Search results for "force microscopy"
showing 7 items of 247 documents
Nanoscale mechanical characterization of polymers by atomic force microscopy (AFM) nanoindentations: Viscoelastic characterization on a model material
2009
The Atomic Force Microscope (AFM), apart form its conventional use as a microscope, is also used for the characterization of the local mechanical properties of polymers. In fact, the elastic characterization of purely elastic materials using this instrument can be considered as a well assessed technique while the challenge remains the characterization of the viscoelastic mechanical properties. In particular, one finds the mechanical behavior changing when performing indentations at different loading rates, i.e., on different time scales. Moreover, this apparent viscoelastic behavior can also be due to complex contact mechanics phenomena, with the onset of plasticity and long-term viscoelast…
Thermal noise limit for ultra-high vacuum noncontact atomic force microscopy
2013
The noise of the frequency-shift signal Δf in noncontact atomic force microscopy (NC-AFM) consists of cantilever thermal noise, tip–surface-interaction noise and instrumental noise from the detection and signal processing systems. We investigate how the displacement-noise spectral density dz at the input of the frequency demodulator propagates to the frequency-shift-noise spectral density dΔf at the demodulator output in dependence of cantilever properties and settings of the signal processing electronics in the limit of a negligible tip–surface interaction and a measurement under ultrahigh-vacuum conditions. For a quantification of the noise figures, we calibrate the cantilever displacemen…
Modification of a commercial atomic force microscopy for low-noise, high-resolution frequency-modulation imaging in liquid environment.
2011
A key issue for high-resolution frequency-modulation atomic force microscopy imaging in liquids is minimizing the frequency noise, which requires a detailed analysis of the corresponding noise contributions. In this paper, we present a detailed description for modifying a commercial atomic force microscope (Bruker MultiMode V with Nanoscope V controller), aiming at atomic-resolution frequency-modulation imaging in ambient and in liquid environment. Care was taken to maintain the AFMs original stability and ease of operation. The new system builds upon an optimized light source, a new photodiode and an entirely new amplifier. Moreover, we introduce a home-built liquid cell and sample holder …
Direct Visualization of Molecule Deprotonation on an Insulating Surface
2012
Elucidating molecular-scale details of basic reaction steps on surfaces is decisive for a fundamental understanding of molecular reactivity within many fields, including catalysis and on-surface synthesis. Here, the deprotonation of 2,5-dihydroxybenzoic acid (DHBA) deposited onto calcite (101;4) held at room temperature is followed in situ by noncontact atomic force microscopy. After deposition, the molecules form two coexisting phases, a transient striped phase and a stable dense phase. A detailed analysis of high-resolution noncontact atomic force microscopy images indicates the transient striped phase being a bulk-like phase, which requires hydrogen bonds between the carboxylic acid moie…
Optical and structural properties of Al 2 O 3 /ZnO nanolaminates deposited by ALD method
2014
International audience; We report on the investigation of optical and structural properties of Al2O3/ZnO nanolaminates. The nanolaminates were deposited on Si and glass substrates by Atomic layer deposition method. Structural properties of nanolaminates were studied by SEM, GIXRD, and AFM. Optical characterization was performed by transmittance and photoluminescence spectroscopy. Complex analysis of monolayer properties was done by ellipsometry. Optical constants for Al2O3 and ZnO monolayer were calculated.
Local mechanical properties by Atomic Force Microscopy nanoindentations
2008
The analysis of mechanical properties on a nanometer scale is a useful tool for combining information concerning texture organization obtained by microscopy with the properties of individual components- Moreover, this technique promotes the understanding of the hierarchical arrangement in complex natural materials as well in the case of simpler morphologies arising from industrial processes. Atomic Force Microscopy, AFM, can bridge morphological information, obtained with outstanding resolution, to local mechanical properties. When performing an AFM nanoindentation, the rough force curve, i.e., the plot of the voltage output from the photodiode vs. the voltage applied to the piezo-scanner, …
On-chip purification of arc-discharge synthesized multiwalled carbon nanotubes via mobile liquid interface
2017
This thesis reports a novel approach for purification of carbon nanotube (CNT) samples deposited on smooth silicon substrates through a mobile liquid interface interacting with carbonaceous debris particles that contaminate the deposition. The method is based on physical interaction of the particles and the three-phase contact line via capillary interface forces, i.e. the surface tension, which results in the detachment of chemically indispersible colloids from the sample surface. In the experiments reported in this work, we focus primarily on arc-discharge grown multi-walled carbon nanotubes, whose synthesis is particularly plagued by carbonaceous debris that is difficult to remove without h…