6533b81ffe1ef96bd12773b6

RESEARCH PRODUCT

Effects of Thermal Neutron Irradiation on a Self-Refresh DRAM

Lucas Matana LuzaRuben Garcia AliaManon LeticheLuigi DililloDaniel SoderstromHelmut PuchnerAlberto Bosio

subject

010302 applied physicsMaterials science010308 nuclear & particles physicsNuclear engineering01 natural sciencesNeutron temperature[SPI.TRON]Engineering Sciences [physics]/Electronics0103 physical sciences[INFO.INFO-ES]Computer Science [cs]/Embedded SystemsNeutronIrradiation[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsDramBlock (data storage)Dynamic testing

description

International audience; In this study, static and dynamic test methods were used to define the response of a self-refresh DRAM under thermal neutron irradiation. The neutron-induced failures were investigated and characterized by event cross-sections, soft-error rate and bitmaps evaluations, leading to an identification of permanent and temporarily stuck cells, block errors, and single-bit upsets.

10.1109/dtis48698.2020.9080918http://dx.doi.org/10.1109/dtis48698.2020.9080918