Search results for "Tunnel"
showing 10 items of 576 documents
Oxide growth and tunneling characteristics of Sn-SnO x -Sn junctions
1979
Sn—SnOx—Sn tunneling junctions were prepared by thermal oxidation of vacuum deposited Sn-films. The thickness growth of the oxide was followed by ellipsometric measurements. From logarithmic conductivity measurements the barrier heights were determined. The tunneling characteristic could be well described by the two-band-tunneling model using a value of 0.14 for the ratio of the effective masses in the oxide and the metal.
Photon Scanning Tunneling Microscopy and Reflection Scanning Microscopy
1991
The Photon Scanning Tunneling Microscope (PSTM) is the photon analogue to the Electron Scanning Tunneling Microscope (ESTM). It uses the evanescent field due to the total internal reflection (TIR) of a light beam in a prism modulated by a sample attached to the prism. The exponential decay of the evanescent field is characterized by the penetration depth dp and depends on the angle of incidence θ, the wavelength and polarization of the incident beam. Changes in intensity are monitored by a probe tip scanned over the surface, and the data are processed to generate an image of the sample. Images produced by a prototype instrument are shown to have a vertical resolution of about 3 A and a late…
Sample–tip coupling efficiencies of the photon-scanning tunneling microscope
1991
The photon-scanning tunneling microscope is the photon analog to the electron-scanning tunneling microscope. It uses the evanescent field due to the total internal reflection of a light beam in a prism, modulated by a sample attached to the prism. The exponential decay of the evanescent field is characterized by the penetration depth dp and depends on the angle of incidence θ, the wavelength, and the polarization of the incident beam. The 1/e decay lengths range from 150 to 265 nm as deduced from the expression of the electric-field intensity in the rarer medium for θ = π/2. If we place another optically transparent medium near the surface, frustrated total reflection occurs. It is shown th…
Recent Experimental Results with the PSTM: - Observation of a Step on a Quartz Surface. - Spatial Spectroscopy of Microwaveguides
1993
The Photon Scanning Tunneling Microscope (PSTM) is based on the frustration of the total internal reflected beam by the end of an optical fiber. Till today it has been used to obtain topographic information generally for smooth samples. In this paper we report two different kinds of experimental results. First, when the sample is in the form of a step, our measurements demonstrate how the images, obtained in the constant intensity mode, depend on the orientation of the incident beam of light with respect to the step. Next, we show that the first derivative of the collected intensity with respect to the probe-sample distance at each point of the sample yields to a new kind of image named her…
Determination of the spatial extension of the surface-plasmon evanescent field of a silver film with a photon scanning tunneling microscope.
1993
A photon scanning tunneling microscope is employed to probe the surface-plasmon field in the evanes- cent region of a silver film for p (parallel to the plane of incidence) and s (perpendicular to the plane of incidence) polarizations of the light beam at several angles of incidence near the critical angle. The in- teraction between the field and the probe is measured and compared to theoretical calculations involving a single four-media model. A systematic analysis of images obtained for several positions of the optical fiber above the film is presented and it is shown that, for tip-to-sample distances smaller than half the wavelength of the incoming light, the collected intensity curves a…
Resolution of the photon scanning tunneling microscope: influence of physical parameters
1992
Abstract The photon scanning tunneling microscope (PSTM) is the photon analogue of the electron scanning tunneling microscope (ESTM). It uses the evanescent field due to total internal reflection (TIR) of a light beam in a prism modulated by a sample placed on the base of the prism. Our experimental results shown details which present a lateral size as small as 200 A. The PSTM axial resolution is more difficult to evaluate. It is a function of the roughness of the sample. For very smooth samples, images shown an axial resolution of about 10 A. At last we discuss how both lateral and axial resolution can be affected by several parameters such as the tip surface distance and the roughness of …
Fractional Modeling of the AC Large-Signal Frequency Response in Magnetoresistive Current Sensors
2013
Fractional calculus is considered when derivatives and integrals of non-integer order are applied over a specific function. In the electrical and electronic domain, the transfer function dependence of a fractional filter not only by the filter order n, but additionally, of the fractional order α is an example of a great number of systems where its input-output behavior could be more exactly modeled by a fractional behavior. Following this aim, the present work shows the experimental ac large-signal frequency response of a family of electrical current sensors based in different spintronic conduction mechanisms. Using an ac characterization set-up the sensor transimpedance function is obtain…
Coulomb blockade thermometry
1996
One dimensional arrays of normal metal tunnel junctions have been found to exhibit properties which are very suitable for primary and secondary thermometry in a lithographically adjustable temperature range which extends over about two decades. The thermometer is remarkably insensitive to nonuniformities in the actual pattern and to even strong magnetic fields. We also discuss the behaviour of this device at very low temperatures where the hot electron effect due to poor electron phonon coupling ultimately takes over and at very high temperatures where the finite tunnel barrier effects appear. Short arrays, and especially single tunnel junctions show interesting deviations from the universa…
Magnetic nanoparticles between electrodes of tunnel junction: anomalous tunnel conductance
2002
Abstract Magnetic particles of microscopic size can be created in the process of Ni, Fe and Co mechanically controllable break junctions fabrication and trapped between the electrodes by magnetic dipole forces. Tunneling between the protruding nanoparticle and the sample electrode shows clear distinctions from the usual junctions: heavy deviation of the current–distance I(z) dependence from the expected exponential behavior at electrode separations z below 4.0– 4.5 A and on numerous occasions a sudden jump-like decrease of the tunnel current at z≈1.5– 2.0 A . Possible mechanisms behind observed anomalies including the short-range magnetic exchange coupling are discussed.