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RESEARCH PRODUCT
Effects of Thermal Neutron Irradiation on a Self-Refresh DRAM
Lucas Matana LuzaRuben Garcia AliaManon LeticheLuigi DililloDaniel SoderstromHelmut PuchnerAlberto Bosiosubject
010302 applied physicsMaterials science010308 nuclear & particles physicsNuclear engineering01 natural sciencesNeutron temperature[SPI.TRON]Engineering Sciences [physics]/Electronics0103 physical sciences[INFO.INFO-ES]Computer Science [cs]/Embedded SystemsNeutronIrradiation[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsDramBlock (data storage)Dynamic testingdescription
International audience; In this study, static and dynamic test methods were used to define the response of a self-refresh DRAM under thermal neutron irradiation. The neutron-induced failures were investigated and characterized by event cross-sections, soft-error rate and bitmaps evaluations, leading to an identification of permanent and temporarily stuck cells, block errors, and single-bit upsets.
year | journal | country | edition | language |
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2020-04-01 | 2020 15th Design & Technology of Integrated Systems in Nanoscale Era (DTIS) |