Search results for "electron microscopy"
showing 10 items of 706 documents
Analysis of Optical Systems, Contrast Depth, and Measurement of Electric and Magnetic Field Distribution on the Object's Surface in Mirror Electron M…
2011
Abstract The contrast depth is analyzed as well, that is the sensitivity of electron mirror microscope to disorders of homogeneity on the object (local magnetic and electric fields, surface relief). Because of the latter ones, electron trajectories feel disturbances (electrons acquire additional increment velocity in radial and azimuthal directions), which leads to the shift of the observed point on the screen and, as a consequence, to the image contrast. Since the electron energy, when reflected, tends to zero, electrons are influenced by heterogeneities for a long time. It causes high sensitivity to heterogeneities, up to the crossing of electron trajectories (caustics are generated). The…
Nanoscale X-ray detectors based on individual CdS, SnO2 and ZnO nanowires
2021
Abstract The development of nanoscale X-ray sensors is of crucial importance to achieve higher spatial resolution in many X-ray-based techniques playing a key role in materials science, healthcare, and security. Here, we demonstrate X-ray detection using individual CdS, SnO 2 , and ZnO nanowires (NWs). The NWs were produced via vapor–liquid–solid technique and characterized using X-ray diffraction, scanning, and transmission electron microscopy . Electrical measurements were performed under ambient conditions while exposing two-terminal NW-based devices to X-rays generated by a conventional tungsten anode X-ray tube. Fast and stable nanoampere-range X-ray beam induced current (XBIC) in resp…
Magnetization changes visualized using photoemission electron microscopy
2004
Abstract Photoemission electron microscopy was used to visualize the motion of magnetic domains on a sub-nanosecond timescale. The technique exploits the imaging of magnetic domains using soft X-ray circular dichroism, with the special feature that the instrument utilizes a fast image acquisition system with intrinsic 125 ps time resolution. The overall time resolution used is about 500 ps. Different domains and domain movements have been observed in lithographically-produced Permalloy structures on a copper microstrip-line. A current pulse of I=0.5 A with rise times of about 300 ps switched the Permalloy islands from a Landau-Lifshitz type domain configuration into metastable s-state domai…
Robustness of plasmonic angular momentum confinement in cross resonant optical antennas
2015
Using a combination of photoemission electron microscopy and numerical simulations, we investigated the angular moment transfer in strongly enhanced optical near-fields of artificially fabricated optical antennas. The polarization dependence of the optical near-field enhancement has been measured in a maximum symmetric geometry, i.e., excitation by a normal incident planar wave. Finite-difference time-domain simulations for the realistic antenna geometries as determined by high-resolution electron microscopy reveal a very good agreement with experimental data. The agreement confirms that the geometrical asymmetries and inhomogeneities due to the nanoscale fabrication process preserve the ci…
Stroboscopic XMCD-PEEM Imaging
2007
Abstract This article summarizes recent results on magnetization dynamics obtained with time-resolved photoemission electron microscopy (PEEM) using X-ray magnetic circular dichroism as contrast mechanism. Time resolution is performed by a stroboscopic technique that is exclusively sensitive to reversible processes, but offers a very high time resolution only limited by the X-ray pulse width. A time resolution of 20 ps in combination with a lateral resolution of 100 nm has been achieved.
Spatially resolved observation of dynamics in electrical and magnetic field distributions by means of a delayline detector and PEEM
2005
Abstract Photoemission electron microscopy (PEEM) was exploited to observe the dynamics in local field distributions on microstrip-line devices with a best time resolution of 133 ps. A delayline detector system served as imaging unit capable of a time resolving data acquisition and processing. The setup can be operated at the resolution limit of the PEEM of about 20 nm while a continuously illuminating UV-lamp excites the photoelectrons in threshold photoemission. A pulsed photon source is not needed to obtain time resolved images, the time reference of the data acquisition was taken by a periodic signal (clock, here typ. 100 MHz) in phase with the pulse pattern applied to the microstrip-li…
Time- and energy resolved photoemission electron microscopy-imaging of photoelectron time-of-flight analysis by means of pulsed excitations
2010
Abstract The present work enlightens the developments in time- and energy resolved photoemission electron microscopy over the past few years. We describe basic principles of the technique and demonstrate different applications. An energy- and time-filtering photoemission electron microscopy (PEEM) for real-time spectroscopic imaging can be realized either by a retarding field or hemispherical energy analyzer or by using time-of-flight optics with a delay line detector. The latter method has the advantage of no data loss at all as all randomly incoming particles are measured not only by position but also by time. This is of particular interest for pump–probe experiments in the femtosecond an…
Near Field of Strongly Coupled Plasmons: Uncovering Dark Modes
2012
Strongly coupled plasmons in a system of individual gold nanoparticles placed at subnanometer distance to a gold film (nanoparticle-on-plane, NPOP) are investigated using two complementary single particle spectroscopy techniques. Optical scattering spectroscopy exclusively detects plasmon modes that couple to the far field via their dipole moment (bright modes). By using photoemission electron microscopy (PEEM), we detect in the identical NPOPs near-field modes that do not couple to the scattered far field (dark modes) and are characterized by a strongly enhanced nonlinear electron emission process. To our knowledge, this is the first time that both far- and near-field spectroscopy are carr…
PEEM with high time resolution—imaging of transient processes and novel concepts of chromatic and spherical aberration correction
2006
The potential of time-resolved photoemission electron microscopy (PEEM) for imaging ultrafast processes and for aberration correction in full-field imaging is discussed. In particular, we focus on stroboscopic imaging of precessional magnetic excitations via XMCD-PEEM exploiting the time structure of synchrotron radiation (magnetic field pulse pump–X-ray probe). In a special bunch-compression mode at BESSY, a time resolution of about 15 ps has been obtained. Further, we discuss an all-optical pump–probe technique using femtosecond laser excitation. A highly promising alternative to stroboscopic imaging is an approach using time-resolved image detection. As a second application of time-resol…
Time-resolved photoemission electron microscopy of magnetic field and magnetisation changes
2003
Owing to its parallel image acquisition, photoemission electron microscopy is well suited for real-time observation of fast processes on surfaces. Pulsed excitation sources like synchrotron radiation or lasers, fast electric pulsers for the study of magnetic switching, and/or time-resolved detection can be utilised. A standard approach also being used in light optical imaging is stroboscopic illumination of a periodic (or quasi-periodic) process. Using this technique, the time dependence of the magnetic field in a pulsed microstrip line has been imaged in real time exploiting Lorentz-type contrast. Similarly, the corresponding field-induced changes in the magnetisation of cobalt microstruct…