6533b82cfe1ef96bd1290018
RESEARCH PRODUCT
Modification of a commercial atomic force microscopy for low-noise, high-resolution frequency-modulation imaging in liquid environment.
Jannis LübbeJens SchütteAngelika KühnleKenichi UmedaL. TrögerR. StarkKei KobayashiHirofumi YamadaSebastian Rodesubject
noiseMaterials scienceoptical sensorsAtomic force acoustic microscopy530Noise (electronics)law.inventionOpticsphotodiodeslawInstrumentationAtomic de Broglie microscopeatomic force microscopycalcium compoundsbusiness.industrysample holdersAmplifierNoise spectral densityPhotodiodefrequency modulationmodulationfrequencyamplifiersbusinessNon-contact atomic force microscopyFrequency modulationimage resolutiondescription
A key issue for high-resolution frequency-modulation atomic force microscopy imaging in liquids is minimizing the frequency noise, which requires a detailed analysis of the corresponding noise contributions. In this paper, we present a detailed description for modifying a commercial atomic force microscope (Bruker MultiMode V with Nanoscope V controller), aiming at atomic-resolution frequency-modulation imaging in ambient and in liquid environment. Care was taken to maintain the AFMs original stability and ease of operation. The new system builds upon an optimized light source, a new photodiode and an entirely new amplifier. Moreover, we introduce a home-built liquid cell and sample holder as well as a temperature-stabilized isolation chamber dedicated to low-noise imaging in liquids. The success of these modifications is measured by the reduction in the deflection sensor noise density from initially 100 fm/root Hz to around 10 fm/root Hz after modification. The performance of our instrument is demonstrated by atomically resolved images of calcite taken under liquid conditions. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3606399]
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2011-07-01 | The Review of scientific instruments |