0000000000294054
AUTHOR
Daniel Soderstrom
showing 11 related works from this author
Emulating the Effects of Radiation-Induced Soft-Errors for the Reliability Assessment of Neural Networks
2021
International audience; Convolutional Neural Networks (CNNs) are currently one of the most widely used predictive models in machine learning. Recent studies have demonstrated that hardware faults induced by radiation fields, including cosmic rays, may significantly impact the CNN inference leading to wrong predictions. Therefore, ensuring the reliability of CNNs is crucial, especially for safety-critical systems. In the literature, several works propose reliability assessments of CNNs mainly based on statistically injected faults. This work presents a software emulator capable of injecting real faults retrieved from radiation tests. Specifically, from the device characterisation of a DRAM m…
Effects of Thermal Neutron Irradiation on a Self-Refresh DRAM
2020
International audience; In this study, static and dynamic test methods were used to define the response of a self-refresh DRAM under thermal neutron irradiation. The neutron-induced failures were investigated and characterized by event cross-sections, soft-error rate and bitmaps evaluations, leading to an identification of permanent and temporarily stuck cells, block errors, and single-bit upsets.
Radiation Hardness Assurance Through System-Level Testing: Risk Acceptance, Facility Requirements, Test Methodology, and Data Exploitation
2021
International audience; Functional verification schemes at a level different from component-level testing are emerging as a cost-effective tool for those space systems for which the risk associated with a lower level of assurance can be accepted. Despite the promising potential, system-level radiation testing can be applied to the functional verification of systems under restricted intrinsic boundaries. Most of them are related to the use of hadrons as opposed to heavy ions. Hadrons are preferred for the irradiation of any bulky system, in general, because of their deeper penetration capabilities. General guidelines about the test preparation and procedure for a high-level radiation test ar…
Radioluminescence Response of Ce-, Cu-, and Gd-Doped Silica Glasses for Dosimetry of Pulsed Electron Beams
2021
Radiation-induced emission of doped sol-gel silica glass samples was investigated under a pulsed 20-MeV electron beam. The studied samples were drawn rods doped with cerium, copper, or gadolinium ions, which were connected to multimode pure-silica core fibers to transport the induced luminescence from the irradiation area to a signal readout system. The luminescence pulses in the samples induced by the electron bunches were studied as a function of deposited dose per electron bunch. All the investigated samples were found to have a linear response in terms of luminescence as a function of electron bunch sizes between 10−5 Gy/bunch and 1.5×10−2 Gy/bunch. The presented results show that these…
Neutron-Induced Effects on a Self-Refresh DRAM
2022
International audience; The field of radiation effects in electronics research includes unknowns for every new device, node size, and technical development. In this study, static and dynamic test methods were used to define the response of a self-refresh DRAM under neutron irradiation. The neutron-induced effects were investigated and characterised by event cross sections, soft-error rate, and bitmaps evaluations, leading to an identification of permanent and temporary stuck cells, single-bit upsets, and block errors. Block errors were identified in different patterns with dependency in the addressing order, leading to up to two thousand faulty words per event, representing a real threat fr…
Gd 3+ -doped sol-gel silica glass for remote ionizing radiation dosimetry
2019
Gadolinium-doped silica glass was prepared, using the sol-gel route, for ionizing radiation dosimetry applications. Such a glassy rod was drawn to a cane at a temperature of 2000 °C. The structural and optical properties of the obtained material were studied using Raman, optical absorption, and photoluminescence spectroscopies. Thereafter, a small piece of this Gd-doped scintillating cane was spliced to a transport passive optical fiber, allowing the remote monitoring of the X-ray dose rate through a radioluminescence (RL) signal. The sample exhibited a linear RL intensity response versus the dose rate from 125 µGy(SiO2)/s up to 12.25 Gy/s. These results confirm the potentialities of this m…
Technology Impact on Neutron-Induced Effects in SDRAMs : A Comparative Study
2021
International audience; This study analyses the response of synchronous dynamic random access memories to neutron irradiation. Three different generations of the same device with different node sizes (63, 72, and 110 nm) were characterized under an atmospheric-like neutron spectrum at the ChipIr beamline in the Rutherford Appleton Laboratories, UK. The memories were tested with a reduced refresh rate to expose more single-event upsets and under similar conditions provided by a board specifically developed for this type of study in test facilities. The board has also been designed to be used as a nanosatellite payload in order to perform similar tests. The neutron-induced failures were studi…
The Pion Single-Event Effect Resonance and its Impact in an Accelerator Environment
2020
International audience; The pion resonance in the nuclear reaction cross section is seen to have a direct impact on the single-event effect (SEE) cross section of modern electronic devices. This was experimentally observed for single-event upsets and single-event latchup. Rectangular parallelepiped (RPP) models built to fit proton data confirm the existence of the pion SEE cross-section resonance. The impact on current radiation hardness assurance (RHA) soft error rate (SER) predictions is, however, minimal for the accelerator environment since this is dominated by high neutron fluxes. The resonance is not seen to have a major impact on the high-energy hadron equivalence approximation estab…
Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing Systems
2020
International audience; Approximate Computing (AxC) is a well-known paradigm able to reduce the computational and power overheads of a multitude of applications, at the cost of a decreased accuracy. Convolutional Neural Networks (CNNs) have proven to be particularly suited for AxC because of their inherent resilience to errors. However, the implementation of AxC techniques may affect the intrinsic resilience of the application to errors induced by Single Events in a harsh environment. This work introduces an experimental study of the impact of neutron irradiation on approximate computing techniques applied on the data representation of a CNN.
Electron-Induced Upsets and Stuck Bits in SDRAMs in the Jovian Environment
2021
This study investigates the response of synchronous dynamic random access memories to energetic electrons and especially the possibility of electrons to cause stuck bits in these memories. Three different memories with different node sizes (63, 72, and 110 nm) were tested. Electrons with energies between 6 and 200 MeV were used at RADiation Effects Facility (RADEF) in Jyvaskyla, Finland, and at Very energetic Electron facility for Space Planetary Exploration missions in harsh Radiative environments (VESPER) in The European Organization for Nuclear Research (CERN), Switzerland. Photon irradiation was also performed in Jyvaskyla. In these irradiation tests, stuck bits originating from electro…
The Pion Single-Event Latch-Up Cross Section Enhancement: Mechanisms and Consequences for Accelerator Hardness Assurance
2021
Pions make up a large part of the hadronic environment typical of accelerator mixed fields. Characterizing device cross sections against pions is usually disregarded in favor of tests with protons, whose single-event latch-up (SEL) cross section is, nonetheless, experimentally found to be lower than that of pions for all energies below 250 MeV. While Monte Carlo simulations are capable of reproducing such behavior, the reason for the observed pion cross-section enhancement can only be explained by a deeper analysis of the underlying mechanisms dominating proton–silicon and pion–silicon reactions. The mechanisms dominating the SEL response are found to vary with the energy under consideratio…