Search results for "VOLTAGE"

showing 10 items of 934 documents

Power losses comparison between Silicon Carbide and Silicon devices for an isolated DC-DC converter

2021

In recent years, new efficient power devices have been implemented. Silicon Carbide has replaced silicon as regards the production and the utilization of many devices, such as MOSFETs, diodes, IGBTs and many others. SiC devices are characterized by a low reverse recovery charge, high carrier saturation velocity, by which it is possible to work at high frequency, and high breakdown voltage. Thanks to the great thermal conductivity and the wide bandgap, these devices can operate at high temperature and reach high voltages and currents. What is important to stress is the fact that power losses in SiC devices are lower than the silicon ones. These are the reasons why these devices are utilized …

Materials scienceSiliconSiC devicesbusiness.industryDC-DC converterschemistry.chemical_elementSaturation velocityHardware_PERFORMANCEANDRELIABILITYSettore ING-IND/32 - Convertitori Macchine E Azionamenti ElettriciSettore ING-INF/01 - ElettronicaIsolated power converterschemistry.chemical_compoundchemistryPower electronicsMOSFETHardware_INTEGRATEDCIRCUITSSilicon carbideOptoelectronicsBreakdown voltagePower semiconductor devicePower lossesbusinessDiode
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Modeling and parameter identification of crystalline silicon photovoltaic devices

2011

In this paper the physical correctness of the standard single-exponential (one-diode) model of crystalline-Si photovoltaic devices is examined. In particular, we focus on the shunt current. I-V curves of in situ illuminated polycrystalline-Si photovoltaic modules are measured, and based on these measurements, we extract the shunt current. There is a certain voltage range in which the shunt current shows an Ohmic-like behavior, but the value of the resistance varies with irradiance and the quality of illumination. In addition, the Ohmic behavior takes place at voltages well below the maximum-power point (MPP). At higher voltages, the shunt current drops to negligible values. We conclude that…

Materials scienceSiliconbusiness.industryEstimation theoryPhotovoltaic systemIrradianceElectrical engineeringchemistry.chemical_elementchemistryOptoelectronicsCrystalline siliconbusinessOhmic contactShunt (electrical)Voltage2011 37th IEEE Photovoltaic Specialists Conference
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Silicon Single Electron Transistors with Single and Multi Dot Characteristics

2000

AbstractSilicon single electron transistors (SET) with side gate have been fabricated on a heavily doped silicon-on-insulator (SOI) substrate. Samples demonstrate two types of characteristics: some of them demonstrate multiple dot behavior and one demonstrates single dot behavior in a wide temperature range. SETs demonstrate oscillations of drain-source current and changes in the width of the Coulomb blockade region with change of gate voltage at least up to 100 K. At temperature below 20 K long-term oscillations (relaxation) of source-drain current after switching the gate voltage has been observed in both multiple dot and single dot samples. Illumination affects both the characteristics o…

Materials scienceSiliconbusiness.industryTransistorCoulomb blockadechemistry.chemical_elementSilicon on insulatorSubstrate (electronics)Condensed Matter::Mesoscopic Systems and Quantum Hall EffectNoise (electronics)law.inventionchemistrylawOptoelectronicsbusinessAND gateVoltageMRS Proceedings
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Single electron transistor fabricated on heavily doped silicon-on-insulator substrate

2001

Experiments on side-gated silicon single electron transistors (SET) fabricated on a heavily doped thin silicon-on-insulator substrate are reported. Some of the devices showed single-island-like and some multi-island-like behaviour, but the properties of individual samples changed with time. Single-electron gate modulation was observable up to T=100 K, at least. A slow response of SET current to a large change in gate voltage was observed, but the process speeded up under illumination.

Materials scienceSiliconbusiness.industryTransistorDopingGeneral EngineeringGeneral Physics and AstronomySilicon on insulatorCoulomb blockadechemistry.chemical_elementNanotechnologySubstrate (electronics)Hardware_PERFORMANCEANDRELIABILITYGate voltagelaw.inventionchemistryModulationlawHardware_INTEGRATEDCIRCUITSOptoelectronicsbusinessHardware_LOGICDESIGNJapanese Journal of Applied Physics
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Assessment of a New Analytical Expression for the Maximum-Power Point Voltage with Series Resistance

2021

This work compares a recently developed analytical expression for the maximum-power point voltage with experimental data, to test its usability for crystalline silicon solar cells. The experimental data covers measurements from 18 multicrystalline silicon solar cells with different bulk resistivities and cell architectures. We show that the expression is able to predict the maximum power obtainable by the measured cells with relative discrepancies below 1%. Additionally, we compare the accuracy of this new expression with two already existing models.

Materials scienceSiliconchemistryMaximum power principleEquivalent series resistancechemistry.chemical_elementExperimental dataPoint (geometry)Crystalline siliconExpression (mathematics)Computational physicsVoltage2021 IEEE 48th Photovoltaic Specialists Conference (PVSC)
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Influence on PD Parameters due to Voltage Conducted Disturbances

2004

In the standard specification of ac dielectric-characteristic measurements of insulating materials, test voltage is prescribed as "approximately sinusoidal" when the highest acceptable deviation of the HV waveform, from the correct sinusoidal shape, is limited to a /spl plusmn/5% tolerance range of the crest factor value. In the field of partial discharge (PD) measurements and their statistical data processing, on which forecasts of long term behavior of components and their reliability are currently carried out, the results of elaborations depend on the voltage wave shape. In this paper, the errors in PD measurements, evaluated at industrial frequencies, due to applied voltages distorted b…

Materials scienceSteady state (electronics)Mathematical analysisPhase angleInsulation systems distorted voltage harmonics partial discharge measurements.Root mean squareSettore ING-IND/31 - ElettrotecnicaHarmonicsPartial dischargeElectronic engineeringHarmonicWaveformElectrical and Electronic EngineeringCrest factor
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Stochastic resonance in a metal-oxide memristive device

2021

Abstract The stochastic resonance phenomenon has been studied experimentally and theoretically for a state-of-art metal-oxide memristive device based on yttria-stabilized zirconium dioxide and tantalum pentoxide, which exhibits bipolar filamentary resistive switching of anionic type. The effect of white Gaussian noise superimposed on the sub-threshold sinusoidal driving signal is analyzed through the time series statistics of the resistive switching parameters, the spectral response to a periodic perturbation and the signal-to-noise ratio at the output of the nonlinear system. The stabilized resistive switching and the increased memristance response are revealed in the observed regularities…

Materials scienceStochastic modellingStochastic resonanceGeneral MathematicsGeneral Physics and AstronomyMemristor01 natural sciencesNoise (electronics)Signal010305 fluids & plasmaslaw.inventionsymbols.namesakelaw0103 physical sciencesstochastic resonance010301 acousticsCondensed matter physicsresistive switchingApplied MathematicsStatistical and Nonlinear PhysicsMemristoryttria-stabilized zirconium dioxideNonlinear systemAdditive white Gaussian noisesymbolstime series statistical analysis stochastic modelVoltagetantalum oxide
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Strain relaxation, extended defects and doping effects in InxGa1-xN/GaN heterostructures investigated by surface photovoltage

2020

Abstract We have analysed electrical properties of extended defects and interfaces in fully strained and partially relaxed InxGa1-xN/GaN heterostructures by means of Kelvin probe force microscopy and surface photovoltage spectroscopy. The study highlights the role of indium incorporation and Si doping levels on the charge state of extended defects including threading dislocations, V defects and misfit dislocations. Surface potential maps reveal that these defects are associated with a different local work function and thus could remarkably alter electron-hole recombination mechanisms of InxGa1-xN/GaN layers locally. Surface photovoltage spectra clearly demonstrate the role of misfit disloca…

Materials scienceSurface photovoltageGeneral Physics and Astronomychemistry.chemical_element02 engineering and technology010402 general chemistryKelvin probe force microscopy01 natural sciencesSurface photovoltage spectroscopyWork functionSpectroscopyKelvin probe force microscopeCondensed matter physicsInxGa1-xN/GaN heterostructureRelaxation (NMR)DopingHeterojunctionSurfaces and InterfacesGeneral Chemistry021001 nanoscience & nanotechnologyCondensed Matter Physics0104 chemical sciencesSurfaces Coatings and Filmschemistry0210 nano-technologyIndium
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Efficient, 23%, Solution-Processed Perovskite Tandem Cells

2019

In this issue of Joule, Palmstrom and coworkers present efficient solution-processed two-terminal solar cells employing two metal halide perovskite-based absorbers. The key to this achievement is 2-fold: the deposition of a thin yet robust transparent conductor in between the two sub-cells allows solution processing of the back-cell and enables efficient and local charge recombination. Furthermore, the insertion of large cations reduces halide segregation and enables a higher open-circuit voltage and stability for the high-band-gap sub-cell.

Materials scienceTandembusiness.industryJouleHalide02 engineering and technology010402 general chemistry021001 nanoscience & nanotechnology01 natural sciences0104 chemical sciencesConductorMetalGeneral Energyvisual_artvisual_art.visual_art_mediumOptoelectronicsDeposition (phase transition)0210 nano-technologybusinessVoltagePerovskite (structure)Joule
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Aqueous electrolyte-gated ZnO transistors for environmental and biological sensing

2014

Electrolyte-gated transistors (EGTs) based on ZnO thin films, obtained by solution processing of suspensions of nanoparticles, have a low turn-on voltage (<0.5 V), a high on/off ratio and transconductance exceeding 0.2 mS. Importantly, the ZnO surface can be functionalized with a large variety of molecular recognition elements, making these devices ideal transducers in physiological and environmental monitoring. We present simple glucose-sensing and ion-selective EGTs, demonstrating the versatility of such devices in biosensing.

Materials scienceTransconductanceTransistorNanoparticleNanotechnologyGeneral ChemistryAqueous electrolytelaw.inventionMolecular recognitionlawMaterials ChemistryThin filmBiosensorVoltageJ. Mater. Chem. C
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