Search results for "ck"

Low energy nano diffraction (LEND) – A versatile diffraction technique in SEM

2019

Abstract Electron diffraction is a powerful characterization method that is used across different fields and in different instruments. In particular, the power of transmission electron microscopy (TEM) largely relies on the capability to switch between imaging and diffraction mode enabling identification of crystalline phases and in-depth studies of crystal defects, to name only examples. In contrast, while diffraction techniques have found their way into the realm of scanning electron microscopy (SEM) in the form of electron backscatter diffraction and related techniques, on-axis transmission diffraction is still in its infancy. Here we present a simple but versatile setup that enables a ‘…

RBS and ERD cross-sections and optical model parameters for the analysis of lithium, boron and nickel

2000

Abstract Elastic scattering cross-sections for RBS analysis of nickel by 7 Li and 11 B ion backscattering near the Coulomb barrier have been determined. The lithium ion measurements were performed in the energy range of 8–15 MeV at the laboratory angles of 115° and 135°. For boron ions the energies between 14 and 24 MeV and scattering angles of 89°, 110° and 130° were used. For the analysis of lithium and boron by ERD the scattering cross-sections have been calculated by kinematically reversing the backscattering process. The calculated 58 Ni ion energies thus varied between 65 and 125 MeV for lithium and between 75 and 130 MeV for boron recoils. For the Li + Ni and B + Ni systems the thres…

Effects of Thermal Neutron Irradiation on a Self-Refresh DRAM

2020

International audience; In this study, static and dynamic test methods were used to define the response of a self-refresh DRAM under thermal neutron irradiation. The neutron-induced failures were investigated and characterized by event cross-sections, soft-error rate and bitmaps evaluations, leading to an identification of permanent and temporarily stuck cells, block errors, and single-bit upsets.

2018

CrN thin films with an N/Cr ratio of 95% were deposited by reactive magnetron sputtering onto (0 0 0 1) sapphire substrates. X-ray diffraction and pole figure texture analysis show CrN (1 1 1) epitaxial growth in a twin domain fashion. By changing the nitrogen versus argon gas flow mixture and the deposition temperature, thin films with different surface morphologies ranging from grainy rough textures to flat and smooth films were prepared. These parameters can also affect the CrN x system, with the film compound changing between semiconducting CrN and metallic Cr2N through the regulation of the nitrogen content of the gas flow and the deposition temperature at a constant deposition pressur…

ABSOLUTE THERMOELECTRIC POWER OF Pb–Sn ALLOYS

2011

International audience; In this work, absolute thermoelectric power (ATP) of Pb, Sn, Pb-20 wt.% Sn, Pb-40 wt.% Sn, Pb-60 wt.% Sn, Pb-80 wt.% Sn are measured. Measurements are performed in a temperature gradient furnace from 20 degrees C to 500 degrees C, for both solid and liquid states. Temperatures are measured with T-type copper-constantan thermocouples, while voltage signal between copper electrodes of those thermocouples is recorded in order to calculate ATP of the sample metal.

Hole localization in thermoelectric half-Heusler (Zr0.5Hf0.5)Co(Sb1−xSn ) thin films

2019

Abstract The (Ti, Zr, Hf)Co(Sb 1 − x Snx) material class has recently come into focus as an attractive p-type high-temperature thermoelectric material. This study experimentally demonstrates that homogeneous, highly textured (Zr0.5Hf0.5)Co(Sb 1 − x Snx) thin films can be grown on single crystalline MgO. By varying the sputter power, samples with both positive and negative Seebeck coefficient can be grown. The underlying reason for the sign change is the segregation of Sn nano-inclusions, which lower the effective doping of the half-Heusler matrix. Similarly the Hall constant also switches sign at low temperatures, which is modeled assuming semi-metal behavior and low temperature hole locali…

The influence of Cr and Ni doping on the microstructure of oxygen containing diamond-like carbon films

2021

Abstract Non-hydrogenated diamond-like carbon (DLC) films doped with metals and oxygen were deposited by direct current magnetron sputtering. The influence of chromium and nickel on the surface morphology, elemental composition, bonding structure, adhesion force, optical transmittance and nanohardness of the films was characterized by atomic force microscopy (AFM), energy dispersive X-ray spectroscopy (EDX), multi-wavelength Raman spectroscopy, UV–VIS–NIR spectrophotometry and nanoindenter. The surface roughness was reduced with the addition of Cr (7.4 at. %) or Ni (8.9 at. %) into DLC films. The EDX measurements indicated that the addition of Cr increased the oxygen content by ~37%, while …

EBSD, XRD and SRS characterization of a casting Al-7wt%Si alloy processed by equal channel angular extrusion: Dislocation density evaluation

2019

Abstract Aluminum‑silicon (Al Si) alloys of high silicon contents are composite materials; they are used whenever high casting properties are required. They are slightly ductile below 8wt%Si. An increase in ductility can be obtained by refining Si-crystals in elaboration or by a further hot working. In the present work, an Al-7wt%Si alloy was processed by Equal Channel Angular Extrusion (ECAE) at temperatures 20 °C and 160 °C up to three passes. The die was formed by two cylindrical channels with characteristic angles Φ = 110° and Ψ = 0. EBSD, X ray diffraction (XRD) and Strain Rate Sensitivity (SRS) were used to characterize the microstructure and the mechanical properties. High levels of …

Neutron diffraction study of microstructural and magnetic effects in fine particle NiO powders

2016

Nickel oxide powders with grain sizes ranging from 100 to 1500 nm have been studied by high-resolution neutron diffraction. We have found that the atomic structure, the antiferromagnetic ordering, and the value of the nickel magnetic moments inherent in the bulk material of NiO are still preserved and are nearly independent of the average size of the grains. The sizes of the coherently scattering atomic and magnetic domains were estimated independently owing to a complete separation of the nuclear and magnetic peaks in the neutron diffraction patterns. It is shown that the finite-size and surface disorder effects in particles at the submicron scale have a more pronounced influence on the ma…

Improve the dielectric properties of PrSrNi0.8Mn0.2O4 compounds by longer mechanical milling

2018

Abstract Structural and dielectric properties of PrSrNi 0.8 Mn 0.2 O 4 ceramics elaborated by a rapid method combining mechanical milling and heat treatment were studied for the first time. The raw materials are milled at different times ( t mil  =  0, 5, 10, 20 and 30 h) and annealed at 1300 °C for 8 h to produce a revealed PrSrNi 0.8 Mn 0.2 O 4 single phase, exhibiting tetragonal structure with space group I 4/ mmm . This result was confirmed by using the TEM/ED pattern for sample milled at 30 h using the [001] orientation. The corresponding lattice images show a well-ordered compound, indicating the absence of stacking faults and the growth of the crystallites. Giant dielectric response …