomic physicsSpectroscopyExcitationPhysical Review Letters
researchProduct

A Scanning Electron Microscope for Ultracold Atoms

2006

We propose a new technique for the detection of single atoms in ultracold quantum gases. The technique is based on scanning electron microscopy and employs the electron impact ionization of trapped atoms with a focussed electron probe. Subsequent detection of the resulting ions allows for the reconstruction of the atoms position. This technique is expected to achieve a much better spatial resolution compared to any optical detection method. In combination with the sensitivity to single atoms, it makes new in situ measurements of atomic correlations possible. The detection principle is also well suited for the addressing of individual sites in optical lattices.

Condensed Matter::Quantum GasesMaterials scienceStatistical Mechanics (cond-mat.stat-mech)Physics and Astronomy (miscellaneous)Scanning confocal electron microscopyFOS: Physical sciencesElectron tomographyUltracold atomScanning transmission electron microscopyPhysics::Atomic and Molecular ClustersEnergy filtered transmission electron microscopyPhysics::Atomic PhysicsElectron beam-induced depositionAtomic physicsHigh-resolution transmission electron microscopyInstrumentationEnvironmental scanning electron microscopeCondensed Matter - Statistical Mechanics
researchProduct

Peculiarities of imaging one- and two-dimensional structures in an emission electron microscope. 1. theory

2000

Local changes in work function cause deviations of the electrical microfield near a sample surface as a result of the uniform accelerating field distribution between the sample (cathode) and the extractor electrode (anode). This results in a change in the electron trajectories. As a consequence, the microscope image shows remarkable changes in position, size, intensity and lateral resolution of distinct details, which can be quantitatively described by the calculations presented here. Analysing these effects in the image gives an opportunity to determine the real lateral size of the observed structures and the distribution of local contact potentials.

Conventional transmission electron microscopeHistologyMicroscopebusiness.industryScanning electron microscopeChemistryMolecular physicsCathodePathology and Forensic Medicinelaw.inventionOpticslawScanning transmission electron microscopyWork functionsense organsElectron microscopeElectron beam-induced depositionbusinessJournal of microscopy
researchProduct

Probing of nanocontacts inside a transmission electron microscope

2007

In the past twenty years, powerful tools such as atomic force microscopy have made it possible to accurately investigate the phenomena of friction and wear, down to the nanometer scale. Readers of this book will become familiar with the concepts and techniques of nanotribology, explained by an international team of scientists and engineers, actively involved and with long experience in this field. Edited by two pioneers in the field, 'Fundamentals of Frictions and Wear at the Nanoscale' is suitable both as first introduction to this fascinating subject, and also as a reference for researchers wishing to improve their knowledge of nanotribology and to keep up with the latest results in this …

Conventional transmission electron microscopeMaterials sciencebusiness.industryNanotribologyTransmission electron microscopeImagingScanning probe microscopyScanning probe microscopyTransmission electron microscopyScanning transmission electron microscopyNanotribologyOptoelectronicsScanning probe microscope (SPM)Transmission electron microscopy (TEM)business
researchProduct

Dopant Contrast in Semiconductors as Interpretation Challenge at Imaging by Electrons

2007

Mechanisms responsible for the contrast between differently doped areas in semiconductors, which is observed in electron micrographs, is discussed as regards the key factors determining the sign and magnitude of the contrast. Experimental data obtained by means of the scanning electron microscope (SEM), scanning low energy electron microscope and photoelectron emission microscope are reviewed together with hints following from them for compilation of a model of the contrast mechanism.

Conventional transmission electron microscopeMicroscopeMaterials sciencebusiness.industryMechanical Engineeringtechnology industry and agricultureLow-voltage electron microscopeCondensed Matter Physicslaw.inventionOpticsMechanics of MaterialslawScanning transmission electron microscopyOptoelectronicsGeneral Materials ScienceElectron beam-induced depositionElectron microscopeHigh-resolution transmission electron microscopybusinessEnvironmental scanning electron microscopeMATERIALS TRANSACTIONS
researchProduct

The future of transmission electron microscopy (TEM) in biology and medicine.

2000

Conventional transmission electron microscopeMicroscopy ElectronStructural BiologyTransmission electron microscopyResearchScanning confocal electron microscopyGeneral Physics and AstronomyGeneral Materials ScienceNanotechnologyCell BiologyForecastingMicron (Oxford, England : 1993)
researchProduct

1996

The uses of atomic force microscopy, scanning tunneling microscopy, electron spectroscopic imaging, electron energy loss spectroscopy and low voltage, high resolution scanning electron microscopy in polymer research are reviewed

Conventional transmission electron microscopePolymers and PlasticsPolymer characterizationbusiness.industryChemistryGeneral Chemical EngineeringScanning confocal electron microscopyScanning capacitance microscopyCondensed Matter::Mesoscopic Systems and Quantum Hall EffectCondensed Matter::Materials ScienceOpticsMicroscopyScanning transmission electron microscopyScanning ion-conductance microscopyEnergy filtered transmission electron microscopyOptoelectronicsbusinessActa Polymerica
researchProduct

Dislocations in AIIIBVI single crystals

1988

High densities of planar defects are evidenced in various AIIIBVI layer compounds by systematic electron microscopy observations with the dark-field weak-beam image technique. Several samples are analyzed, as obtained from different crystal ingots of InSe grown by the Bridgman-Stockbarger method, and some GaS and GaSe single crystals grown both, from the melt and from the vapour. The observed defects are identified mainly as screw and edge dislocations, the orientation of which is obtained in some cases by the analysis of the Moire fringes. Dislocation densities ranging between 108 and 1010 cm−2 are measured, not uniformly distributed in the various regions of each sample. Finally, the obse…

CrystalCrystallographyChemistryTransmission electron microscopyNanotechnologyDislocationCondensed Matter PhysicsElectronic Optical and Magnetic MaterialsPhysica Status Solidi (a)
researchProduct

Radiation damage in zircon

2003

A single, zoned, Sri Lankan zircon exhibits a range of microstructures from crystalline to nearly amorphous that are the result of radiation damage over a dose range of 2.1–10.1·1015 α-decay events/mg (0.16–0.47 dpa). The zones in the crystal were examined at a variety of length scales using optical microscopy, micro-Raman spectroscopy, electron microprobe analysis, and transmission electron microscopy. Birefringence varies linearly with dose: birefringence = −4.71·10−18 /g· D α + 4.86·10−2. Full width at half maximum (FWHM) measurements of the B1g(ν3) peak, as determined by micro-Raman spectroscopy, were used to estimate the extent of radiation damage in each zone. The radiation dose (calc…

CrystalFull width at half maximumGeophysicsGeochemistry and PetrologyTransmission electron microscopyAnalytical chemistryRadiation damageMineralogyElectron microprobeSpectroscopyGeologyZirconAmorphous solidAmerican Mineralogist
researchProduct