0000000000705323
AUTHOR
Jannis Lübbe
Modification of a commercial atomic force microscopy for low-noise, high-resolution frequency-modulation imaging in liquid environment.
A key issue for high-resolution frequency-modulation atomic force microscopy imaging in liquids is minimizing the frequency noise, which requires a detailed analysis of the corresponding noise contributions. In this paper, we present a detailed description for modifying a commercial atomic force microscope (Bruker MultiMode V with Nanoscope V controller), aiming at atomic-resolution frequency-modulation imaging in ambient and in liquid environment. Care was taken to maintain the AFMs original stability and ease of operation. The new system builds upon an optimized light source, a new photodiode and an entirely new amplifier. Moreover, we introduce a home-built liquid cell and sample holder …
Achieving high effectiveQ-factors in ultra-high vacuum dynamic force microscopy
The effective Q-factor of the cantilever is one of the most important figures-of-merit for a non-contact atomic force microscope (NC-AFM) operated in ultra-high vacuum (UHV). We provide a comprehensive discussion of all effects influencing the Q-factor and compare measured Q-factors to results from simulations based on the dimensions of the cantilevers. We introduce a methodology to investigate in detail how the effective Q-factor depends on the fixation technique of the cantilever. Fixation loss is identified as a most important contribution in addition to the hitherto discussed effects and we describe a strategy for avoiding fixation loss and obtaining high effective Q-factors in the forc…
Thermal noise limit for ultra-high vacuum noncontact atomic force microscopy
The noise of the frequency-shift signal Δf in noncontact atomic force microscopy (NC-AFM) consists of cantilever thermal noise, tip–surface-interaction noise and instrumental noise from the detection and signal processing systems. We investigate how the displacement-noise spectral density dz at the input of the frequency demodulator propagates to the frequency-shift-noise spectral density dΔf at the demodulator output in dependence of cantilever properties and settings of the signal processing electronics in the limit of a negligible tip–surface interaction and a measurement under ultrahigh-vacuum conditions. For a quantification of the noise figures, we calibrate the cantilever displacemen…
Quantitative description of C-60 diffusion on an insulating surface
The diffusion of ${\text{C}}_{60}$ molecules on large, atomically flat terraces of the ${\text{CaF}}_{2}(111)$ surface is studied under ultrahigh vacuum conditions at various substrate temperatures below room temperature. The weak molecule-substrate interaction on this insulating surface makes a direct observation of hopping events difficult. Therefore, to determine a quantitative value of the diffusion barrier, we employ the so-called onset method. This method is based on the analysis of spatial properties of islands created by nucleation of diffusing ${\text{C}}_{60}$ molecules, as measured by noncontact atomic force microscopy. We first determine the critical cluster size to be ${i}^{\en…
Determining cantilever stiffness from thermal noise
We critically discuss the extraction of intrinsic cantilever properties, namely eigenfrequency fn, quality factor Qn and specifically the stiffness kn of the nth cantilever oscillation mode from thermal noise by an analysis of the power spectral density of displacement fluctuations of the cantilever in contact with a thermal bath. The practical applicability of this approach is demonstrated for several cantilevers with eigenfrequencies ranging from 50 kHz to 2 MHz. As such an analysis requires a sophisticated spectral analysis, we introduce a new method to determine kn from a spectral analysis of the demodulated oscillation signal of the excited cantilever that can be performed in the frequ…